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Topic: Alpha Particles

Results

Effect of the Uranium Decay Chain Disequilibrium on Alpha Disintegration Rate
2011 / IEEE
By: Schrimpf, R.D.; Touboul, A.D.; Portier, M.; Saigne, F.; Wrobel, F.; Gedion, M.;
Multispectral UV-Visual Imaging as a Tool for Locating and Assessing Ionizing Radiation in Air
2011 / IEEE
By: Watson, S.M.; Chichester, D.L.;
Analytical Modeling of Alpha-Particle Emission Rate at Wafer-Level
2011 / IEEE
By: Munteanu, D.; Autran, J.L.; Martinie, S.; Saigne, F.; Gedion, M.; Wrobel, F.;
Single-Event Tolerant Flip-Flop Design in 40-nm Bulk CMOS Technology
2011 / IEEE
By: Loveless, T.D.; Jagannathan, S.; Massengill, L.W.; Rennie, D.; Sachdev, M.; Wong, R.; Wen, S.; Bhuva, B.L.;
Radiation Effects in Si-NW GAA FET and CMOS Inverter: A TCAD Simulation Study
2012 / IEEE
By: Saxena, A.K.; Manhas, S.K.; Maheshwaram, S.; Rathod, S.S.; Kaushal, G.; Dasgupta, S.;
Real-Time Soft-Error Testing Results of 45-nm, High-K Metal Gate, Bulk CMOS SRAMs
2012 / IEEE
By: Kirsch, M.; Seifert, N.;
Influence of User-Controlled Parameters in Alpha Particle-Induced Single-Event Error Rates in Commercial SRAM Cells
2012 / IEEE
By: Bhuva, B. L.; Chatterjee, I.; Wong, R.; Wen, S.-J.;
Ultra-Low Emissivity Alpha-Particle Detection
2012 / IEEE
By: Rauch, S.E.; Zhu, Z.; Ronsheim, P.; Tang, H.H.K.; McNally, B.D.; Gordon, M.S.; Rodbell, K.P.; Coleman, S.;
A Novel Microdosimeter Based Upon Artificial Single Crystal Diamond
2012 / IEEE
By: Pillon, M.; Milani, E.; Marinelli, M.; Magrin, G.; Prestopino, G.; Rollet, S.; Verona-Rinati, G.; Angelone, M.; Verona, C.;
Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology
2012 / IEEE
By: Jagannathan, S.; Loveless, T.D.; Bhuva, B.L.; Gaspard, N.J.; Massengill, L.W.; Assis, T.; Wen, S.-J.; Wong, R.; Mahatme, N.;
A Hysteresis-Based D-Flip-Flop Design in 28 nm CMOS for Improved SER Hardness at Low Performance Overhead
2012 / IEEE
By: Chandrasekharan, K.; Narasimham, B.; Bhuva, B.L.; Kauppila, J.S.; Gaspard, N.J.; Djaja, G.; Wang, J.K.; Liu, Z.;
Single Particle Displacement Damage in Silicon
2012 / IEEE
By: King, M.P.; Hooten, N.C.; Schrimpf, R.D.; Reed, R.A.; Mendenhall, M.H.; Weller, R.A.; Auden, E.C.;
The Silence of the Amps: Integrated Circuits for Very-Low-Noise Processing of Random Signals from Radiation Detectors
2012 / IEEE
By: Bertuccio, G.;
Fast-Response and Low-Afterglow Cerium-Doped Lithium 6 Fluoro-Oxide Glass Scintillator for Laser Fusion-Originated Down-Scattered Neutron Detection
2012 / IEEE
By: Sarukura, N.; Nakai, M.; Nakazato, T.; Sakai, K.; Kouno, M.; Shimizu, T.; Nagai, T.; Cadatal-Raduban, M.; Yamanoi, K.; Watanabe, K.; Arikawa, Y.; Murata, T.; Kan, H.; Sato, N.; Izumi, N.; Yoshida, H.; Fujino, S.; Yoshikawa, A.; Azechi, H.; Nishimura, H.; Norimatsu, T.;
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core
2009 / IEEE / 978-1-4577-0493-2
By: Reorda, M.S.; Grosso, M.; Paccagnella, A.; Rech, P.; Appello, D.; Melchiori, F.;
The Radiochemical Analysis of Gaseous Samples (RAGS) apparatus for nuclear diagnostics at the national ignition facility
2011 / IEEE / 978-1-61284-329-2
By: Jedlovec, D.; Bernstein, L.A.; Stoeffl, W.; Moody, K.J.; Velsko, C.A.; Linden-Levy, A.; Shaughnessy, D.A.; Riddle, A.; Schneider, D.; Tereshatov, E.;
Alpha-Soft Error Rate due to new generations of high-� gate oxides and metal gate electrodes in a 32 nm node
2011 / IEEE / 978-1-4577-0586-1
By: Schrimpf, R.D.; Saigne, F.; Wrobel, F.; Gedion, M.;
Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system
2011 / IEEE / 978-1-4577-0586-1
By: Uemura, T.; Tsutsui, M.; Sano, N.; Furuta, H.; Arakawa, T.; Shibano, N.; Watanabe, Y.; Abe, S.;
Impact of electric field non-uniformity on large CdZnTe crystals
2011 / IEEE / 978-1-4673-0120-6
By: Zhong He; Feng Zhang; Weiyi Wang; Kaye, W.R.; Jae Cheon Kim;
Impact of Alpha Particles on the Electrical Characteristics of TiO$_{2}$ Memristors
2011 / IEEE
By: Wilkens, B.; Land, M.; Kathuria, A.; Charnicki, S.; DeIonno, E.; Malley, S.; Barnaby, H.J.; Tong, W.;
Single-Alpha-Particle-Induced Charge Transient Spectroscopy of the 6H-SiC ${\hbox{p}}^{+}{\hbox{n}}$ Diode Irradiated With High-Energy Electrons
2011 / IEEE
By: Iwamoto, N.; Koizumi, A.; Onoda, S.; Makino, T.; Nozaki, S.; Kojima, K.; Koike, S.; Uchida, K.; Ohshima, T.;
Hot Wall Evaporation of High-Sensitivity, High-Resolution CeBr$_{3}$ Scintillator
2012 / IEEE
By: Miller, S.R.; Gelfandbein, V.; Bhandari, H.B.; Nagarkar, V.V.; Cool, S.; Riley, K.J.; Jivotovsky, M.;
Correlating the Luminosity Parameters to Pulse Shape Discrimination
2013 / IEEE
By: Lolap, G. N.; DeVol, T. A.;
Experimental Estimation of the Window of Vulnerability for Logic Circuits
2013 / IEEE
By: Chatterjee, I.; Loveless, T. D.; Jagannathan, S.; Gaspard, N. J.; Mahatme, N. N.; Schrimpf, R. D.; Massengill, L. W.; Bhuva, B. L.;
Single and Multiple Cell Upsets in 25-nm NAND Flash Memories
2013 / IEEE
By: Gerardin, S.; Bagatin, M.; Ferlet-Cavrois, V.; Paccagnella, A.;
Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode
2013 / IEEE
By: Girard, P.; Bosio, A.; Dilillo, L.; Tsiligiannis, G.; Todri, A.; Wrobel, F.; Touboul, A; McClure, S. S.; Virazel, A.; Saigne, F.;
Performance Study of an Integrated Δ E–E Silicon Detector Telescope using the Lohengrin Fission Fragment Separator at ILL, Grenoble
2015 / IEEE
By: Mukhopadhyay, P. K.; Koster, U.; Topkar, A.; Singh, A.; Pithawa, C. K.;
Thermoluminescent Properties of Undoped and Ce-Doped Lutetium Orthosilicate and Yttrium Orthosilicate Single Crystals and Single Crystalline Films Scintillators
2014 / IEEE
By: Zorenko, T.; Zorenko, Y.; Bilski, P.; Twardak, A.; Gorbenko, V.; Sidletskiy, O.; Mandowski, A.; Mandowska, E.; Mares, J.;
Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices
2014 / IEEE
By: Fang, Y.-P.; Oates, A. S.;
Correlation of Deep Levels With Detector Performance in 4H-SiC Epitaxial Schottky Barrier Alpha Detectors
2014 / IEEE
By: Chaudhuri, S. K.; Mandal, K. C.; Mannan, M. A.; Nguyen, K. V.;
Follow-Up Multicenter Alpha Counting Comparison
2014 / IEEE
By: Gordon, M. S.; Slayman, C.; Wong, R.; Clark, B. M.; He, Y.; Wu, T.; McNally, B. D.; Marckmann, J.; Wilkinson, J. D.;
Neutron and Alpha Single Event Upsets in Advanced NAND Flash Memories
2014 / IEEE
By: Visconti, A.; Ferlet-Cavrois, V.; Frost, C. D.; Paccagnella, A.; Bagatin, M.; Gerardin, S.;
Red Emitting Phenyl-Polysiloxane Based Scintillators for Neutron Detection
2014 / IEEE
By: Collazuol, G.; Marchi, T.; Quaranta, A.; Dalla Palma, M.; Gramegna, F.; Degerlier, M.; Cinausero, M.; Carturan, S.;
An overview of application of 4H-SiC n-type epitaxial Schottky barrier detector for high resolution nuclear detection
2013 / IEEE
By: Chaudhuri, Sandeep K.; Mandal, Krishna C.; Nguyen, Khai;
Application of KCl:Eu2+ storage phosphors to wide-range neutron detection
2013 / IEEE
By: Toh, K.; Sakasai, K.; Iwamoto, Y.; Konno, C.; Takakura, K.; Nakamura, T.;
Properties of para-Terphenyl as a Detector for α , β and γ Radiation
2014 / IEEE
By: Angelone, M.; Battistoni, G.; Voena, C.; Solfaroli Camillocci, E.; Sciubba, A.; Sarti, A.; Russomando, A.; Recchia, L.; Pillon, M.; Piersanti, L.; Patera, V.; Morganti, S.; Mattei, I.; Materazzo, D.; Marafini, M.; Fiore, S.; Ferroni, F.; Faccini, R.; Bellini, F.; Bocci, V.; Collamati, F.; De Lucia, E.;
An Analytical Model to Quantify Decay Chain Disequilibrium–Application to the Thorium Decay Chain
2014 / IEEE
By: Saigne, F.; Wrobel, F.; Kaouache, A.; Autran, J.; Schrimpf, R.; Touboul, A. D.;
Amplification of the luminescence response in organic materials exposed to ionizing radiation
2013 / IEEE
By: Rocha, Licinio; Michel, Maugan; Normand, Stephane; Hamel, Matthieu;
A macro analysis of soft errors in static RAMs
1988 / IEEE
By: Shiomi, T.; Anami, K.; Nakase, Y.; Kayano, S.; Ohba, A.;
Improvement of alpha-particle-induced soft-error immunity in a GaAs SRAM by a buried p-layer
1988 / IEEE
By: Shigeta, J.; Masuda, N.; Umemoto, Y.; Mitsusada, K.;
Two-dimensional burst identification codes and their use in burst correction
1988 / IEEE
By: Van Tilborg, H.C.A.; McEliece, R.J.; Abdel-Ghaffar, K.A.S.;
Average energy needed to produce an electron-hole pair in GaSe nuclear particle detectors
1988 / IEEE
By: Tatsuyama, C.; Nakatani, H.; Sakai, E.; Takeda, F.;
A new type personnel neutron dosimeter with thin Si detectors
1988 / IEEE
By: Hashimoto, T.; Takami, Y.; Shiraishi, F.; Hatori, K.;
Calculation of critical charge of bipolar memory circuits
1989 / IEEE
By: Zhang, X.N.;
Track interaction in gamma- and charged-particle-irradiated thermoluminescence dosimeters
1988 / IEEE
By: Mische, E.; McKeever, S.W.S.; Summers, G.P.;
Alpha-, boron-, silicon- and iron-ion-induced current transients in low-capacitance silicon and GaAs diodes
1988 / IEEE
By: Bordes, N.; Wagner, R.S.; Campbell, A.B.; Knudson, A.R.; Maggiore, C.J.; Bradley, J.M.;
Physical SEU model for circuit simulations
1988 / IEEE
By: Berndt, D.; Bergman, J.; Peczalski, A.; Lai, J.C.;
Charge collection in HI/sup 2/L bipolar transistors
1988 / IEEE
By: Taktieen, M.H.; McNulty, P.J.; Salzman, J.F.; Yuan, H.T.; Weber, W.M.; Lynch, J.E.;
A new soft-error-immune static memory cell having a vertical driver MOSFET with a buried source for the ground potential
1989 / IEEE
By: Matsuki, H.; Wakui, Y.; Minami, M.; Nagano, T.;
CMOS VLSI single event transient characterization
1989 / IEEE
By: Wagner, R.S.; Fox, R.M.; Eisenstadt, W.R.; Heileman, S.J.; Bradley, J.M.; Bordes, N.;
Origin and characteristics of alpha-particle-induced permanent junction leakage
1990 / IEEE
By: Itoh, K.; Toyabe, T.; Kozuka, H.; Shimohigashi, K.; Takeuchi, K.; Kurosawa, H.;
Reliability of scrubbing recovery-techniques for memory systems
1990 / IEEE
By: Serrano, J.J.; Saleh, A.M.; Patel, J.H.;
Are you ready for next-generation dynamic RAM chips?
1990 / IEEE
By: Masuoka, F.;
A soft error improved 7 ns/2.1-W GaAs 16-kb SRAM
1989 / IEEE
By: Noda, M.; Makino, H.; Matsue, S.; Kayano, S.; Nishitani, K.; Takano, S.; Tanino, N.;
Initial operation of cooler ring, TARN II
1989 / IEEE
By: Mizobuchi, A.; Nakai, M.; Katsuki, K.; Hattori, T.; Honma, T.; Chida, K.; Katayama, T.; Yoshizawa, M.; Watanabe, T.; Watanabe, S.; Ueda, N.; Tanabe, T.; Soga, F.; Sekiguchi, M.; Noda, K.; Noda, A.;
Radiation standards and hazards
1991 / IEEE
By: Cohen, B.L.;
Characterization of thin YBaCuO films grown by coevaporation
1989 / IEEE
By: Broussard, P.R.; Wolf, S.A.; Claassen, J.H.;
Soft-error characteristics in bipolar memory cells with small critical charge
1991 / IEEE
By: Nambu, H.; Homma, N.; Idei, Y.; Sakurai, Y.;
Alpha-particle sensitive test SRAMs
1990 / IEEE
By: Blaes, B.R.; Buehler, M.G.;
Operating point selection and burn stability control for the International Thermonuclear Experimental Reactor
1989 / IEEE
By: Perkins, L.J.; Haney, S.W.;
CIT burn control using auxiliary power modulation
1989 / IEEE
By: Cohn, D.R.; Freidberg, J.P.; Chaniotakis, E.A.;
Design considerations for penetrations in the TFTR radiation shield
1989 / IEEE
By: Liew, S.L.; Ku, L.P.;
Improved charge collection of the buried p-i-n a-Si:H radiation detectors
1990 / IEEE
By: Street, R.A.; Qureshi, S.; Perez-Mendez, V.; Kaplan, S.N.; Fujieda, I.; Conti, M.; Cho, G.; Drewery, J.;
A study of the scintillation light induced in liquid xenon by electrons and alpha particles
1990 / IEEE
By: Aprile, E.; Suzuki, M.; Mukherjee, R.;
A more rugged ZnS(Ag) alpha scintillation detector
1990 / IEEE
By: Bauer, M.L.; Ramsey, J.A.; McElhaney, S.A.; Chiles, M.M.;
New method permits the detection of alpha emitters at a distance
1990 / IEEE
By: Wolf, M.A.; Unruh, W.P.; McAtee, J.L., III;
An overview of instrumentation for measuring environmental radon and radon progeny
1990 / IEEE
By: George, A.C.;
Bench-level characterization of a CMOS standard-cell D-latch using alpha-particle sensitive test circuits
1991 / IEEE
By: Buehler, M.G.; Soli, G.A.; Blaes, B.R.;
Numerical analysis of alpha-particle-induced soft errors in SOI MOS devices
1992 / IEEE
By: Iwata, H.; Ohzone, T.;
Phonon-mediated particle detection utilizing titanium superconducting transition edge sensors on silicon crystal surfaces
1991 / IEEE
By: Young, B.A.; Cabrera, B.; Lee, A.T.;
Pattern sensitive fault testing of RAMs with built-in ECC
1991 / IEEE / 0-8186-2150-8
By: Saluja, K.K.; Franklin, M.;
Long-range alpha detector (LRAD) for contamination monitoring
1992 / IEEE
By: McAtee, J.L.; Catlett, M.M.; Bounds, J.A.; Allander, K.S.; MacArthur, D.W.;
Alpha particle immune ECL latches
1991 / IEEE / 0-7803-0103-X
By: Phoenix, T.; Jones, F., Jr.; Kroesen, P.; McCall, D.; Hackenberg, J.;
Test SRAMs for characterizing alpha particle tracks in CMOS/bulk memories
1990 / IEEE / 0-87942-588-1
By: Soli, G.A.; Blaes, B.R.; Buehler, M.G.;
Slow beam extraction experiments at TARN II
1991 / IEEE / 0-7803-0135-8
By: Chida, K.; Ando, A.; Yoshizawa, M.; Mizobuchi, A.; Yoshizawa, J.; Kanazawa, M.; Tomizawa, M.; Noda, K.; Noda, A.; Muto, H.; Hattori, T.;
An on-chip ECC circuit for correcting soft errors in DRAMs with trench capacitors
1992 / IEEE
By: Mazumder, P.;
Plasma diagnosis in the IGNITEX experiment
1989 / IEEE
By: Hallock, G.; Carrera, R.; Bickerton, R.; Booth, W.D.;
Ten channel background alpha radiometer for nondestructive analysis of low activity samples
1992 / IEEE
By: Vasiliev, Y.O.; Pavlenko, Y.N.; Pugatch, V.M.; Zinets, O.S.; Rosenfeld, A.B.; Nenakhov, A.N.; Litovchenko, P.G.; Berdnichenko, S.V.; Barabash, L.I.; Tkatch, N.M.;
Proton-sensitive custom SRAM detector
1992 / IEEE
By: Blaes, B.R.; Soli, G.A.; Buehler, M.G.;
SEPIA: a new isolation structure for soft-error-immune LSIs
1993 / IEEE
By: Homma, N.; Nakamura, T.; Onai, T.;
Building-in reliability: soft errors-a case study
1992 / IEEE / 0-7803-0473-X
By: Ditali, A.; Hasnain, Z.;
Electrostatic waves in the Earth's magnetotail and in comets, and electromagnetic instabilities in the magnetosphere and the solar wind
1992 / IEEE
By: Gomberoff, L.;
An on-chip double-bit error-correcting code for three-dimensional dynamic random-access memory
1988 / IEEE / 0-8186-0870-6
By: Mazumder, P.;
Ion microbeam radiation system
1993 / IEEE
By: Geppert, L.M.; Jenkins, K.A.; Bapst, U.H.; Heidel, D.F.; Zabel, T.H.;
A summary review of displacement damage from high energy radiation in semiconductors and semiconductor devices
1991 / IEEE / 0-7803-0208-7
By: Messenger, G.C.;
A global method for burning plasma stability
1991 / IEEE / 0-7803-0132-3
By: Papanikolaou, P.; Choi, C.K.;
TFTR DT Preparation Project status
1991 / IEEE / 0-7803-0132-3
By: Perry, E.D.; Dudek, L.E.;
A prototype dark matter detector using a series array of aluminum superconducting tunnel junctions
1993 / IEEE
By: Ellman, B.; Mears, C.A.; Labov, S.E.; Watson, R.M.; Lee, J.S.; Laws, K.E.; Johnson, R.T.; Carpenter, J.W.; Bland, R.W.; Barber, W.C.; Lockhart, J.;
Spectroscopic analysis of proton-induced fluorescence from yttrium orthosilicate
1993 / IEEE
By: Czirr, J.B.; Holland, L.R.; Fisher, J.H.; Hollerman, W.A.;
Low cost pulse shaper for use with silicon PIN diodes
1993 / IEEE
By: Korner, H.J.; Gillitzer, A.; Friese, J.; Maier, M.R.;
Resistivity variations in ion implanted silicon detectors
1993 / IEEE
By: de Voigt, M.J.A.; Ligthart, W.C.M.; Klein, S.S.; Rijken, H.A.; Burger, P.;
Investigation of the type inversion phenomena: resistivity and carrier mobility in the space charge region and electrical neutral bulk in neutron irradiated silicon p/sup +/-n junction detectors
1993 / IEEE
By: Eremin, V.; Li, Z.; Verbitskaya, E.; Strokan, N.;
Alpha contamination monitoring of surfaces, objects, and enclosed areas
1993 / IEEE
By: Allander, K.S.; MacArthur, D.W.; Rutherford, D.A.; Caress, R.W.; Catlett, M.M.; Bounds, J.A.;
Ten channel low background alpha radiometer for nondestructive analysis of low activity samples
1991 / IEEE / 0-7803-0513-2
By: Nenakhov, A.N.; Vasiliev, Yu.D.; Pavlenko, Yu.N.; Pugatch, V.M.; Zinets, O.S.; Tkatch, N.M.; Rosenfeld, A.B.; Litovchenko, P.G.; Berdnichenko, S.V.; Barabash, L.I.;
Long-range alpha detector (LRAD) for contamination monitoring
1991 / IEEE / 0-7803-0513-2
By: Bounds, J.A.; Allander, K.S.; MacArthur, D.W.; McAtee, J.L.; Catlett, M.M.;
Attenuation length of scintillation light in liquid xenon
1991 / IEEE / 0-7803-0513-2
By: Aprile, E.; Suzuki, M.; Mukherjee, R.;
Graphics based PC analysis of alpha spectra
1991 / IEEE / 0-7803-0513-2
By: Chapman, T.C.;
Associated particle imaging
1991 / IEEE / 0-7803-0513-2
By: Beyerle, A.; Tunnell, L.; Hurley, J.P.; Headley, G.; Durkee, R.;
Proton-sensitive custom SRAM detector
1991 / IEEE / 0-7803-0513-2
By: Buehler, M.G.; Blaes, B.R.; Soli, G.A.;
Design of a fault-tolerant three-dimensional dynamic random-access memory with on-chip error-correcting circuit
1993 / IEEE
By: Mazumder, P.;

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