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A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop capable of protecting soft errors on the C-element

By: Furuta, J.; Onodera, H.; Kobayashi, K.; Hamanaka, C.;

2010 / IEEE / 978-1-4244-5453-2

Description

This item was taken from the IEEE Conference ' A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop capable of protecting soft errors on the C-element ' We propose a Bistable Cross-coupled Dual Modular Redundancy (BCDMR) Flip-Flop to enhance soft-error immunity. It is based on a BISER FF but its bistable cross-coupled structure enhances soft-error immunity without any area, delay and power overhead. We fabricated a 65nm LSI including 60,480bit shift registers with the BCDMR and BISER structures. Experimental results using �-particles reveals that the soft-error immunity of the BCDMR is enhanced by 150x at 160MHz clock frequency compared with the BISER.