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Calibration and characterization of Chino 900 nm silicon narrow-band radiation thermometer
By: Suzuki, T.; Ma, L.; Sakuma, F.; Nakanishi, A.; Kobayashi, T.;
2004 / IEEE / 4-907764-22-7
This item was taken from the IEEE Conference ' Calibration and characterization of Chino 900 nm silicon narrow-band radiation thermometer ' This paper describes the calibration and characterization of the Chino 900 nm standard radiation thermometer, IR-RST-90 W. The gain ratio, fixed-point calibrations, spectral responsivity, nonlinearity, size-of-source effect, distance effect, zero-offset stability and temperature drift were measured. Some problems were found for this thermometer regarding the out-of-band suppression, the size-of-source effect and the temperature drifts. A new type radiation thermometer was manufactured for improving the quality to use as a standard radiation thermometer.
Chino 900 Nm Silicon Narrow-band Radiation Thermometer
Electrical Resistance Measurement