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Topic: Aluminium
Results
Arrays of Microplasma Jets Generated by Double Parabolic Microcavities in an Hourglass Configuration
2011 / IEEEBy: Park, S.-J.; Kim, M.H.; Cho, J.H.; Eden, J.G.;
2011 / IEEE
By: Preu, R.; Biro, D.; Wolf, A.; Clement, F.; Krieg, A.; Retzlaff, M.; Lohmuller, E.; Specht, J.; Mack, S.; Jager, U.; Pospischil, M.; Thaidigsmann, B.; Nekarda, J.;
By: Preu, R.; Biro, D.; Wolf, A.; Clement, F.; Krieg, A.; Retzlaff, M.; Lohmuller, E.; Specht, J.; Mack, S.; Jager, U.; Pospischil, M.; Thaidigsmann, B.; Nekarda, J.;
2011 / IEEE
By: Po-Yu Yang; Huang-Chung Cheng; Hung-Hsien Li; Cheng-Wei Chen; Jung-Chuan Chou; Po-Chun Chiu; Jyh-Liang Wang;
By: Po-Yu Yang; Huang-Chung Cheng; Hung-Hsien Li; Cheng-Wei Chen; Jung-Chuan Chou; Po-Chun Chiu; Jyh-Liang Wang;
2012 / IEEE
By: Qing Zhou; Lei Pang; Junping Zhao; Jun Zhang; Xuandong Liu; Wenyu Yan; Qiaogen Zhang;
By: Qing Zhou; Lei Pang; Junping Zhao; Jun Zhang; Xuandong Liu; Wenyu Yan; Qiaogen Zhang;
2012 / IEEE
By: Hansch, T.W.; Ekstrom, C.; Prokofiev, A.; Habs, D.; Assmann, W.; Thirolf, P.; Holzwarth, R.; Greiter, M.; Turler, A.; Stower, W.; Predehl, K.; Lezius, M.; Hoeschen, C.;
By: Hansch, T.W.; Ekstrom, C.; Prokofiev, A.; Habs, D.; Assmann, W.; Thirolf, P.; Holzwarth, R.; Greiter, M.; Turler, A.; Stower, W.; Predehl, K.; Lezius, M.; Hoeschen, C.;
2011 / IEEE
By: Proskurovsky, D.I.; Nefyodtsev, E.V.; Onischenko, S.A.; Tsygankov, R.V.; Batrakov, A.V.; Rostov, V.V.; Gunin, A.V.;
By: Proskurovsky, D.I.; Nefyodtsev, E.V.; Onischenko, S.A.; Tsygankov, R.V.; Batrakov, A.V.; Rostov, V.V.; Gunin, A.V.;
2012 / IEEE
By: Reddy, P.S.; Tiwari, U.K.; Narayana, K.S.; Shankar, M.S.; Kishore, P.; Sengupta, D.; Prasad, R.L.N.S.;
By: Reddy, P.S.; Tiwari, U.K.; Narayana, K.S.; Shankar, M.S.; Kishore, P.; Sengupta, D.; Prasad, R.L.N.S.;
2012 / IEEE
By: Wen-Chau Liu; Wei-Chou Hsu; Po-Cheng Chou; Chiun-Chia Chen; Yi-Jung Liu; Jian-Kai Liou;
By: Wen-Chau Liu; Wei-Chou Hsu; Po-Cheng Chou; Chiun-Chia Chen; Yi-Jung Liu; Jian-Kai Liou;
2004 / IEEE / 978-5-87911-088-3
By: Oreshkin, V.I.; Labetsky, A.Y.; Baksht, R.B.; Rousskikh, A.G.; Shishlov, A.V.;
By: Oreshkin, V.I.; Labetsky, A.Y.; Baksht, R.B.; Rousskikh, A.G.; Shishlov, A.V.;
2004 / IEEE / 978-5-87911-088-3
By: Leschev, S.A.; Mokhov, V.N.; Kusyayev, A.I.; Kulagin, A.A.; Ivanovsky, A.V.; Gorbachev, Y.N.; Vasyukov, V.A.; Burenkov, O.M.; Buyko, A.M.; Olson, R.T.; Reinovsky, R.E.; Atchison, W.L.; Anderson, B.G.; Tatarin, V.A.; Polienko, G.A.; Petrukhin, A.A.;
By: Leschev, S.A.; Mokhov, V.N.; Kusyayev, A.I.; Kulagin, A.A.; Ivanovsky, A.V.; Gorbachev, Y.N.; Vasyukov, V.A.; Burenkov, O.M.; Buyko, A.M.; Olson, R.T.; Reinovsky, R.E.; Atchison, W.L.; Anderson, B.G.; Tatarin, V.A.; Polienko, G.A.; Petrukhin, A.A.;
2004 / IEEE / 978-5-87911-088-3
By: Arinin, V.A.; Buyko, A.M.; Burenkov, O.M.; Yegorychev, B.T.; Vasyukov, V.A.; Gorbachev, Y.N.; Zmushko, V.V.; Ivanova, G.O.; Ivanovsky, A.V.; Kuzyayev, A.I.; Kulagin, A.A.; Morozov, I.V.; Mokhov, V.N.; Nadezhin, S.S.; Nizovtsev, P.N.; Pavliy, V.V.; Pak, S.V.; Polienko, G.A.; Petrukhin, A.A.; Startsev, A.I.; Skobelev, A.N.; Sokolova, N.V.; Sokolov, S.S.; Soloviev, V.P.; Sofronov, V.N.; Khoroshailo, E.S.; Chaika, T.I.; Yakubov, V.B.; Anderson, B.G.; Atchison, W.L.; Faehl, R.J.; Lindemuth, I.R.; McCulloch, Q.; Olson, R.T.; Oro, D.M.; Reinovsky, R.E.; Rodriguez, G.; Stokes, J.L.; Tabaka, L.J.; Westley, D.T.;
By: Arinin, V.A.; Buyko, A.M.; Burenkov, O.M.; Yegorychev, B.T.; Vasyukov, V.A.; Gorbachev, Y.N.; Zmushko, V.V.; Ivanova, G.O.; Ivanovsky, A.V.; Kuzyayev, A.I.; Kulagin, A.A.; Morozov, I.V.; Mokhov, V.N.; Nadezhin, S.S.; Nizovtsev, P.N.; Pavliy, V.V.; Pak, S.V.; Polienko, G.A.; Petrukhin, A.A.; Startsev, A.I.; Skobelev, A.N.; Sokolova, N.V.; Sokolov, S.S.; Soloviev, V.P.; Sofronov, V.N.; Khoroshailo, E.S.; Chaika, T.I.; Yakubov, V.B.; Anderson, B.G.; Atchison, W.L.; Faehl, R.J.; Lindemuth, I.R.; McCulloch, Q.; Olson, R.T.; Oro, D.M.; Reinovsky, R.E.; Rodriguez, G.; Stokes, J.L.; Tabaka, L.J.; Westley, D.T.;
2010 / IEEE / 978-1-4244-5261-3
By: Jaw-Shen Tsai; Nakamura, Y.; Hyunsik Im; Hoehne, F.; Pashkin, Y.; Astafiev, O.; Pekola, J.; Tiefu Li; Knyazev, D.;
By: Jaw-Shen Tsai; Nakamura, Y.; Hyunsik Im; Hoehne, F.; Pashkin, Y.; Astafiev, O.; Pekola, J.; Tiefu Li; Knyazev, D.;
2011 / IEEE / 978-1-4244-9439-2
By: Huiping Jiang; Heshun Wang; Lin Dong; Fengcheng Zheng; Yeqing Zhu;
By: Huiping Jiang; Heshun Wang; Lin Dong; Fengcheng Zheng; Yeqing Zhu;
2011 / IEEE / 978-1-4244-9439-2
By: Long, Y.J.; Liu, D.J.; Wang, X.M.; Xiang, J.F.; Leng, H.B.; Luo, J.;
By: Long, Y.J.; Liu, D.J.; Wang, X.M.; Xiang, J.F.; Leng, H.B.; Luo, J.;
2011 / IEEE / 978-1-61284-329-2
By: Burdiak, G.; Khoory, E.; Bland, S.N.; Lebedev, S.V.; Skidmore, J.; Pickworth, L.; Chittenden, J.P.; Swadling, G.; Suzuki-Vidal, F.A.; Suttle, L.; de Grouchy, P.; Hall, G.N.; Harvey-Thomson, A.;
By: Burdiak, G.; Khoory, E.; Bland, S.N.; Lebedev, S.V.; Skidmore, J.; Pickworth, L.; Chittenden, J.P.; Swadling, G.; Suzuki-Vidal, F.A.; Suttle, L.; de Grouchy, P.; Hall, G.N.; Harvey-Thomson, A.;
2011 / IEEE / 978-1-4577-0378-2
By: Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo; Kang-Yuan Lee; Hung-Wen Huang; Woei-Tyng Lin;
By: Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo; Kang-Yuan Lee; Hung-Wen Huang; Woei-Tyng Lin;
2011 / IEEE / 978-1-61284-329-2
By: Weis, M.; Mazarakis, M.G.; Franzi, M.A.; Steiner, A.M.; Chalenski, D.A.; Rittersdorf, I.M.; Lau, Y.Y.; Gilgenbach, R.M.; Gomez, M.R.; French, D.M.; Patel, S.G.; Zier, J.C.; Cuneo, M.E.; Lopez, M.R.;
By: Weis, M.; Mazarakis, M.G.; Franzi, M.A.; Steiner, A.M.; Chalenski, D.A.; Rittersdorf, I.M.; Lau, Y.Y.; Gilgenbach, R.M.; Gomez, M.R.; French, D.M.; Patel, S.G.; Zier, J.C.; Cuneo, M.E.; Lopez, M.R.;
2011 / IEEE / 978-1-61284-329-2
By: Zier, J.C.; Gilgenbach, R.M.; Chalenski, D.A.; Steiner, A.M.; Gomez, M.R.; Lau, Y.Y.; Patel, S.G.;
By: Zier, J.C.; Gilgenbach, R.M.; Chalenski, D.A.; Steiner, A.M.; Gomez, M.R.; Lau, Y.Y.; Patel, S.G.;
2011 / IEEE / 978-1-4577-0378-2
By: Tzung-Chen Wu; Chao-Te Lee; Sin-Liang Ou; Chien-Nan Hsiao; Chi-Chung Kei; Wen-Hao Cho;
By: Tzung-Chen Wu; Chao-Te Lee; Sin-Liang Ou; Chien-Nan Hsiao; Chi-Chung Kei; Wen-Hao Cho;
2011 / IEEE / 978-1-61284-329-2
By: Burdiak, G.; Niasse, N.; Bocchi, M.; Harvey-Thompson, A.J.; Suzuki-Vidal, F.; Hall, G.N.; Khoory, E.; Lebedev, S.V.; Swadling, G.F.; Subtle, L.; Bland, S.N.; de Grouchi, P.; Pickworth, L.;
By: Burdiak, G.; Niasse, N.; Bocchi, M.; Harvey-Thompson, A.J.; Suzuki-Vidal, F.; Hall, G.N.; Khoory, E.; Lebedev, S.V.; Swadling, G.F.; Subtle, L.; Bland, S.N.; de Grouchi, P.; Pickworth, L.;
2011 / IEEE / 978-1-61284-329-2
By: Shrestha, I.; Keim, S.F.; Stafford, A.; Esaulov, A.A.; Shlyaptseva, V.V.; Weller, M.E.; Osborne, G.C.; Kantsyrev, V.L.; Safronova, A.S.; Rudakov, L.I.; Coverdale, C.A.; Williamson, K.M.;
By: Shrestha, I.; Keim, S.F.; Stafford, A.; Esaulov, A.A.; Shlyaptseva, V.V.; Weller, M.E.; Osborne, G.C.; Kantsyrev, V.L.; Safronova, A.S.; Rudakov, L.I.; Coverdale, C.A.; Williamson, K.M.;
2011 / IEEE / 978-1-61284-329-2
By: LePell, P.D.; Coverdale, C.A.; Jennings, C.A.; Maron, Y.; Chittenden, J.P.; Ampleford, D.J.; Cuneo, M.E.; Yu, E.P.; Jones, B.; Hansen, S.B.;
By: LePell, P.D.; Coverdale, C.A.; Jennings, C.A.; Maron, Y.; Chittenden, J.P.; Ampleford, D.J.; Cuneo, M.E.; Yu, E.P.; Jones, B.; Hansen, S.B.;
2011 / IEEE / 978-1-61284-329-2
By: Hammer, D.A.; Kusse, B.R.; Greenly, J.B.; Shelkovenko, T.A.; Hoyt, C.L.; Pikuz, S.A.; Gourdain, P.-A.; Knapp, P.F.;
By: Hammer, D.A.; Kusse, B.R.; Greenly, J.B.; Shelkovenko, T.A.; Hoyt, C.L.; Pikuz, S.A.; Gourdain, P.-A.; Knapp, P.F.;
2011 / IEEE / 978-90-75815-14-6
By: Guichon, J.-M.; Goleanu, A.-L.; Coulomb, J.-L.; Schanen, J.-L.; Freycon, A.; Glize, P.; Dunand, M.;
By: Guichon, J.-M.; Goleanu, A.-L.; Coulomb, J.-L.; Schanen, J.-L.; Freycon, A.; Glize, P.; Dunand, M.;
2011 / IEEE / 978-1-4577-0399-7
By: Zviagintseva, E.S.; Nazarenko, O.B.; Root, L.O.; Ilyin, A.P.; Kwon, Y.S.; Smorygina, K.S.;
By: Zviagintseva, E.S.; Nazarenko, O.B.; Root, L.O.; Ilyin, A.P.; Kwon, Y.S.; Smorygina, K.S.;
2011 / IEEE / 978-986-02-8974-9
By: Shih-Kun Liu; Po-Wei Chen; Yen-Sheng Lin; Yung-Hao Huang; Kun-Cheng Chen; Wei-Chih Tseng;
By: Shih-Kun Liu; Po-Wei Chen; Yen-Sheng Lin; Yung-Hao Huang; Kun-Cheng Chen; Wei-Chih Tseng;
2011 / IEEE / 978-1-61284-653-8
By: Rajabi, S.; Fathipour, M.; Mahabadi, S.E.J.; Moghadam, H.A.; Orouji, A.A.;
By: Rajabi, S.; Fathipour, M.; Mahabadi, S.E.J.; Moghadam, H.A.; Orouji, A.A.;
2011 / IEEE / 978-1-61284-697-2
By: Shriniwar, U.; Neelgund, R.; Aud, M.; Tyrer, H.W.; Devarakonda, K.K.;
By: Shriniwar, U.; Neelgund, R.; Aud, M.; Tyrer, H.W.; Devarakonda, K.K.;
Impact of the silicon layer thickness to the optical property of sandwich photonic crystal structure
2011 / IEEE / 978-1-61284-777-1By: Xuyuan Chen; Haisheng San; Changzheng Li; Fangqiang Li;
2011 / IEEE / 978-1-4577-0399-7
By: Kwon, Y.S.; Shinkevitch, E.V.; Zvjagintseva, E.S.; Tikhonov, D.V.; Root, L.O.; Ilyin, A.P.;
By: Kwon, Y.S.; Shinkevitch, E.V.; Zvjagintseva, E.S.; Tikhonov, D.V.; Root, L.O.; Ilyin, A.P.;
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