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A DEPFET Based Beam Telescope With Submicron Precision Capability
By: Velthuis, J.J.; Wermes, N.; Hanninger, G.; Kohrs, R.; Mathes, M.; Reuen, L.; Scheirich, D.; Andricek, L.; Pascual, I.C.; Chen, X.; Dolezal, Z.; Fischer, P.; Frey, A.; Fuster, J.A.; Koch, M.; Kodys, P.; Kvasnicka, P.; Kruger, H.; Llacer, C.L.; Lodomez, P.; Moser, H.G.; Peric, I.; Raspereza, A.; Richter, R.; Rummel, S.; von Torne, E.; Drasal, Z.;
2008 / IEEE
This item was taken from the IEEE Periodical ' A DEPFET Based Beam Telescope With Submicron Precision Capability ' For the detection of secondary vertices of long lived particles containing bottom and charm quarks at the International Linear Collider (ILC), a DEPFET pixel detector is one of the technologically favored options. In a DEPFET sensor a MOSFET pixel detector is integrated on a sidewards depleted silicon bulk sensor, thus combining the advantages of a fully depleted silicon sensor with in-pixel amplification. DEPFET pixel matrices have been characterized in a high energy particle beam. Since the DEPFET is a very high precision device, given its large S/N (> 100) and small pixel size (36 × 22 ¿m2), a DEPFET based pixel telescope consisting of 5 DEPFETs has been developed. The uncertainty on the predicted position for a device under test (DUT) positioned inside the telescope was found to be 1.4 ¿m with the existing device, due to the limited performance of two of the five DEPFET planes. A DEPFET telescope built of 5 modules equivalent to the best plane presented here, would have a track extrapolation error as low as 0.65 ¿m at the DUT plane.
Solid State Detector
Position Sensitive Particle Detectors
Current Based Readout Chip
Submicron Precision Capability
Long Lived Particles
International Linear Collider
Depfet Pixel Detector
Mosfet Pixel Detector
Depleted Silicon Bulk Sensor
High Energy Particle Beam
Device Under Test
Track Extrapolation Error
Sensor Phenomena And Characterization
Active Pixel Sensor
International Linear Collider (ilc)