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Topic: Ccd
Results
2012 / IEEE
By: Hall, D.J.; Murray, N.J.; Holland, A.D.; Tutt, J.H.; Evagora, A.M.; Clarke, A.; Harriss, R.D.;
By: Hall, D.J.; Murray, N.J.; Holland, A.D.; Tutt, J.H.; Evagora, A.M.; Clarke, A.; Harriss, R.D.;
2011 / IEEE / 978-1-4577-0536-6
By: Jiaguo Li; Erwei Qi; Jie Han; Huifang Li; Zhanliang Yuan; Xiaofei Mi; Qiyue Liu;
By: Jiaguo Li; Erwei Qi; Jie Han; Huifang Li; Zhanliang Yuan; Xiaofei Mi; Qiyue Liu;
2011 / IEEE / 978-1-4577-1005-6
By: Zhengqiang Li; Xingfa Gu; Hua Xu; Wanchun Zhang; Zhihui Wang; Li Li;
By: Zhengqiang Li; Xingfa Gu; Hua Xu; Wanchun Zhang; Zhihui Wang; Li Li;
2011 / IEEE / 978-1-4577-2201-1
By: Qingxi Tong; Yongqi Xue; Junyong Fang; Jinnian Wang; Lifu Zhang;
By: Qingxi Tong; Yongqi Xue; Junyong Fang; Jinnian Wang; Lifu Zhang;
2011 / IEEE / 978-1-4577-1376-7
By: Serio, M.A.; Wojtowicz, M.A.; Solomon, P.R.; Rubenstein, E.P.; Drukier, G.A.;
By: Serio, M.A.; Wojtowicz, M.A.; Solomon, P.R.; Rubenstein, E.P.; Drukier, G.A.;
2012 / IEEE / 978-1-4673-1043-7
By: Patel, Vishnukumar D.; Gil, Mathieu; Kiran Kumar, A S; Samudraiah, D R M; Dave, R K; Lal, A K; Babu, P N; Nair, R V; Parmar, R M; Roy Chowdhury, A; Paul, Sandip; Bhati, Sunil;
By: Patel, Vishnukumar D.; Gil, Mathieu; Kiran Kumar, A S; Samudraiah, D R M; Dave, R K; Lal, A K; Babu, P N; Nair, R V; Parmar, R M; Roy Chowdhury, A; Paul, Sandip; Bhati, Sunil;
2012 / IEEE / 978-1-4577-1820-5
By: Zhang Aimin; Ning Dayu; Wang Weibo; Li Tianchu; Liang Kun; Wang Tianyi; Fang Fang;
By: Zhang Aimin; Ning Dayu; Wang Weibo; Li Tianchu; Liang Kun; Wang Tianyi; Fang Fang;
2012 / IEEE / 978-1-4673-1043-7
By: Srivastava, Ashish; Prasad, Hanuman; Kumar, Ashok; Amarnath; Karimi, M. M.; Mehta, Sanjeev; Kirkire, Shweta; Samudraiah, D.R.M.; Parmar, R. M.; Paul, Sandip;
By: Srivastava, Ashish; Prasad, Hanuman; Kumar, Ashok; Amarnath; Karimi, M. M.; Mehta, Sanjeev; Kirkire, Shweta; Samudraiah, D.R.M.; Parmar, R. M.; Paul, Sandip;
2012 / IEEE
By: Yamamoto, Hitoshi; Takubo, Yosuke; Trevison, Jose; Itagaki, Kennosuke; Kato, Eriko; Sugimoto, Yasuhiro; Ikeda, Hirokazu; Sato, Hisao; Ishikawa, Akimasa;
By: Yamamoto, Hitoshi; Takubo, Yosuke; Trevison, Jose; Itagaki, Kennosuke; Kato, Eriko; Sugimoto, Yasuhiro; Ikeda, Hirokazu; Sato, Hisao; Ishikawa, Akimasa;
2009 / RSC Publishing
By: Kazuyuki Takehira; Shigeo Kaneko; Atsushi Kobayashi; Kengo Suzuki; Toshitada Yoshihara; Shigero Oishi; Yoshimi Shiina; Hitoshi Ishida; Seiji Tobita;
By: Kazuyuki Takehira; Shigeo Kaneko; Atsushi Kobayashi; Kengo Suzuki; Toshitada Yoshihara; Shigero Oishi; Yoshimi Shiina; Hitoshi Ishida; Seiji Tobita;
1989 / IEEE
By: Di Cocco, G.; Rossi, E.; Court, A.J.; Ashton, T.; Villa, G.; Quadrini, M.; Traci, A.; Donati, A.;
By: Di Cocco, G.; Rossi, E.; Court, A.J.; Ashton, T.; Villa, G.; Quadrini, M.; Traci, A.; Donati, A.;
1989 / IEEE
By: Jung, R.; Hemery, J.Y.; Halvarsson, B.; Fischer, C.; Levitt, S.; Burtin, G.; Colchester, R.; Vouillot, J.M.;
By: Jung, R.; Hemery, J.Y.; Halvarsson, B.; Fischer, C.; Levitt, S.; Burtin, G.; Colchester, R.; Vouillot, J.M.;
1993 / IEEE / 0-7803-0987-1
By: Nobusada, T.; Itakura, K.; Ozaki, M.; Nagayoshi, R.; Kokusenya, N.; Saitoh, Y.; Toyoda, Y.;
By: Nobusada, T.; Itakura, K.; Ozaki, M.; Nagayoshi, R.; Kokusenya, N.; Saitoh, Y.; Toyoda, Y.;
1993 / IEEE / 0-7803-0646-5
By: Jaklitsch, J.J.; Haglich, B.; Barlow, R.; Storke, R.A., Jr.; Schulz, C.E.;
By: Jaklitsch, J.J.; Haglich, B.; Barlow, R.; Storke, R.A., Jr.; Schulz, C.E.;
1995 / IEEE
By: Shinkawa, T.; Sugimoto, S.; Omata, K.; Nakano, T.; Morimoto, T.; Littenberg, L.S.; Li, K.K.; Sato, T.; Kuno, Y.; Komatsubara, T.K.; Kobayashi, M.; Kettell, S.; Kabe, S.; Ino, K.; Inagaki, T.; Garber, E.; Chiang, I.-H.; Yoshimura, Y.; Yamashita, A.; Tauchi, K.;
By: Shinkawa, T.; Sugimoto, S.; Omata, K.; Nakano, T.; Morimoto, T.; Littenberg, L.S.; Li, K.K.; Sato, T.; Kuno, Y.; Komatsubara, T.K.; Kobayashi, M.; Kettell, S.; Kabe, S.; Ino, K.; Inagaki, T.; Garber, E.; Chiang, I.-H.; Yoshimura, Y.; Yamashita, A.; Tauchi, K.;