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Temporal particle-in-cell with Beam Optics Analyzer

By: Read, M.; Bui, T.; Ives, L.;

2011 / IEEE / 978-1-4577-0509-0

Description

This item was taken from the IEEE Conference ' Temporal particle-in-cell with Beam Optics Analyzer ' This paper will describe the new feature, temporal particle-in-cell analysis in Beam Optics Analyzer in detail. Algorithms for pushing particles and field solution will be discussed. Numerical results for a diode as well as a gridded electron gun will demonstrate the implementation.