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Comparison of novel BTI measurements for high-k dielectric MOSFETs

By: Rino Choi; Byoung Hun Lee; Bersuker, G.; Young, C.; Chang Yong Kang; Dawei Heh;

2006 / IEEE / 1-4244-0161-5

Description

This item was taken from the IEEE Conference ' Comparison of novel BTI measurements for high-k dielectric MOSFETs '