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A DEPFET Based Beam Telescope With Submicron Precision Capability

By: Velthuis, J.J.; Wermes, N.; Hanninger, G.; Kohrs, R.; Mathes, M.; Reuen, L.; Scheirich, D.; Andricek, L.; Pascual, I.C.; Chen, X.; Dolezal, Z.; Fischer, P.; Frey, A.; Fuster, J.A.; Koch, M.; Kodys, P.; Kvasnicka, P.; Kruger, H.; Llacer, C.L.; Lodomez, P.; Moser, H.G.; Peric, I.; Raspereza, A.; Richter, R.; Rummel, S.; von Torne, E.; Drasal, Z.;

2008 / IEEE

Description

This item was taken from the IEEE Periodical ' A DEPFET Based Beam Telescope With Submicron Precision Capability ' For the detection of secondary vertices of long lived particles containing bottom and charm quarks at the International Linear Collider (ILC), a DEPFET pixel detector is one of the technologically favored options. In a DEPFET sensor a MOSFET pixel detector is integrated on a sidewards depleted silicon bulk sensor, thus combining the advantages of a fully depleted silicon sensor with in-pixel amplification. DEPFET pixel matrices have been characterized in a high energy particle beam. Since the DEPFET is a very high precision device, given its large S/N (> 100) and small pixel size (36 × 22 ¿m2), a DEPFET based pixel telescope consisting of 5 DEPFETs has been developed. The uncertainty on the predicted position for a device under test (DUT) positioned inside the telescope was found to be 1.4 ¿m with the existing device, due to the limited performance of two of the five DEPFET planes. A DEPFET telescope built of 5 modules equivalent to the best plane presented here, would have a track extrapolation error as low as 0.65 ¿m at the DUT plane.