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A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles

By: Kobayashi, K.; Hamanaka, C.; Furuta, J.; Onodera, H.;

2011 / IEEE / 978-1-4244-7516-2

Description

This item was taken from the IEEE Conference ' A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles ' We fabricated a 65nm LSI including flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. It consists of two FF arrays as follows. One is an array composed of redundant FFs to confirm radiation hardness of the proposed and conventional redundant FFs. The other is an array composed of conventional D-FFs to measure SEU (Single Event Upset) and MCU(Multiple Cell Upset) by the distance from tap cells.