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Introduction to the Special Issue on 2008 International Integrated Reliability Workshop (IIRW)

By: Tao, G.; Strong, A.; Young, C.; Haase, G.; Lenahan, P.;

2009 / IEEE

Description

This item was taken from the IEEE Periodical ' Introduction to the Special Issue on 2008 International Integrated Reliability Workshop (IIRW) ' The five papers in this special issue were selected from the IEEE International Integrated Reliability Workshop (IIRW) 2008, held on October 12-16, 2008, near South Lake Tahoe, CA.