Your Search Results

Use materials by this author in your textbook!

AcademicPub holds over eight million pieces of educational content such as case studies and journal articles for you to mix-and-match your way.

Experience the freedom of customizing your course pack with AcademicPub!

Not an educator but still interested in using this content? No problem! Visit our provider's page to contact the publisher and get permission directly.

Author: Tze Wee Chen

Results

Synthesized compact model and experimental results for substrate noise coupling in lightly doped processes

2005 / IEEE / 0-7803-9023-7
By: Dutton, R.W.; Jae Wook Kim; Nikaeen, P.; Chi On Chui; Tze Wee Chen; Hai Lan;

Synthesized Compact Models and Experimental Verifications for Substrate Noise Coupling in Mixed-Signal ICs

2006 / IEEE
By: Lan, H.; Dutton, R.W.; Jae Wook Kim; Nikaeen, P.; Chi On Chui; Tze Wee Chen;

Nonvolatile SRAM Cell

2006 / IEEE / 1-4244-0438-X
By: Fujita, S.; Tze Wee Chen; Gibby, A.; Zheng Wang; Griffin, P.; Wei Wang; Wong, S.; Nishi, Y.;

Macro-Model for Post-Breakdown 90NM and 130NM Transistors and its Applications in Predicting Chip-Level Function Failure after ESD-CDM Events

2007 / IEEE / 1-4244-0918-7
By: Wei Wang; Loh, W.; Choshu Ito; Tze Wee Chen; Dutton, R.W.; Mitra, S.;

Thermal Modeling and Device Noise Properties of 3D-SOI Technology

2007 / IEEE / 978-1-4244-0879-5
By: Jung Hoon Chun; Tze Wee Chen; Dutton, R.W.; Wei Wang; Navid, R.; Yi-chang Lu;

Gate-Oxide Early Life Failure Prediction

2008 / IEEE / 0-7695-3123-7
By: Young Moon Kim; Kyunglok Kim; Tze Wee Chen; Mitra, S.;

Detecting E and H fields with microstrip transmission lines

2008 / IEEE / 978-1-4244-1699-8
By: Tze Wee Chen; Chou, B.; Maloney, T.J.;

Design Methodology and Protection Strategy for ESD-CDM Robust Digital System Design in 90-nm and 130-nm Technologies

2009 / IEEE
By: Wei Wang; Loh, W.; Ito, C.; Tze Wee Chen; Dutton, R.W.; Mitra, S.; Doddapaneni, K.;

Wafer-level Charged Device Model testing

2008 / IEEE / 978-1-58537-146-4
By: Tze Wee Chen; Maloney, T.J.; Chou, B.C.;

Ultra-Fast Transmission Line pulse testing of tunneling and giant magnetoresistive recording heads

2008 / IEEE / 978-1-58537-146-4
By: Dutton, R.W.; Wallash, A.; Tze Wee Chen;

Experimental study of gate oxide early-life failures

2009 / IEEE / 978-1-4244-2888-5
By: Tze Wee Chen; Mitra, S.; Mizuno, M.; Kameda, Y.; Kyunglok Kim; Young Moon Kim;

ESD design challenges and strategies in deeply-scaled integrated circuits

2009 / IEEE / 978-1-4244-4071-9
By: Tze Wee Chen; Shuqing Cao; Dutton, R.W.; Beebe, S.G.;

Gate-oxide early-life failure identification using delay shifts

2010 / IEEE / 978-1-4244-6650-4
By: Kameda, Y.; Tze Wee Chen; Young Moon Kim; Mitra, S.; Mizuno, M.;

Return To Top