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Diagnosing Silicon Failures Based on Functional Test Patterns
By: Kai Yang; Lin, H.; Ten Lin; Chia-Chih Yen; Yu-Chin Hsu; Tayung Liu;
2006 / IEEE / 0-7695-2839-2
This item was taken from the IEEE Conference ' Diagnosing Silicon Failures Based on Functional Test Patterns ' Identifying the root-cause of silicon failures is crucial for silicon debug and yield improvement. However, due to the low visibility of silicon data, root-cause identification tends to be a painful process. In this paper, we develop a systematic framework to diagnose silicon failures under functional test patterns. We propose a novel scan-dump approach to isolate critical cycles. Within the critical cycles, we apply logic-reasoning techniques including active-path-tracing (AP) and what-if (WI) analysis to automatically extract and rank failure candidates. We apply our framework on an industrial circuit and demonstrate the promising results.
Functional Test Patterns
Design For Disassembly
Design For Debug
Silicon Failures Diagnosis
Reasoning About Programs