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Topic: Breakdown

Results

Temporal and Spatial Resolved Emission Spectroscopy of a Pulsed Atmospheric-Pressure DBD in Helium With Impurities

2011 / IEEE
By: Chiper, A.S.; Popa, G.;

Buffer Thickness Contribution to Suppress Vertical Leakage Current With High Breakdown Field (2.3 MV/cm) for GaN on Si

2011 / IEEE
By: Rowena, I.B.; Egawa, T.; Selvaraj, S.L.;

Enhanced Current Drivability of CVD Graphene Interconnect in Oxygen-Deficient Environment

2011 / IEEE
By: Hyun-Jong Chung; Jinseong Heo; Sung Kwan Lim; Chunhum Cho; Hyeon Jun Hwang; Heejun Yang; Sang Kyung Lee; Chang Goo Kang; Byoung Hun Lee; Young Gon Lee; Sunae Seo;

Superposition of DC Voltage and Submicrosecond Impulses for Energization of Electrostatic Precipitators

2012 / IEEE
By: Wilson, M.P.; Given, M.J.; MacGregor, S.J.; Timoshkin, I.V.; Mermigkas, A.C.; Tao Wang;

Streamer characteristic and breakdown in synthetic and natural ester transformer liquids with pressboard interface under lightning impulse voltage

2011 / IEEE
By: Wang, Z.D.; Liu, Q.;

Effect of trapped space charge on mechanical deformation induced by electric field

2011 / IEEE
By: Berquez, L.; Anh, T.T.; Martinez-Vega, J.; Boudou, L.;

Evaluation of Uniform and Non-uniform Breakdown Characteristics of Liquid Nitrogen With Different Electrode Materials

2012 / IEEE
By: Shin, W.J.; Lee, B.W.; Hwang, J.S.; Seong, J.K.;

Research on space charge in insulating and functional dielectrics at Tongji University

2012 / IEEE
By: Yewen Zhang; Xiaoqing Zhang; Zhenlian An; Feihu Zheng;

InP HBT Transferred to Higher Thermal Conductivity Substrate

2012 / IEEE
By: Gutierrez-Aitken, A.; Wang, S.; Monier, C.; Scott, D.W.; Radisic, V.; Deal, W.R.; Cavus, A.; Phuong Nguyen;

Theoretical study of the initial stage of sub-nanosecond pulsed breakdown in liquid dielectrics

2012 / IEEE
By: Fridman, A.; Pekker, M.; Shneider, M.N.;

Influence of impurities and additives on positive streamers in paraffinic model oil

2012 / IEEE
By: Linhjell, D.; Hoidalen, H.K.; Dung, N.V.; Unge, M.; Lundgaard, L.E.;

Characteristics of flat-top nanosecond-pulse breakdown of gas-insulated gaps

2000 / IEEE
By: Takano, Saburo; Yoshida, Tatsuya; Isiguro, Tetsu; Furuya, Seizo; Irisawa, Juichi;

Design of the insulating supports in medium voltage dry-type transformers

2011 / IEEE / 978-1-4577-0279-2
By: Gonzalez V, E.; Espino-Cortes, F.P.; Gomez, P.;

Numerical study of the start-up scenario of a 670 GHz gyrotron operation at TE31,8 mode

2011 / IEEE / 978-1-61284-329-2
By: Ruifeng Pu; Nusinovich, G.; Sinitsyn, O.;

Theta-pinch preionization and trapped flux in FRC formation

2011 / IEEE / 978-1-61284-329-2
By: Frese, S.D.; Frese, M.H.;

A self-pulsed air plasma plume for biomedical applications

2011 / IEEE / 978-1-61284-329-2
By: Pan, Y.; Wu, S.; Lu, X.;

Principle and running maintenance on UPS power supply

2011 / IEEE / 978-1-61284-088-8
By: Xuemei Hu; Yang Liu;

Comparative study of statistical breakdown in mineral, synthetic and natural ester oils under AC voltage

2011 / IEEE / 978-1-4244-7355-7
By: Viet-Hung Dang; Perrier, C.; Beroual, A.;

DGA comparison between ester and mineral oils

2011 / IEEE / 978-1-4244-7355-7
By: Beroual, A.; Saravolac, M.; Marugan, M.; Perrier, C.;

A study of parameters affecting the ageing of transformer oil in distribution transformers

2011 / IEEE / 978-1-4244-7355-7
By: Danikas, M.G.; Liapis, I.;

Streamers in large paraffinic oil gap

2011 / IEEE / 978-1-4244-7355-7
By: Dung, N.V.; Mauseth, F.; Hoidalen, H.K.; Linhjell, D.; Ingebrigtsen, S.; Lundgaard, L.E.; Unge, M.;

Streamers in long point-plane gaps in cyclohexane with and without additives under step voltage

2011 / IEEE / 978-1-4244-7355-7
By: Unge, M.; Lundgaard, L.E.; Ingebrigtsen, S.; Linhjell, D.;

Reliability of NAND flash memories induced by anode hole generation in floating-gate

2011 / IEEE / 978-1-61284-418-3
By: Kitahara, Y.; Matsuzawa, K.; Hagishima, D.;

Dynamic Management System of Operation of Multimedia Device

2011 / IEEE / 978-1-4577-1540-2
By: Yu, Fu; Dai, Xuemei;

Towards future VLSI interconnects using aligned carbon nanotubes

2011 / IEEE / 978-1-4577-0170-2
By: Yuan Li; Zhiyong Xiao; Minghui Sun; Yang Chai; Chan, P.C.H.; Min Zhang;

The small signal amplification of the gated diode operated in breakdown regime

2011 / IEEE / 978-1-61284-172-4
By: Rusu, A.; Burileanu, C.; Enachescu, M.; Dobrescu, D.; Rusu, A.;

Skyworks capacitor model for ESD applications

2011 / IEEE / 978-1-4577-1997-4
By: Yu Zhu; Hong Yin; Bartle, D.; Klimashov, A.; Cejun Wei;

GaN HEMT with scalable >2.2 kV breakdown voltage

2011 / IEEE / 978-1-4577-1694-2
By: Rozman, D.; Roiter, Y.; Capua, E.; Bunin, G.; Baksht, T.; Alpern, Y.;

Field observation and experimental investigation on breakdown of air gap of AC transmission line under forest fires

2011 / IEEE / 978-1-4244-9690-7
By: Cheng Chen; Jiangjun Ruan; Tian Wu; Daochun Huang;

Modeling the charge transport and degradation in HfO2 dielectric for reliability improvement and life-time predictions in logic and memory devices

2011 / IEEE / 978-1-4577-1756-7
By: Vandelli, L.; Larcher, L.; Padovani, A.; Pavan, P.; Pirrotta, O.;

Experiments for reducing the jitter of an over-voltage triggered spark gap

2011 / IEEE / 978-1-4577-0631-8
By: Sack, M.; Attmann, F.; Muller, G.;

Study of the spatial distribution of breakdown spots in MOS devices in case of important edge effect anomalies

2012 / IEEE / 978-1-4577-1117-6
By: Das, T.; Mahata, C.; Sune, J.; Miranda, E.; Maiti, C.K.;

Controlling self healing cellular networks using fuzzy logic

2012 / IEEE / 978-1-4673-0437-5
By: Aliu, O.G.; Saeed, A.; Imran, M.A.;

Influence of the surrounding medium on the dielectric strength measurement of LLDPE/clay nanocomposites

2012 / IEEE / 978-1-4673-0487-0
By: David, E.; Daran-Daneau, C.; Savoie, S.; Frechette, M.F.;

Breakdown and tracking properties of rubber materials for wind turbine blades

2012 / IEEE / 978-1-4673-0487-0
By: Henriksen, M.; Holboell, J.; Garolera, A.C.;

An Effective Correction Methodology for Interference of Stress-Induced Leakage Current in TDDB Evaluation of High-$k$ Dielectrics

2012 / IEEE
By: Wu, E.Y.;

Variable Ramp Rate Breakdown Experiments and the Role of Metal Injection in Low- $k$ Dielectrics

2011 / IEEE
By: Riley, M.J.; Williams, B.; Borja, J.; Plawsky, J.L.; Gill, W.N.;

Impact of Frequency From a Bipolar Applied Field on Dielectric Breakdown for Low- $k$ Materials

2012 / IEEE
By: Borja, J.; Gill, W.N.; Lu, T.; Plawsky, J.L.;

Analysis of the Dielectric Breakdown Characteristics for a 252-kV Gas Circuit Breaker

2013 / IEEE
By: Zhu, K.; Yan, J.D.; Jia, S.; Zhao, H.; Li, X.; Jiang, X.;

Impulse characteristics of 24 kV overhead line pin insulators

2013 / IEEE
By: Kluss, Joni; Palu, Ivo; Niitsoo, Jaan; Hyvonen, Petri; Taklaja, Paul;

Investigation of effectiveness of phyllosilicate into polymeric materials

2014 / IEEE
By: Abidin, A.F.; Hapeez, M.S.; Salahuddin, N.L.A.; Mustam, M.M.; Hamzah, N.R.;

Evaluating the Performance of Collaboration Engineers

2015 / IEEE
By: Briggs, Robert O.; Randrup, Nils L.;

Work and Sojourn Time in an M/G/1 Retrial Queue with Breakdowns

2014 / IEEE
By: Aissani, A.;

Investigation of RF Avalanche Inductive Effect on Reduction of Intermodulation Distortion of MOSFETs Using Volterra Series Analysis

2015 / IEEE
By: Lee, C.-I.; Yang, B.-S.; Lin, Y.-T.; Lin, W.-C.;

PDF and Breakdown Time Prediction for Unobservable Wear Using Enhanced Particle Filters in Precognitive Maintenance

2015 / IEEE
By: Yan, H.; Zhou, J.; Pang, C.K.;

Quench-Induced Dynamic Breakdown Characteristics of LN2 and LN2/PPLP Composite Electrical Insulation System for Superconducting Power Apparatus

2015 / IEEE
By: Matsuoka, T.; Hayakawa, N.; Kojima, H.; Nishimachi, S.;

Dynamics of water droplets immersed in dielectric liquids submitted to electric stress

2015 / IEEE
By: Beroual, A.;

The effect of dipole scattering on intrinsic breakdown strength of polymers

2015 / IEEE
By: Sun, Y.; Ramprasad, R.; Boggs, S.;

Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers

2015 / IEEE
By: Chakraborty, P.S.; Wier, B.R.; Raghunathan, U.S.; Oakley, M.A.; Cressler, J.D.;

Numerical Modeling for High-Power Microwave Propagation in Soil

2014 / IEEE
By: Tang, T.; Wang, B.-Z.;

Time Lag of Secondary ESD in Millimeter-Size Spark Gaps

2014 / IEEE
By: Araki, K.; Shumiya, H.; Pommerenke, D.; Li, J.; Pilla, V.; Wan, F.;

Transformer Oil Breakdown Dynamics Stressed by Fast Impulse Voltages: Experimental and Modeling Investigation

2014 / IEEE
By: Mu, H.B.; Zhu, M.X.; Li, Y.; Li, Z.M.; Deng, J.B.; Zahn, M.; Jadidian, J.; Zhang, G.J.; Zhang, W.Z.;

3-D Simulation of Low-Temperature Plasma Development Under Pulsed Conditions

2014 / IEEE
By: Fierro, A.S.; Neuber, A.A.; Dickens, J.C.;

Investigation of power and linearity performance for low- and high-voltage SiGe HBTs

2013 / IEEE
By: Gridelet, E.; Vanhoucke, T.; Pijper, R.; Dinh, T. V.; Klaassen, D. B. M.;

Investigating the Physics of Simultaneous Breakdown Events in High-Power-Microwave (HPM) Metamaterials With Multiresonant Unit Cells and Discrete Nonlinear Responses

2014 / IEEE
By: Booske, J.H.; Neher, J.D.; Liu, C.; Behdad, N.;

OFF-State Degradation of AlGaN/GaN Power HEMTs: Experimental Demonstration of Time-Dependent Drain-Source Breakdown

2014 / IEEE
By: Hurkx, G.A.M.; Bertin, M.; Cibin, G.; Meneghini, M.; Ivo, P.; Meneghesso, G.; Croon, J.A.; Sonsky, J.; Zanoni, E.;

Effect of water streams on the AC breakdown performance of short rod-plane air gaps

2014 / IEEE
By: Rowland, S.M.; Jiang, X.; Yuan, Y.; Li, Q.; Cheng, X.;

Effect of nanoparticle surface modification on breakdown and space charge behavior of XLPE/SiO2 nanocomposites

2014 / IEEE
By: Zhou, Y.; Zhang, L.; Tian, J.; Ye, Q.; Le, T.H.; Sha, Y.; Cui, X.;

Influence of interface on the electrical properties of polyimide/TiO2 composite films

2014 / IEEE
By: Fei, W.; Su, B.; Liu, X.; Chen, M.; Yin, J.; Feng, Y.; Lei, Q.;

2D Simulations of Kink phenomenon in InAlAs/InGaAs/InP HEMTs

2013 / IEEE
By: ZhimingWang; XinLv; Weihua Yu; XiaobinLuo;

Stimulating and detecting changes in the insulation health state of inverter fed ac machines

2014 / IEEE
By: Zoeller, C.; Wolbank, Th. M.; Nussbaumer, P.; Vogelsberger, M.A.;

Space charge behavior in multilayered polyimide films under DC high stress near breakdown strength

2014 / IEEE
By: Kawano, Shohei; Matsubara, Keigo; Tanaka, Yasuhiro; Miyake, Hiroaki;

Breakdown processes in low density polyethylene and cross-linked polyethylene under DC high stress

2014 / IEEE
By: Suzuki, Hitoshi; Kato, Tsuyoshi; Tanaka, Yasuhiro; Maeno, Takashi; Miyake, Hiroaki;

Alumina and silica based epoxy nano-composites for electrical insulation

2014 / IEEE
By: Ramu, T.S.; Nagamani, H.N.;

On the reliability of SiGe HBT cascode driver amplifiers

2014 / IEEE
By: Raghunathan, Uppili S.; Wier, Brian; Oakley, Michael A.; Cressler, John D.; Chakraborty, Partha S.;

Optimization and prediction of dielectric behavior of small air gaps stressed by DC voltages

2014 / IEEE
By: Maglaras, Leandros A.; Topalis, Frangiskos V.; Maglaras, Athanasios L.; Tsilika, Kyriaki D.; Giannakopoulou, Konstantina G.;

Dependence of space charge formation in polyimide film on applied voltage wave form

2011 / IEEE
By: Takada, T.; Tanaka, Y.; Miyake, H.; Kikuchi, S.; Ishii, T.;

Breakdown characteristics of PCB paralleled traces injected by rectangular pulse

2011 / IEEE
By: Yonghong Cheng; Guodong Meng; Jiongbiao Dong; Kai Wu; Ying Liu; Jianrui Song;

Defects and interfaces at DC voltage

2011 / IEEE
By: Morshuis, Peter;

Study on the breakdown and space charge properties of epoxy impregnated paper composites

2011 / IEEE
By: Wei Shen; Wen Cao; Kai Wu;

Development of breakdown in solid/gel insulators under AC voltage

2011 / IEEE
By: Akamatsu, Shota; Fujii, Masaharu; Ihori, Haruo;

Parameters influencing the behavior of water droplets immersed in dielectric liquids submitted to electric stress

2013 / IEEE
By: Beroual, A.;

New insight on the frequency dependence of TDDB in high-k/metal gate stacks

2013 / IEEE
By: Federspiel, X.; Roy, D.; Rafik, M.; Bezza, A.; Ghibaudo, G.; Mora, P.;

Multipactor prediction with multi-carrier signals: Experimental results and discussions on the 20-gap-crossing rule

2014 / IEEE
By: Anza, Sergio; Vicente, Carlos; Raboso, David; Gimeno, Benito; Boria, Vicente E.; Wochner, Ulrich; Wolk, Dieter; Mattes, Michael; Gil, Jordi;

Predicting the threshold for onset of internal electric breakdown in helical flux compression generators using CAGEN and CALE

2012 / IEEE
By: Chase, Jay B.; Chato, Donna M.; Peterson, Giles; Kiuttu, Gerald F.;

Radio Frequency Current-Voltage Curve Including Breakdown Effect Implemented in Large Signal Model for Validation

2014 / IEEE
By: Lin, W.-C.; Lin, Y.-T.; Lee, C.-I.;

Copper influence on the ultraviolet visible spectroscopy and property of oil in the ageing process of oil-paper insulation

2014 / IEEE
By: Liu, Haibin; Hao, Jian; Yao, Qiang; Fu, Jin; Wang, Qian; Wu, Gaolin;

Breakdown characteristics and size effect in sub-cooled liquid nitrogen

2014 / IEEE
By: Hayakawa, Naoki; Okubo, Hitoshi; Hanai, Masahiro; Kojima, Hiroki; Mastuoka, Tastuya; Nishimachi, Seiichiro;

Electrical and optical-emission parallel study of natural ester liquids stressed by impulse high voltage

2014 / IEEE
By: Peppas, Georgios; Pyrgioti, Eleftheria C.; Svarnas, Panagiotis; Koulis, Panagiotis;

Susceptibility of dielectric-loaded, vacuum-breakdown discharges in DC

2014 / IEEE
By: Aldan, Manuel Thomas P.; Verboncoeur, John P.;

Breakdown of hydration repulsion between charged surfaces in aqueous Cs+ solutions

2008 / RSC Publishing
By: Liraz Chai; Ronit Goldberg; Jacob Klein; Nir Kampf; Susan Perkin;

Temporal patterning of the potential induced by localized corrosion of iron passivity in acid media. Growth and breakdown of the oxide film described in terms of a point defect model

2009 / RSC Publishing
By: Dimitra Sazou; Michael Pagitsas; Maria Pavlidou;

An acoustic based, laser induced breakdown method for determining the sizes and concentrations of nanoparticles

2010 / RSC Publishing
By: JoongGill Choi; JiA Son; JiWoong Kim; Hyun Jin;

Health Encyclopedia - Nervous Breakdown

2011 / Marshall Cavendish

Health Encyclopedia - Post-Traumatic Stress Disorder

2011 / Marshall Cavendish

Music Lyric Breakdown

2011 / Connexions
By: Ryan D'Errico;

Excellent charge-trapping properties of ultrathin reoxidized nitrided oxides prepared by rapid thermal processing

1988 / IEEE
By: Iwasaki, H.; Hori, T.;

Electrical characterization of in-situ epitaxially grown Si p-n junctions fabricated using limited reaction processing

1988 / IEEE
By: King, C.A.; Wilson, S.D.; Gibbons, J.F.; Gronet, C.M.;

Measurement of the charge of a single or of a series of streamers in liquids subjected to a voltage step

1988 / IEEE
By: Marteau, C.; Beroual, A.; Tobazeon, R.;

High-power and superpower Cerenkov masers

1988 / IEEE
By: Pointon, T.D.; Rogers, J.H.; Mizuno, K.; Stone, R.A.; De Groot, J.S.;

Electrical properties of PECVD SiO/sub x/N/sub y/:H prepared by microwave plasma

1988 / IEEE
By: Yelon, A.; Wertheimer, M.R.; Klemberg-Sapieha, J.E.; Blain, S.; Rabiller, P.;

Space-charge distributions in electron-beam charged Mylar and Kapton films

1988 / IEEE
By: Berraissoul, A.; Wintle, H.J.; West, J.E.; Sessler, G.M.;

Effect of water in Kraft-paper impregnated oil on breakdown

1988 / IEEE
By: Mitsui, H.; Sone, M.;

A study of initial negative discharge growth using video camera and frame store

1988 / IEEE
By: Chadband, W.G.; Sadeghzadeh-Araghi, M.; Watson, P.K.;

Discharge at the pillbox window for an LHRF launcher

1989 / IEEE
By: Sakamoto, K.; Imai, T.; Ikeda, Y.;

Particle-initiated corona and breakdown in GITL systems

1989 / IEEE
By: Anis, H.; Morcos, M.M.; Srivastava, K.D.;

Lifetimes of polypropylene films under combined high electric fields and thermal stresses

1989 / IEEE
By: Krishnakumar, B.; Cygan, P.; Laghari, J.R.;

High-speed performance of OMCVD grown InAlAs/InGaAs MSM photodetectors at 1.5 mu m and 1.3 mu m wavelengths

1989 / IEEE
By: Soole, J.B.D.; Koza, M.A.; Bhat, R.; LeBlanc, H.P.; Schumacher, H.;

Polarity dependence of thin oxide wearout

1989 / IEEE
By: Dumin, D.J.; Brown, G.A.; Hall, M.D.; Dickerson, K.J.;

Study of the time to breakdown under impulse conditions

1988 / IEEE
By: Mazzetti, C.; Forster, E.O.; Pompili, M.;

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