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ATE hardware diagnostics, fault detection, and fault isolation tool (self-test adapter)

By: Lambrecht, R.I.;

1988 / IEEE

Description

This item was taken from the IEEE Periodical ' ATE hardware diagnostics, fault detection, and fault isolation tool (self-test adapter) ' The question of multiple levels of self-test for automatic test equipment (ATE) is examined, and a three-level self-test concept is proposed. Level one will verify test resource communications and built-in test (BIT), level two will check all of the switching resources, and level three will test the measurement and output stimulus resources. All three levels are distinct in their functions but each is dependent on the successful completion of the functions tested at the previous level. Depending on the problems encountered, only one or two levels of self-test will need to be run.<>