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Author: Raychaudhuri, D.
Results
2012 / IEEE / 978-1-4577-0295-2
By: Martin, R.P.; Fukuyama, J.; Nguyen, T.D.; Yanyong Zhang; Baid, A.; Tam Vu; Raychaudhuri, D.;
By: Martin, R.P.; Fukuyama, J.; Nguyen, T.D.; Yanyong Zhang; Baid, A.; Tam Vu; Raychaudhuri, D.;
1992 / IEEE
By: Ng, S.-B.; Joseph, K.; Saint Girons, R.; Zdepski, J.; Raychaudhuri, D.; Siracusa, R.;
By: Ng, S.-B.; Joseph, K.; Saint Girons, R.; Zdepski, J.; Raychaudhuri, D.; Siracusa, R.;
1992 / IEEE / 0-7803-0593-0
By: Saint Girons, R.; Zdepski, J.; Siracusa, R.; Raychaudhuri, D.; Ng, S.; Savatier, T.;
By: Saint Girons, R.; Zdepski, J.; Siracusa, R.; Raychaudhuri, D.; Ng, S.; Savatier, T.;
1993 / IEEE / 0-8186-3580-0
By: Melamed, B.; Raychaudhuri, D.; Reininger, D.; Hill, J.; Sengupta, B.;
By: Melamed, B.; Raychaudhuri, D.; Reininger, D.; Hill, J.; Sengupta, B.;
1996 / IEEE / 0-7803-3250-4
By: French, L.J.; Raychaudhuri, D.; Johnston, C.; Narasimhan, P.; Yuan, R.; Biswas, S.K.; Siracusa, R.J.;
By: French, L.J.; Raychaudhuri, D.; Johnston, C.; Narasimhan, P.; Yuan, R.; Biswas, S.K.; Siracusa, R.J.;
1997 / IEEE
By: Johnston, C.A.; Narasimhan, P.; Ruixi Yuan; Biswas, S.K.; Siracusa, R.J.; French, L.J.; Raychaudhuri, D.;
By: Johnston, C.A.; Narasimhan, P.; Ruixi Yuan; Biswas, S.K.; Siracusa, R.J.; French, L.J.; Raychaudhuri, D.;
1992 / IEEE / 0-7803-0479-9
By: Siracusa, R.; Ng, S.; Joseph, K.; Saint Girons, R.; Zdepski, J.; Raychaudhuri, D.;
By: Siracusa, R.; Ng, S.; Joseph, K.; Saint Girons, R.; Zdepski, J.; Raychaudhuri, D.;
2004 / IEEE / 0-7803-8523-3
By: Seskar, I.; Zhao, S.; Anepu, B.; Raju, L.; Ganu, S.; Raychaudhuri, D.;
By: Seskar, I.; Zhao, S.; Anepu, B.; Raju, L.; Ganu, S.; Raychaudhuri, D.;
2005 / IEEE / 0-7803-8966-2
By: Kremo, H.; Ramachandran, K.; Ganu, S.; Ott, M.; Siracusa, R.; Raychaudhuri, D.; Singh, M.; Seskar, I.; Liu, H.;
By: Kremo, H.; Ramachandran, K.; Ganu, S.; Ott, M.; Siracusa, R.; Raychaudhuri, D.; Singh, M.; Seskar, I.; Liu, H.;
2005 / IEEE / 0-7695-2342-0
By: Siun-Chuon Mau; Demirhan, M.; Seskar, I.; Datta, S.; Raychaudhuri, D.;
By: Siun-Chuon Mau; Demirhan, M.; Seskar, I.; Datta, S.; Raychaudhuri, D.;