Use this resource - and many more! - in your textbook!
AcademicPub holds over eight million pieces of educational content for you to mix-and-match your way.
Experimentally based methodology for charge pumping bulk defect trapping correction
2011 / IEEE / 978-1-4577-0115-3
This item was taken from the IEEE Conference ' Experimentally based methodology for charge pumping bulk defect trapping correction ' We develop a simple experimental approach to remove bulk trap contributions from charge pumping data collected on devices which suffer from large amounts of bulk dielectric electron trapping. The approach is more desirable and easier to implement than other simulation/device modeling based approaches. We demonstrate the approach using HfO
Charge Pumping Current
Iterative Closest Point Algorithm
Charge Carrier Processes
Bulk Dielectric Electron Trapping
Charge Pumping Data
Charge Pump Circuits
Charge Pumping Bulk Defect Trapping Correction