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FCBM-a field-induced charged-board model for electrostatic discharges

By: Lin, D.L.;

1992 / IEEE / 0-7803-0635-X

Description

This item was taken from the IEEE Periodical ' FCBM-a field-induced charged-board model for electrostatic discharges ' The author addresses a test method for the evaluation of electronic subassemblies against the threat of electrostatic discharge (ESD). He describes a field-induced charged-board model (FCBM) for the simulation of real-world ESD. An experiment is designed and used to observe and measure ESD current waveforms. An analytic theory is developed to describe important fundamental ESD processes. The application of the theory to the FCBM ESD predicts waveform characteristics in excellent agreement with the experiment. A recommendation for the specification of the ESD waveform is offered for inclusion in future ESD test standards for electronic subassemblies.<>