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Topic: Asynchronous Transfer Mode
Results
2012 / IEEE
By: Markus, T.; Leuschen, C.; Kurtz, N.; Elder, B.C.; Connor, L.N.; McAdoo, D.C.; Farrell, S.L.; Sonntag, J.G.; Richter-Menge, J.; Panzer, B.;
By: Markus, T.; Leuschen, C.; Kurtz, N.; Elder, B.C.; Connor, L.N.; McAdoo, D.C.; Farrell, S.L.; Sonntag, J.G.; Richter-Menge, J.; Panzer, B.;
2011 / IEEE / 978-1-4577-0780-3
By: Save, L.; Lotti, G.; Lanzi, P.; Felici, M.; Amato, F.; Tedeschi, A.;
By: Save, L.; Lotti, G.; Lanzi, P.; Felici, M.; Amato, F.; Tedeschi, A.;
2011 / IEEE / 978-1-4244-9953-3
By: Plastino, W.; Ruggieri, F.; Budano, A.; Wotawa, G.; Povinec, P.P.; De Vincenzi, M.; Bella, F.; Schoppner, M.;
By: Plastino, W.; Ruggieri, F.; Budano, A.; Wotawa, G.; Povinec, P.P.; De Vincenzi, M.; Bella, F.; Schoppner, M.;
2011 / IEEE / 978-1-4577-0863-3
By: Prasad, K.H.; Faruquie, T.A.; Nambiar, U.; Mohania, M.K.; Subramaniam, L.V.;
By: Prasad, K.H.; Faruquie, T.A.; Nambiar, U.; Mohania, M.K.; Subramaniam, L.V.;
2011 / IEEE / 978-1-4577-1005-6
By: Blackwell, W.J.; Tsan Mo; Lyu, C.-H.; Leslie, R.V.; Kim, E.J.; Chidester, L.;
By: Blackwell, W.J.; Tsan Mo; Lyu, C.-H.; Leslie, R.V.; Kim, E.J.; Chidester, L.;
2011 / IEEE / 978-1-4577-0739-1
By: Sridharan, R.; Panicker, V.V.; Jithin, C.R.; Kumar, S.; Krishnan, G.;
By: Sridharan, R.; Panicker, V.V.; Jithin, C.R.; Kumar, S.; Krishnan, G.;
2011 / IEEE / 978-1-4673-0107-7
By: Matt, K.; Reiterer, S.; Bernhart, M.; Grechenig, T.; Mauczka, A.;
By: Matt, K.; Reiterer, S.; Bernhart, M.; Grechenig, T.; Mauczka, A.;
2012 / IEEE / 978-1-4577-2071-0
By: Gimenez, R.; Serra-Vallmitjana, C.; Pous, M.; Boix, D.; Torrent-Moreno, M.;
By: Gimenez, R.; Serra-Vallmitjana, C.; Pous, M.; Boix, D.; Torrent-Moreno, M.;
2011 / IEEE / 978-1-4673-0671-3
By: Boggavarapu, L.N.P.; Vankayalapati, H.D.; Vaddi, R.S.; Anne, K.R.;
By: Boggavarapu, L.N.P.; Vankayalapati, H.D.; Vaddi, R.S.; Anne, K.R.;
2012 / IEEE / 978-81-909042-2-3
By: Parthiban, D.; Kumar, M.R.; Suganya, S.; Monisha, B.; Priya, M.V.; Philomina, A.J.; Raajan, N.R.;
By: Parthiban, D.; Kumar, M.R.; Suganya, S.; Monisha, B.; Priya, M.V.; Philomina, A.J.; Raajan, N.R.;
2012 / IEEE / 978-1-4673-1456-5
By: Crespo Moreno, J.; Arnaldo Valdes, R.-M.; Garcia, E.; Saez, F.J.;
By: Crespo Moreno, J.; Arnaldo Valdes, R.-M.; Garcia, E.; Saez, F.J.;
2012 / IEEE / 978-1-4673-0397-2
By: Kang Ryoung Park; Dong Ik Kim; Jae Kyu Suhr; Sungmin Eum; Gahyun Kim; Jaihie Kim;
By: Kang Ryoung Park; Dong Ik Kim; Jae Kyu Suhr; Sungmin Eum; Gahyun Kim; Jaihie Kim;
2014 / IEEE
By: Isemann, Bernhard; Grechenig, Thomas; Schanes, Christian; Grunberger, Janki; Gruber, Markus;
By: Isemann, Bernhard; Grechenig, Thomas; Schanes, Christian; Grunberger, Janki; Gruber, Markus;
1988 / IEEE / 0-8186-0833-1
By: Ali, A.M.; Eng, K.Y.; Walters, S.M.; Vlack, D.; Turner, J.; Baradello, C.;
By: Ali, A.M.; Eng, K.Y.; Walters, S.M.; Vlack, D.; Turner, J.; Baradello, C.;