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Diagnosing Silicon Failures Based on Functional Test Patterns

By: Kai Yang; Lin, H.; Ten Lin; Chia-Chih Yen; Yu-Chin Hsu; Tayung Liu;

2006 / IEEE / 0-7695-2839-2


This item was taken from the IEEE Conference ' Diagnosing Silicon Failures Based on Functional Test Patterns ' Identifying the root-cause of silicon failures is crucial for silicon debug and yield improvement. However, due to the low visibility of silicon data, root-cause identification tends to be a painful process. In this paper, we develop a systematic framework to diagnose silicon failures under functional test patterns. We propose a novel scan-dump approach to isolate critical cycles. Within the critical cycles, we apply logic-reasoning techniques including active-path-tracing (AP) and what-if (WI) analysis to automatically extract and rank failure candidates. We apply our framework on an industrial circuit and demonstrate the promising results.