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Single Event Upset energy dependence in a buck-converter power supply design

By: Drake, G.; De Lurgio, P.; Stanek, R.; Senthilkumaran, A.; Reed, R.; Proudfoot, J.; Mellado, B.; Gopalakrishnan, A.; Mahadik, S.;

2012 / IEEE


This item from - IEEE Conference - 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference (2012 NSS/MIC) - We present a study of Single Event Upsets (SEU) performed on a commercial pulse-width modulator controller chip for switching power supplies. We performed tests to study the probability of an SEU occurring as a function of incident particle (hadron) energy. We discuss the performance of the circuit, and present a solution using external circuitry to effectively eliminate the effect.