Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Arrays
Results
2011 / IEEE
By: Rizzo, I.J.F.; Wyatt, J.L.; Theogarajan, L.; Behan, S.; Drohan, W.A.; Kelly, S.K.; Cogan, S.F.; Gingerich, M.D.; Doyle, P.; Jinghua Chen; Shire, D.B.;
By: Rizzo, I.J.F.; Wyatt, J.L.; Theogarajan, L.; Behan, S.; Drohan, W.A.; Kelly, S.K.; Cogan, S.F.; Gingerich, M.D.; Doyle, P.; Jinghua Chen; Shire, D.B.;
2011 / IEEE
By: Neto, A.; Iacono, A.; Hoevers, H.; Gerini, G.; Freni, A.; Baselmans, J.J.A.; Baryshev, A.;
By: Neto, A.; Iacono, A.; Hoevers, H.; Gerini, G.; Freni, A.; Baselmans, J.J.A.; Baryshev, A.;
2011 / IEEE
By: Friederich, F.; Roskos, H.G.; Bauer, M.; Fanzhen Meng; Thomson, M.D.; Boppel, S.; Lisauskas, A.; Hils, B.; Krozer, V.; Keil, A.; Loffler, T.; Henneberger, R.; Huhn, A.K.; Spickermann, G.; Bolivar, P.H.; von Spiegel, W.;
By: Friederich, F.; Roskos, H.G.; Bauer, M.; Fanzhen Meng; Thomson, M.D.; Boppel, S.; Lisauskas, A.; Hils, B.; Krozer, V.; Keil, A.; Loffler, T.; Henneberger, R.; Huhn, A.K.; Spickermann, G.; Bolivar, P.H.; von Spiegel, W.;
2011 / IEEE
By: McBride, R.D.; Serrano, J.D.; Rogers, T.J.; Cuneo, M.E.; Jennings, C.A.; Cleveland, M.; Suzuki-Vidal, F.; Hall, G.N.; Chittenden, J.P.; Lebedev, S.V.; Bland, S.N.; Ampleford, D.J.; Jones, M.C.; Peyton, B.;
By: McBride, R.D.; Serrano, J.D.; Rogers, T.J.; Cuneo, M.E.; Jennings, C.A.; Cleveland, M.; Suzuki-Vidal, F.; Hall, G.N.; Chittenden, J.P.; Lebedev, S.V.; Bland, S.N.; Ampleford, D.J.; Jones, M.C.; Peyton, B.;
2011 / IEEE
By: U-In Chung; Jaikwang Shin; Changjung Kim; Hong-Sun Hwang; Churoo Park; Hojung Kim; Sangbeom Kang; Jaechul Park; Myoung-Jae Lee; Sanghun Jeon; Hyun-Sik Choi;
By: U-In Chung; Jaikwang Shin; Changjung Kim; Hong-Sun Hwang; Churoo Park; Hojung Kim; Sangbeom Kang; Jaechul Park; Myoung-Jae Lee; Sanghun Jeon; Hyun-Sik Choi;
2011 / IEEE
By: Tanaka, S.; Fujiwara, H.; Ishii, Y.; Yanagisawa, K.; Kihara, Y.; Nii, K.; Tsukamoto, Y.;
By: Tanaka, S.; Fujiwara, H.; Ishii, Y.; Yanagisawa, K.; Kihara, Y.; Nii, K.; Tsukamoto, Y.;
2011 / IEEE
By: Usami, K.; Nakamura, H.; Amano, H.; Kimura, M.; Ikebuchi, D.; Namiki, M.; Yasuda, Y.; Ozaki, N.; Saito, Y.; Kondo, M.;
By: Usami, K.; Nakamura, H.; Amano, H.; Kimura, M.; Ikebuchi, D.; Namiki, M.; Yasuda, Y.; Ozaki, N.; Saito, Y.; Kondo, M.;
2011 / IEEE
By: Jin, X.H.; Ge, H.L.; Jin, D.F.; Hong, B.; Wang, X.Q.; Xu, J.C.; Huang, B.; Chen, M.; Peng, X.L.;
By: Jin, X.H.; Ge, H.L.; Jin, D.F.; Hong, B.; Wang, X.Q.; Xu, J.C.; Huang, B.; Chen, M.; Peng, X.L.;
2011 / IEEE
By: Johansson, S.; Lind, E.; Wernersson, L.; Berg, M.; Borg, B.M.; Ghalamestani, S.G.; Egard, M.;
By: Johansson, S.; Lind, E.; Wernersson, L.; Berg, M.; Borg, B.M.; Ghalamestani, S.G.; Egard, M.;
2011 / IEEE
By: Youngmin Kim; Inchan Ju; Youngwoo Kwon; Kwang-Seok Seo; Sanghyo Lee; Changyul Cheon; Jangsoo Lee; Sangsub Song;
By: Youngmin Kim; Inchan Ju; Youngwoo Kwon; Kwang-Seok Seo; Sanghyo Lee; Changyul Cheon; Jangsoo Lee; Sangsub Song;
2011 / IEEE
By: Zaaimi, B.; Torres, R.R.; Ayers, C.A.; Gaunt, R.A.; Miller, L.E.; Hokanson, J.A.; London, B.M.; Weber, D.J.;
By: Zaaimi, B.; Torres, R.R.; Ayers, C.A.; Gaunt, R.A.; Miller, L.E.; Hokanson, J.A.; London, B.M.; Weber, D.J.;
2011 / IEEE
By: Brambilla, A.; Verger, L.; Gonon, G.; Ouvrier-Buffet, P.; Rinkel, J.; Rebuffel, V.; Beldjoudi, G.; Boudou, C.;
By: Brambilla, A.; Verger, L.; Gonon, G.; Ouvrier-Buffet, P.; Rinkel, J.; Rebuffel, V.; Beldjoudi, G.; Boudou, C.;
2011 / IEEE
By: Bo-Wen Lin; Wen-Ching Hsu; Wu, Y.-C.S.; Bau-Ming Wang; Cheng-Yu Hsieh; Chung-Cheng Chang;
By: Bo-Wen Lin; Wen-Ching Hsu; Wu, Y.-C.S.; Bau-Ming Wang; Cheng-Yu Hsieh; Chung-Cheng Chang;