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In-situ TEM characterization of nanomaterials and devices

By: Ning Lu; Floresca, H.C.; Kim, J.; Cha, D.K.; Park, S.Y.; Kim, M.J.; Wang, J.G.;

2011 / IEEE / 978-1-4577-2141-0

Description

This item was taken from the IEEE Conference ' In-situ TEM characterization of nanomaterials and devices ' Electrical properties of nano size devices were directly measured by TEM. Real time observation of phase transition behavior in PRAM revealed that the volume of the crystalline phase is the main factor in determining cell resistance. In the transistor device, we have identified the doping type and area by measuring the I-V curve at the individual nano contact on the specimen. The evolution of the graphene edge structure was controlled and monitored at and up to 1200�C in-situ.