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Extraction of the Interface State Density of Top-Gate Graphene Field-Effect Transistors
2015 / IEEE
This item from - IEEE Letter - Engineered Materials, Dielectrics and Plasmas - Novel electrical measurement method, discharge current analysis (DCA), is introduced to extract the density and energy distribution of charge traps at the dielectric interface of top-gate graphene field-effect transistors. Using DCA method, the highest charge trap density
Charge Carrier Processes
Discharge Current Analysis (dca)
Top Gate Graphene Fet
Field Effect Transistors
Interfacial Trap Density,
Components, Circuits, Devices And Systems
Engineered Materials, Dielectrics And Plasmas