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Formation of bulk unipolar diodes in hydrogenated amorphous silicon by ion implantation
By: Gerstner, E.G.; Shannon, J.M.; Cheong, T.W.D.;
2001 / IEEE
Description
This item was taken from the IEEE Periodical ' Formation of bulk unipolar diodes in hydrogenated amorphous silicon by ion implantation ' Bulk unipolar diodes with a wide range of barrier heights have been made in hydrogenated amorphous silicon by ion implantation. The precise concentration of dopant atoms that can be obtained when implanting into an amorphous substrate leads to accurate barrier height control. Compared with the alternative unipolar device, the Schottky diode, these devices should provide uniform, high barrier diodes for photodetectors, and very low barrier diodes for low-power, unbiased, mixers and detectors.
Related Topics
Silicon
Hydrogen
Semiconductor Diodes
Amorphous Semiconductors
Elemental Semiconductors
Ion Implantation
Semiconductor Device Measurement
Si:h
A-si:h Bulk Unipolar Diodes
Ion Implantation
Barrier Height Range
Amorphous Substrate
Barrier Height Control
Photodetectors
Very Low Barrier Diodes
Low-power Unbiased Mixers
Low-power Unbiased Detectors
I-v Characteristics
Amorphous Silicon
Ion Implantation
Schottky Diodes
Semiconductor Diodes
Amorphous Semiconductors
Amorphous Materials
Substrates
Photodetectors
Detectors
Semiconductor Devices
Doping Profiles
Components, Circuits, Devices And Systems
Engineered Materials, Dielectrics And Plasmas
Engineering
Dopant Atom Concentration