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Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors

By: Cester, A.; Wrachien, N.; Meneghesso, G.; Donoval, D.; Kovac, J.; Jakabovic, J.; Bari, D.;

2012 / IEEE

Description

This item was taken from the IEEE Periodical ' Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors ' We evaluated the effects of low-energy ultraviolet (UV) and visible light in organic thin-film-transistors, with an hexamethyldisilazane-treated SiO2 gate dielectric. After visible-light irradiation, the devices showed temporary variation in the threshold voltage, drain current, and transconductance. When UV irradiation is performed, the devices exhibit significant and permanent degradation, with a transconductance drop up to -18%.