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Topic: Almn
Results
2011 / IEEE
By: George, E.M.; Lueker, M.; Holzapfel, W.L.; Irwin, K.D.; Yoon, K.W.; Ullom, J.N.; Shirokoff, E.; Niemack, M.D.; Lowell, P.; Hubmayr, J.; Cho, H.-M.; Schmidt, D.R.; O'Neil, G.C.;
By: George, E.M.; Lueker, M.; Holzapfel, W.L.; Irwin, K.D.; Yoon, K.W.; Ullom, J.N.; Shirokoff, E.; Niemack, M.D.; Lowell, P.; Hubmayr, J.; Cho, H.-M.; Schmidt, D.R.; O'Neil, G.C.;
2011 / IEEE
By: Hubmayr, J.; Austermann, J.E.; Young, E.Y.; Yoon, K.W.; Simon, S.M.; Shirokoff, E.; Schmidt, D.R.; Niemack, M.D.; Nibarger, J.P.; Meyer, S.S.; Mehl, J.; McMahon, J.; Lueker, M.; Lowell, P.; Li, D.; Irwin, K.D.; Hilton, G.C.; Henning, J.W.; Halverson, N.W.; Holzapfel, W.L.; George, E.M.; Everett, W.; Dobbs, M.; Crites, A.T.; Cho, H.; Carlstrom, J.E.; Beall, J.A.; Becker, D.; Bennett, D.A.; Benson, B.A.; Bleem, L.E.; Chang, C.L.;
By: Hubmayr, J.; Austermann, J.E.; Young, E.Y.; Yoon, K.W.; Simon, S.M.; Shirokoff, E.; Schmidt, D.R.; Niemack, M.D.; Nibarger, J.P.; Meyer, S.S.; Mehl, J.; McMahon, J.; Lueker, M.; Lowell, P.; Li, D.; Irwin, K.D.; Hilton, G.C.; Henning, J.W.; Halverson, N.W.; Holzapfel, W.L.; George, E.M.; Everett, W.; Dobbs, M.; Crites, A.T.; Cho, H.; Carlstrom, J.E.; Beall, J.A.; Becker, D.; Bennett, D.A.; Benson, B.A.; Bleem, L.E.; Chang, C.L.;
2011 / Springer Science+Business Media / 0304-3843
By: H. Gunnlaugsson; R. Mantovan; the collaboration; Y. Kobayashi; G. Weyer; R. Sielemann; T. Mølholt; D. Naidoo; K. Johnston; H. Masenda; K. Bharuth-Ram; G. Langouche; S. Ólafsson;
By: H. Gunnlaugsson; R. Mantovan; the collaboration; Y. Kobayashi; G. Weyer; R. Sielemann; T. Mølholt; D. Naidoo; K. Johnston; H. Masenda; K. Bharuth-Ram; G. Langouche; S. Ólafsson;
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