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Topic: Batteries
Results
2011 / IEEE
By: Permann, R.; Kumpusch, R.; Blochberger, T.; Guertlschmid, W.; Conte, F.V.; Fleig, J.; Einhorn, M.; Kral, C.;
By: Permann, R.; Kumpusch, R.; Blochberger, T.; Guertlschmid, W.; Conte, F.V.; Fleig, J.; Einhorn, M.; Kral, C.;
2011 / IEEE
By: Chul-Hwan Kim; Funabashi, T.; Senjy, T.; Yona, A.; Tanaka, K.; Ogimi, K.; Uchida, K.; Goya, T.;
By: Chul-Hwan Kim; Funabashi, T.; Senjy, T.; Yona, A.; Tanaka, K.; Ogimi, K.; Uchida, K.; Goya, T.;
2011 / IEEE
By: Shuting Chen; Kui Yao; Li Lu; Sritharan, T.; Tay, F.E.H.; Shuhui Yu; Mirshekarloo, M.S.; Rahimabady, M.;
By: Shuting Chen; Kui Yao; Li Lu; Sritharan, T.; Tay, F.E.H.; Shuhui Yu; Mirshekarloo, M.S.; Rahimabady, M.;
2011 / IEEE
By: Beigne, E.; Christmann, J.-F.; Piguet, C.; Leblond, N.; Willemin, J.; Vivet, P.; Condemine, C.;
By: Beigne, E.; Christmann, J.-F.; Piguet, C.; Leblond, N.; Willemin, J.; Vivet, P.; Condemine, C.;
2012 / IEEE
By: Bonato, P.; Olaighin, G.; Schachter, S.; Pang, T.; Dalton, A.; Chowdhury, A.R.; Patel, S.; Welsh, M.;
By: Bonato, P.; Olaighin, G.; Schachter, S.; Pang, T.; Dalton, A.; Chowdhury, A.R.; Patel, S.; Welsh, M.;
2012 / IEEE
By: Gyu-Ha Choe; Hyeong-Seog Kho; Dong-Hwa Han; Yong-Jin Lee; Byeng-Joo Byen; Jung-Muk Choi;
By: Gyu-Ha Choe; Hyeong-Seog Kho; Dong-Hwa Han; Yong-Jin Lee; Byeng-Joo Byen; Jung-Muk Choi;
2012 / IEEE
By: Pereirinha, P.G.; Trovao, J.P.F.; Araujo, R.E.; de Castro, R.; Freitas, D.; Melo, P.;
By: Pereirinha, P.G.; Trovao, J.P.F.; Araujo, R.E.; de Castro, R.; Freitas, D.; Melo, P.;
Wireless Measurement System for Structural Health Monitoring With High Time-Synchronization Accuracy
2012 / IEEEBy: Garcia-Palacios, J.; Araujo, A.; Nieto-Taladriz, O.; Samartin, A.; Romero, E.; Tirado, F.; Blesa, J.;
2012 / IEEE
By: Pasqualotto, R.; Serianni, G.; Pomaro, N.; Molon, F.; Brombin, M.; Dalla Palma, M.; Boldrin, M.; Ghiraldelli, R.;
By: Pasqualotto, R.; Serianni, G.; Pomaro, N.; Molon, F.; Brombin, M.; Dalla Palma, M.; Boldrin, M.; Ghiraldelli, R.;
2012 / IEEE
By: Galal, S.; Brooks, T.L.; Matalon, N.; Platenak, J.; Abdelfattah, K.; Chen, A.J.; Mehr, I.; Chandrasekhar, V.; Hui Zheng;
By: Galal, S.; Brooks, T.L.; Matalon, N.; Platenak, J.; Abdelfattah, K.; Chen, A.J.; Mehr, I.; Chandrasekhar, V.; Hui Zheng;
2012 / IEEE
By: Birkelund, K.; Larsen, J.; Belhage, B.; Toft, M.H.; Duun, S.B.; Haahr, R.G.; Thomsen, E.V.;
By: Birkelund, K.; Larsen, J.; Belhage, B.; Toft, M.H.; Duun, S.B.; Haahr, R.G.; Thomsen, E.V.;
2012 / IEEE
By: Savaresi, S.M.; Picasso, B.; Tanelli, M.; Dardanelli, A.; Santucci, M.D.; Tanna, O.;
By: Savaresi, S.M.; Picasso, B.; Tanelli, M.; Dardanelli, A.; Santucci, M.D.; Tanna, O.;