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Author: Skowronski, W.
Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks2015 / IEEE
By: Sievers, S.; Liebing, N.; Schumacher, H.W.; Ocker, B.; Langer, J.; Reiss, G.; Rott, K.; Stobiecki, T.; Skowronski, W.; Pasquale, M.; Serrano-Guisan, S.; Ferreira, R.; Paz, E.; Caprile, A.; Manzin, A.;