Use this resource - and many more! - in your textbook!
AcademicPub holds over eight million pieces of educational content for you to mix-and-match your way.
Large random telegraph noise in sub-threshold operation of nano-scale nMOSFETs
2009 / IEEE / 978-1-4244-2933-2
This item was taken from the IEEE Conference ' Large random telegraph noise in sub-threshold operation of nano-scale nMOSFETs ' We utilize low-frequency noise measurements to examine the sub-threshold voltage (sub-V
Low-frequency Noise Measurements
Highly Scaled Devices
Subvth Low-frequency Noise
Channel Dimension Scaling
Semiconductor Device Noise
Random Access Memory
Random Telegraph Noise
Subthreshold Voltage Operation