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Topic: Communication System Control
Results
2015 / IEEE
By: Doverspike, R.; Clapp, G.; Woodward, S.L.; Wilson, B.; Von Lehmen, A.; Stadler, M.; Rauch, M.E.; Ramakrishnan, K.K.; Pastor, J.; O'Connor, J.; Mavrogiorgis, E.; Mahimkar, A.; Hartley, J.; Douyon, P.; Freimuth, D.M.; Gullapalli, K.; Han, B.;
By: Doverspike, R.; Clapp, G.; Woodward, S.L.; Wilson, B.; Von Lehmen, A.; Stadler, M.; Rauch, M.E.; Ramakrishnan, K.K.; Pastor, J.; O'Connor, J.; Mavrogiorgis, E.; Mahimkar, A.; Hartley, J.; Douyon, P.; Freimuth, D.M.; Gullapalli, K.; Han, B.;
1988 / IEEE
By: Rabaey, J.; Catthoor, F.; Vandewalle, J.; de Man, H.J.; Jain, R.; Van Meerbergen, J.L.; Goossens, G.;
By: Rabaey, J.; Catthoor, F.; Vandewalle, J.; de Man, H.J.; Jain, R.; Van Meerbergen, J.L.; Goossens, G.;
The hierarchy of communication networks in the programmable assembly cell: an experimental framework
1988 / IEEEBy: Virvalo, T.; Sintonen, L.; Puusaari, P.;
1988 / IEEE / 3-908265-01-0
By: Morgan, M.J.; Luderer, G.W.R.; Leung, W.H.; Tu, S.-C.; Roberts, P.R.;
By: Morgan, M.J.; Luderer, G.W.R.; Leung, W.H.; Tu, S.-C.; Roberts, P.R.;
Methods of addressing the interactions of intelligent network services with embedded switch services
1988 / IEEEBy: Homayoon, S.; Singh, H.;
1988 / IEEE
By: Stark, L.; Tendick, F.; Kim, W.; Anderson, R.; Hisey, M.; Mills, B.; Matsunaga, K.; An Nguyen; Ramos, C.; Tyler, M.; Zahalak, G.; Amick, M.; Baker, B.; Brown, N.; Brown, T.; Chang, J.; Jyh-Horng Chen; Chik, J.; Cohen, D.; Cox, D.; Dubey, J.; Ellis, K.; Engdahl, E.; Frederickson, C.; Halamka, J.; Hauser, R.; Jacobs, J.; Lee, C.; Lee, D.; Liu, A.; Ninomiya, R.; Rudolph, J.; Schafer, S.; Schendel, E.; So, G.; Takeda, M.; Tam, L.; Thompson, M.; Wood, E.; Woodruff, T.;
By: Stark, L.; Tendick, F.; Kim, W.; Anderson, R.; Hisey, M.; Mills, B.; Matsunaga, K.; An Nguyen; Ramos, C.; Tyler, M.; Zahalak, G.; Amick, M.; Baker, B.; Brown, N.; Brown, T.; Chang, J.; Jyh-Horng Chen; Chik, J.; Cohen, D.; Cox, D.; Dubey, J.; Ellis, K.; Engdahl, E.; Frederickson, C.; Halamka, J.; Hauser, R.; Jacobs, J.; Lee, C.; Lee, D.; Liu, A.; Ninomiya, R.; Rudolph, J.; Schafer, S.; Schendel, E.; So, G.; Takeda, M.; Tam, L.; Thompson, M.; Wood, E.; Woodruff, T.;
1988 / IEEE / 0-8186-0830-7
By: Bruce, D.; Walsh, A.L.; Wright, S.A.; Cordani, M.; Wiren, G.; Young, J.; Gilbert, M.;
By: Bruce, D.; Walsh, A.L.; Wright, S.A.; Cordani, M.; Wiren, G.; Young, J.; Gilbert, M.;