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Author: Wann, C.H.
Results
1996 / IEEE / 0-7803-3342-X
By: Tu, R.; Wann, C.H.; Hui, K.; Yoshida, M.; Bin Yu; Tanaka, T.; Noda, K.; Chenming Hu;
By: Tu, R.; Wann, C.H.; Hui, K.; Yoshida, M.; Bin Yu; Tanaka, T.; Noda, K.; Chenming Hu;
2004 / IEEE / 0-7803-8289-7
By: Park, D.-G.; Luo, Z.J.; Wann, C.H.; Sekiguchi, A.; Ng, H.; Rengarajan, R.; Jammy, R.; Wise, R.; Steegen, A.; Narayanan, V.; D'Emic, C.; Kozlowski, P.; Duch, E.; Kim, H.; Ku, V.; Mitchell, R.; Chakravarti, A.; Ronsheim, P.; Gluschenkov, O.; Bruley, J.; Chudzik, M.; Chou, A.; Lee, B.H.; Jamison, P.; Edleman, N.; Zhu, W.; Nguyen, P.; Wong, K.; Cabral, C.;
By: Park, D.-G.; Luo, Z.J.; Wann, C.H.; Sekiguchi, A.; Ng, H.; Rengarajan, R.; Jammy, R.; Wise, R.; Steegen, A.; Narayanan, V.; D'Emic, C.; Kozlowski, P.; Duch, E.; Kim, H.; Ku, V.; Mitchell, R.; Chakravarti, A.; Ronsheim, P.; Gluschenkov, O.; Bruley, J.; Chudzik, M.; Chou, A.; Lee, B.H.; Jamison, P.; Edleman, N.; Zhu, W.; Nguyen, P.; Wong, K.; Cabral, C.;
2004 / IEEE / 0-7803-8684-1
By: Hohage, J.; Ruelke, H.; Klais, J.; Huebler, P.; Luning, S.; van Bentum, R.; Grasshoff, G.; Schwan, C.; Ehrichs, E.; Goad, S.; Buller, J.; Krishnan, S.; Greenlaw, D.; Raab, M.; Kepler, N.; Yang, H.S.; Malik, R.; Narasimha, S.; Li, Y.; Divakaruni, R.; Agnello, P.; Allen, S.; Antreasyan, A.; Arnold, J.C.; Bandy, K.; Belyansky, M.; Bonnoit, A.; Bronner, G.; Chan, V.; Chen, X.; Chen, Z.; Chidambarrao, D.; Chou, A.; Clark, W.; Crowder, S.W.; Engel, B.; Harifuchi, H.; Huang, S.F.; Jagannathan, R.; Jamin, F.F.; Kohyama, Y.; Kuroda, H.; Lai, C.W.; Lee, H.K.; Lee, W.-H.; Lim, E.H.; Lai, W.; Mallikarjunan, A.; Matsumoto, K.; McKnight, A.; Nayak, J.; Ng, H.Y.; Panda, S.; Rengarajan, R.; Steigerwalt, M.; Subbanna, S.; Subramanian, K.; Sudijono, J.; Sudo, G.; Sun, S.-P.; Tessier, B.; Toyoshima, Y.; Tran, P.; Wise, R.; Wong, R.; Yang, I.Y.; Wann, C.H.; Su, L.T.; Horstmann, M.; Feudel, Th.; Wei, A.; Frohberg, K.; Burbach, G.; Gerhardt, M.; Lenski, M.; Stephan, R.; Wieczorek, K.; Schaller, M.; Salz, H.;
By: Hohage, J.; Ruelke, H.; Klais, J.; Huebler, P.; Luning, S.; van Bentum, R.; Grasshoff, G.; Schwan, C.; Ehrichs, E.; Goad, S.; Buller, J.; Krishnan, S.; Greenlaw, D.; Raab, M.; Kepler, N.; Yang, H.S.; Malik, R.; Narasimha, S.; Li, Y.; Divakaruni, R.; Agnello, P.; Allen, S.; Antreasyan, A.; Arnold, J.C.; Bandy, K.; Belyansky, M.; Bonnoit, A.; Bronner, G.; Chan, V.; Chen, X.; Chen, Z.; Chidambarrao, D.; Chou, A.; Clark, W.; Crowder, S.W.; Engel, B.; Harifuchi, H.; Huang, S.F.; Jagannathan, R.; Jamin, F.F.; Kohyama, Y.; Kuroda, H.; Lai, C.W.; Lee, H.K.; Lee, W.-H.; Lim, E.H.; Lai, W.; Mallikarjunan, A.; Matsumoto, K.; McKnight, A.; Nayak, J.; Ng, H.Y.; Panda, S.; Rengarajan, R.; Steigerwalt, M.; Subbanna, S.; Subramanian, K.; Sudijono, J.; Sudo, G.; Sun, S.-P.; Tessier, B.; Toyoshima, Y.; Tran, P.; Wise, R.; Wong, R.; Yang, I.Y.; Wann, C.H.; Su, L.T.; Horstmann, M.; Feudel, Th.; Wei, A.; Frohberg, K.; Burbach, G.; Gerhardt, M.; Lenski, M.; Stephan, R.; Wieczorek, K.; Schaller, M.; Salz, H.;
2005 / IEEE / 0-7803-9268-X
By: Saenger, K.L.; Pfeiffer, G.; Ng, H.Y.; Haizhou Yin; Chun-Yung Sung; Wann, C.H.; Zhibin Ren; Rong Zhang; de Souza, J.P.; Sadana, D.; Rovedo, N.; Raccioppo, M.; Chan, V.; Nguyen, P.Y.; Mo, R.T.; Madan, A.; Zhijiong Luo; Lee, H.K.; Ku, V.; Kempisty, J.J.; Bendernagel, R.; Ott, J.A.; Jinghong Li; Crowder, S.W.;
By: Saenger, K.L.; Pfeiffer, G.; Ng, H.Y.; Haizhou Yin; Chun-Yung Sung; Wann, C.H.; Zhibin Ren; Rong Zhang; de Souza, J.P.; Sadana, D.; Rovedo, N.; Raccioppo, M.; Chan, V.; Nguyen, P.Y.; Mo, R.T.; Madan, A.; Zhijiong Luo; Lee, H.K.; Ku, V.; Kempisty, J.J.; Bendernagel, R.; Ott, J.A.; Jinghong Li; Crowder, S.W.;
2009 / IEEE / 978-1-4244-3432-9
By: Jen-Inn Chyi; Pei-Chin Chiu; Heng-Kuang Lin; Ta-Wei Fan; Yu-Chao Lin; Chih-Hsin Ko; Wen-Chin Lee; Wann, C.H.; Meng-Kuei Hsieh; Ta-Ming Kuan;
By: Jen-Inn Chyi; Pei-Chin Chiu; Heng-Kuang Lin; Ta-Wei Fan; Yu-Chao Lin; Chih-Hsin Ko; Wen-Chin Lee; Wann, C.H.; Meng-Kuei Hsieh; Ta-Ming Kuan;
2009 / IEEE / 978-1-4244-5641-3
By: Wann, C.H.; Lee, T.L.; Li-Wen Chang; Wong, H.-S.P.; Chang, C.Y.;
By: Wann, C.H.; Lee, T.L.; Li-Wen Chang; Wong, H.-S.P.; Chang, C.Y.;
2010 / IEEE / 978-1-4244-5063-3
By: Hau-Yu Lin; Chao-Hsin Chien; Guang-Li Luo; Chunlei Zhan; Chun-Yen Chang; Shao-Ming Koh; Xiao Gong; Hock-Chun Chin; Xingui Zhang; Huaxin Guo; Yee-Chia Yeo; Wann, C.H.; Chih-Hsin Ko; Chao-Ching Cheng; Shih-Chiang Huang; Zong-You Han;
By: Hau-Yu Lin; Chao-Hsin Chien; Guang-Li Luo; Chunlei Zhan; Chun-Yen Chang; Shao-Ming Koh; Xiao Gong; Hock-Chun Chin; Xingui Zhang; Huaxin Guo; Yee-Chia Yeo; Wann, C.H.; Chih-Hsin Ko; Chao-Ching Cheng; Shih-Chiang Huang; Zong-You Han;
2010 / IEEE / 978-1-4244-5922-3
By: Meng-Kuei Hsieh; Ta-Wei Fan; Han-Chieh Ho; Wann, C.H.; Wen-Chin Lee; Geng-Ying Liau; Ta-Ming Kuan; Chih-Hsin Ko; Jen-Inn Chyi; Pei-Chin Chiu; Heng-Kuang Lin;
By: Meng-Kuei Hsieh; Ta-Wei Fan; Han-Chieh Ho; Wann, C.H.; Wen-Chin Lee; Geng-Ying Liau; Ta-Ming Kuan; Chih-Hsin Ko; Jen-Inn Chyi; Pei-Chin Chiu; Heng-Kuang Lin;
2010 / IEEE / 978-1-4244-5922-3
By: Meng-Kuei Hsieh; Ta-Ming Kuan; Chih-Hsin Ko; Jen-Inn Chyi; Han-Chieh Ho; Wen-Chin Lee; Heng-Kuang Lin; Geng-Ying Liau; Pei-Chin Chiu; Wann, C.H.;
By: Meng-Kuei Hsieh; Ta-Ming Kuan; Chih-Hsin Ko; Jen-Inn Chyi; Han-Chieh Ho; Wen-Chin Lee; Heng-Kuang Lin; Geng-Ying Liau; Pei-Chin Chiu; Wann, C.H.;
2010 / IEEE
By: Wen-Chin Lee; Tzu-Juei Wang; Chih-Hsin Ko; Ta-Ming Kuan; Wann, C.H.; Chee Wee Liu; Chao-Yun Lai; Wen-Wei Hsu;
By: Wen-Chin Lee; Tzu-Juei Wang; Chih-Hsin Ko; Ta-Ming Kuan; Wann, C.H.; Chee Wee Liu; Chao-Yun Lai; Wen-Wei Hsu;
III-V devices featuring Si transistor-like process and its heterogeneous integration on Si substrate
2011 / IEEE / 978-1-4244-8492-8By: Cheng, C.-C.; Wu, C.-H.; Ko, C.-H.; Wann, C.H.; Lin, Y.-R.; Lin, H.-Y.;
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