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Topic: Chemical Cleaning
Results
2011 / IEEE / 978-1-61284-774-0
By: Wangxin Luo; Xin Yang; Tingjin Ye; Yukun Huang; Xuebo Qin; Bing Chen; Zaili Zhang; Jun Lu; Yongmei Liang; Wei Liu;
By: Wangxin Luo; Xin Yang; Tingjin Ye; Yukun Huang; Xuebo Qin; Bing Chen; Zaili Zhang; Jun Lu; Yongmei Liang; Wei Liu;
2011 / IEEE / 978-1-4244-8165-1
By: Lili Wang; Zhengyang Yang; Shengyong Yan; Yanqing Zhang; Hui Wang; Yan Zhang;
By: Lili Wang; Zhengyang Yang; Shengyong Yan; Yanqing Zhang; Hui Wang; Yan Zhang;
1990 / IEEE
By: Gildenblat, G.S.; Grot, S.A.; Messier, R.; Badzian, T.; Badzian, A.R.; Wronski, C.R.; Hatfield, C.W.;
By: Gildenblat, G.S.; Grot, S.A.; Messier, R.; Badzian, T.; Badzian, A.R.; Wronski, C.R.; Hatfield, C.W.;
1991 / IEEE / 0-7803-0135-8
By: Schnitzenbaumer, P.; Mapes, M.; Hseuh, H.C.; Stattel, P.; Sikora, R.; Shen, B.;
By: Schnitzenbaumer, P.; Mapes, M.; Hseuh, H.C.; Stattel, P.; Sikora, R.; Shen, B.;
1998 / IEEE / 0-7803-4432-4
By: Ciurea, M.L.; Pavelescu, G.; Roger, J.P.; Baltog, I.; Lengyel, E.; Galeata, G.; Mihut, L.;
By: Ciurea, M.L.; Pavelescu, G.; Roger, J.P.; Baltog, I.; Lengyel, E.; Galeata, G.; Mihut, L.;
2000 / IEEE / 0-7803-5982-8
By: Pereira, N.; Banister, J.; Thompson, J.R.; Davis, S.; Sallay, J.; Kortbawi, D.; Gover, J.R.; Rix, W.;
By: Pereira, N.; Banister, J.; Thompson, J.R.; Davis, S.; Sallay, J.; Kortbawi, D.; Gover, J.R.; Rix, W.;
2001 / IEEE / 0-7803-7141-0
By: Ju, W.-T.; Paek, K.-H.; Choi, J.-J.; Choe, W.-H.; Hwang, Y.-S.; Kim, D.-Y.; Seo, J.-H.; Kim, Y.-H.;
By: Ju, W.-T.; Paek, K.-H.; Choi, J.-J.; Choe, W.-H.; Hwang, Y.-S.; Kim, D.-Y.; Seo, J.-H.; Kim, Y.-H.;
2003 / IEEE / 0-7803-7915-2
By: Jae Won Jung; Nam, S.H.; Park, Y.J.; Kim, S.H.; Kwon, Y.K.; Jin Sung Kim; Han, Y.J.; Park, S.S.; Gi Yeul Sung; Sang Hee Kim; Jeung Ho Chu;
By: Jae Won Jung; Nam, S.H.; Park, Y.J.; Kim, S.H.; Kwon, Y.K.; Jin Sung Kim; Han, Y.J.; Park, S.S.; Gi Yeul Sung; Sang Hee Kim; Jeung Ho Chu;
2004 / IEEE / 0-7803-8586-1
By: Park, Y.J.; Hong MS; Kim, S.H.; Han, Y.J.; Byung Hak Son; Kim, S.H.; Nam, S.H.; Heo, H.; Park, S.S.;
By: Park, Y.J.; Hong MS; Kim, S.H.; Han, Y.J.; Byung Hak Son; Kim, S.H.; Nam, S.H.; Heo, H.; Park, S.S.;
2010 / IEEE / 978-1-4244-5892-9
By: Appel, J.; Rand, J.; Birkmire, R.; Mudigonda, S.; Hegedus, S.; Das, U.; Lulu Zhang;
By: Appel, J.; Rand, J.; Birkmire, R.; Mudigonda, S.; Hegedus, S.; Das, U.; Lulu Zhang;
2008 / Springer Science+Business Media / 1673-7415
By: Baozhen Wang; Shuo Liu; Yanping Liu; Xiujin Li;
By: Baozhen Wang; Shuo Liu; Yanping Liu; Xiujin Li;