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Author: Raj, P.M.
Results
2012 / IEEE
By: Murali, K.P.; Mishra, D.; Sharma, H.; Raj, P.M.; Tummala, R.R.; Swaminathan, M.; Kyuhwan Han;
By: Murali, K.P.; Mishra, D.; Sharma, H.; Raj, P.M.; Tummala, R.R.; Swaminathan, M.; Kyuhwan Han;
2012 / IEEE / 978-1-4673-1965-2
By: Murali, K.P.; Raj, P.M.; Berg, N.; Slenes, K.; Tummala, R.; Gandhi, S.;
By: Murali, K.P.; Raj, P.M.; Berg, N.; Slenes, K.; Tummala, R.; Gandhi, S.;
2012 / IEEE / 978-1-4673-1965-2
By: Nair, V.; Tummala, R.; Murali, K.P.; Sharma, H.; Raj, P.M.; Swaminathan, M.; Kyu Han;
By: Nair, V.; Tummala, R.; Murali, K.P.; Sharma, H.; Raj, P.M.; Swaminathan, M.; Kyu Han;
2001 / IEEE / 0-930815-64-5
By: Windlass, H.; Raj, P.M.; Tummala, R.R.; Bhattacharya, S.K.; Balaraman, D.;
By: Windlass, H.; Raj, P.M.; Tummala, R.R.; Bhattacharya, S.K.; Balaraman, D.;
2002 / IEEE / 0-7803-7430-4
By: Wong, C.P.; Shinotani, K.; Bhattacharya, S.K.; Raj, P.M.; Brownlee, K.; Tummala, R.R.;
By: Wong, C.P.; Shinotani, K.; Bhattacharya, S.K.; Raj, P.M.; Brownlee, K.; Tummala, R.R.;
2003 / IEEE / 0-7803-7791-5
By: Raj, P.M.; Shinotani, K.; Brownlee, K.; Tummala, R.R.; Wong, C.P.; Bbattacharya, S.K.;
By: Raj, P.M.; Shinotani, K.; Brownlee, K.; Tummala, R.R.; Wong, C.P.; Bbattacharya, S.K.;
2003 / IEEE / 0-7803-7791-5
By: Shinotani, K.; Raj, P.M.; Bansal, S.; Lance, M.J.; Tummala, R.; Bhattacharya, S.;
By: Shinotani, K.; Raj, P.M.; Bansal, S.; Lance, M.J.; Tummala, R.; Bhattacharya, S.;
2003 / IEEE / 0-7803-7791-5
By: Lixi Wan; Balaraman, D.; Tummala, R.; Swaininathan, M.; Raj, P.M.; Dalmia, S.; Bhattacharya, S.; Abothu, I.R.;
By: Lixi Wan; Balaraman, D.; Tummala, R.; Swaininathan, M.; Raj, P.M.; Dalmia, S.; Bhattacharya, S.; Abothu, I.R.;
2003 / IEEE / 0-7803-8205-6
By: Atmur, S.; Hayes, S.; Tummala, R.; Bhattacharya, S.; Kumbhat, N.; Bansal, S.; Raj, P.M.; Doraiswami, R.;
By: Atmur, S.; Hayes, S.; Tummala, R.; Bhattacharya, S.; Kumbhat, N.; Bansal, S.; Raj, P.M.; Doraiswami, R.;
2003 / IEEE / 0-7803-8205-6
By: Ravi, D.; Raj, P.M.; Abothu, I.R.; Aggarwal, A.O.; Tummala, R.R.; Tay, A.O.; Sacks, M.D.;
By: Ravi, D.; Raj, P.M.; Abothu, I.R.; Aggarwal, A.O.; Tummala, R.R.; Tay, A.O.; Sacks, M.D.;
2004 / IEEE / 0-7803-8436-9
By: Sacks, M.D.; Ravi, D.; Abothu, I.R.; Raj, P.M.; Aggarwal, A.O.; Tummala, R.R.; Tay, A.A.O.;
By: Sacks, M.D.; Ravi, D.; Abothu, I.R.; Raj, P.M.; Aggarwal, A.O.; Tummala, R.R.; Tay, A.A.O.;
2004 / IEEE / 0-7803-8365-6
By: Bhattacharya, S.; Abothu, I.R.; Patel, V.; Raj, P.M.; Lixi Wan; Jinwoo Choi; Balaraman, D.; Tummala, R.; Swaminathan, M.;
By: Bhattacharya, S.; Abothu, I.R.; Patel, V.; Raj, P.M.; Lixi Wan; Jinwoo Choi; Balaraman, D.; Tummala, R.; Swaminathan, M.;
2004 / IEEE / 0-7803-8365-6
By: Tummala, R.R.; Lance, M.J.; Swaminathan, M.; Sacks, M.D.; Abothu, I.R.; Bhattacharya, S.; Govind, V.; Balaraman, D.; Raj, P.M.;
By: Tummala, R.R.; Lance, M.J.; Swaminathan, M.; Sacks, M.D.; Abothu, I.R.; Bhattacharya, S.; Govind, V.; Balaraman, D.; Raj, P.M.;
2004 / IEEE / 0-7803-8365-6
By: Bhattacharya, S.; Ayazi, F.; Raj, P.M.; Naeli, K.; Aggarwal, A.O.; Tummala, R.R.;
By: Bhattacharya, S.; Ayazi, F.; Raj, P.M.; Naeli, K.; Aggarwal, A.O.; Tummala, R.R.;
2004 / IEEE / 0-7803-8620-5
By: Bhattacharya, S.; Balaraman, D.; Chang, G.K.; Fuhan Liu; Tummala, R.R.; Sundaram, V.; Guidotti, D.; Zhaoran Huang; Chang, Y.-J.; Abothu, I.R.; Raj, P.M.;
By: Bhattacharya, S.; Balaraman, D.; Chang, G.K.; Fuhan Liu; Tummala, R.R.; Sundaram, V.; Guidotti, D.; Zhaoran Huang; Chang, Y.-J.; Abothu, I.R.; Raj, P.M.;
2005 / IEEE / 0-7803-9085-7
By: Balaraman, D.; Raj, P.M.; Sundaram, V.; Abothu, I.R.; Lixi Wan; Varadarajan, M.; Bhattacharya, S.; Lee, K.J.; Lauffer, J.; Dunford, S.; Viswanadham, P.; Muthana, P.; Tummala, R.; Sitaraman, S.; Swaminathan, M.;
By: Balaraman, D.; Raj, P.M.; Sundaram, V.; Abothu, I.R.; Lixi Wan; Varadarajan, M.; Bhattacharya, S.; Lee, K.J.; Lauffer, J.; Dunford, S.; Viswanadham, P.; Muthana, P.; Tummala, R.; Sitaraman, S.; Swaminathan, M.;
2005 / IEEE / 0-7803-8907-7
By: Raj, P.M.; Aggarwal, A.O.; Tummala, R.R.; Mullapudi, R.; Sauwee Koh; Ravi, D.; Sundaram, V.;
By: Raj, P.M.; Aggarwal, A.O.; Tummala, R.R.; Mullapudi, R.; Sauwee Koh; Ravi, D.; Sundaram, V.;
2005 / IEEE / 0-7803-8907-7
By: Meyer, H.; Lance, M.; Bhattacharya, S.; Sacks, M.; Swaminathan, M.; Abothu, R.; Raj, P.M.; Balaraman, D.; Tumrnala, R.;
By: Meyer, H.; Lance, M.; Bhattacharya, S.; Sacks, M.; Swaminathan, M.; Abothu, R.; Raj, P.M.; Balaraman, D.; Tumrnala, R.;
2005 / IEEE / 0-7803-8907-7
By: Kumbhat, N.; Tummala, R.R.; Sitaraman, S.K.; Bhattacharya, S.; Sundaram, V.; Doraiswamy, R.; Atmur, S.; Pucha, R.V.; Raj, P.M.;
By: Kumbhat, N.; Tummala, R.R.; Sitaraman, S.K.; Bhattacharya, S.; Sundaram, V.; Doraiswamy, R.; Atmur, S.; Pucha, R.V.; Raj, P.M.;
2005 / IEEE / 0-7803-8907-7
By: Raj, P.M.; Lixi Wan; Tummala, R.; Swaminathan, M.; Abothu, I.R.; Varadarajan, M.; Bhattacharya, S.K.; Muthana, P.; Balaraman, D.;
By: Raj, P.M.; Lixi Wan; Tummala, R.; Swaminathan, M.; Abothu, I.R.; Varadarajan, M.; Bhattacharya, S.K.; Muthana, P.; Balaraman, D.;
2005 / IEEE / 0-7803-8907-7
By: Raj, P.M.; Bhattacharya, S.K.; Lixi Wan; Sundaram, V.; Tummala, R.; Swaminathan, P.; Muthana, P.;
By: Raj, P.M.; Bhattacharya, S.K.; Lixi Wan; Sundaram, V.; Tummala, R.; Swaminathan, P.; Muthana, P.;
2005 / IEEE / 0-7803-9380-5
By: Raj, P.M.; Tummala, R.; Swaminathan, M.; Muthana, P.; Engin, E.; Bhattacharya, S.; Balaraman, D.; Lixi Wan;
By: Raj, P.M.; Tummala, R.; Swaminathan, M.; Muthana, P.; Engin, E.; Bhattacharya, S.; Balaraman, D.; Lixi Wan;
2007 / IEEE / 1-4244-0984-5
By: Yamamoto, H.; Iyer, M.; Kumar, M.; Jin Hyun Hwang; Raj, P.M.; Abothu, I.R.; Tummala, R.;
By: Yamamoto, H.; Iyer, M.; Kumar, M.; Jin Hyun Hwang; Raj, P.M.; Abothu, I.R.; Tummala, R.;
2007 / IEEE / 1-4244-0984-5
By: Jin-Hyun Hwang; Tummala, R.; Jong-Kuk Hong; Hyung-Mi Jung; Iyer, M.; Chong Yoon; Abothu, I.R.; Raj, P.M.;
By: Jin-Hyun Hwang; Tummala, R.; Jong-Kuk Hong; Hyung-Mi Jung; Iyer, M.; Chong Yoon; Abothu, I.R.; Raj, P.M.;
2007 / IEEE / 1-4244-0984-5
By: Iyer, M.; Raj, P.M.; Goud, J.; Jin Liu; Tummala, R.R.; Zhonglin Wang;
By: Iyer, M.; Raj, P.M.; Goud, J.; Jin Liu; Tummala, R.R.; Zhonglin Wang;
2007 / IEEE
By: Kumbhat, N.; Tummala, R.R.; Sitaraman, S.K.; Bongio, E.; Raj, P.M.; Jui-Yun Tsai; Pucha, R.V.; Atmur, S.;
By: Kumbhat, N.; Tummala, R.R.; Sitaraman, S.K.; Bongio, E.; Raj, P.M.; Jui-Yun Tsai; Pucha, R.V.; Atmur, S.;
2008 / IEEE / 978-1-4244-2230-2
By: Mehrotra, G.; Bandyopadhyay, T.; Tummala, R.R.; Swaminathan, M.; Raj, P.M.; Iyer, M.K.;
By: Mehrotra, G.; Bandyopadhyay, T.; Tummala, R.R.; Swaminathan, M.; Raj, P.M.; Iyer, M.K.;
2008 / IEEE / 978-1-4244-2230-2
By: Zhong Lin Wang; Iyer, M.; Raj, P.M.; Goud, J.; Jin Liu; Tummala, R.R.;
By: Zhong Lin Wang; Iyer, M.; Raj, P.M.; Goud, J.; Jin Liu; Tummala, R.R.;
2008 / IEEE / 978-1-4244-2230-2
By: Venkatesan, M.; Jha, G.; Raj, P.M.; Goud, J.D.; Iyer, M.; Mehrotra, G.; Tummala, R.; Hess, D.;
By: Venkatesan, M.; Jha, G.; Raj, P.M.; Goud, J.D.; Iyer, M.; Mehrotra, G.; Tummala, R.; Hess, D.;
2009 / IEEE / 978-1-4244-4475-5
By: Chatterjee, R.; Moon, K.S.; Zhang, R.; Raj, P.M.; Mehrotra, G.; Raine, M.; Sundaram, V.; Kumbhat, N.; Tummala, R.R.; Choudhury, A.; Wong, C.P.; Meyer-Berg, G.;
By: Chatterjee, R.; Moon, K.S.; Zhang, R.; Raj, P.M.; Mehrotra, G.; Raine, M.; Sundaram, V.; Kumbhat, N.; Tummala, R.R.; Choudhury, A.; Wong, C.P.; Meyer-Berg, G.;
2009 / IEEE / 978-1-4244-4071-9
By: Choudury, A.; Sridharan, V.; Sukumaran, V.; Raj, P.M.; Kumbhat, N.; Qiao Chen; Chatterjee, R.; Sundaram, V.; Tummala, R.R.; Bandyopadhyay, T.;
By: Choudury, A.; Sridharan, V.; Sukumaran, V.; Raj, P.M.; Kumbhat, N.; Qiao Chen; Chatterjee, R.; Sundaram, V.; Tummala, R.R.; Bandyopadhyay, T.;
2010 / IEEE / 978-1-4244-6412-8
By: Tummala, R.; Wong, C.P.; Bolanos-Avila, M.; Dunne, R.; Choudhury, A.; Rongwei Zhang; Raj, P.M.; Kumbhat, N.; Sundaram, V.;
By: Tummala, R.; Wong, C.P.; Bolanos-Avila, M.; Dunne, R.; Choudhury, A.; Rongwei Zhang; Raj, P.M.; Kumbhat, N.; Sundaram, V.;
2011 / IEEE / 978-1-61284-498-5
By: Pucha, R.V.; Addya, S.; Khan, S.; Yushu Wang; Kumbhat, N.; Choudhury, A.; Raj, P.M.; Mishra, D.; Tummala, R.; Sundaram, V.;
By: Pucha, R.V.; Addya, S.; Khan, S.; Yushu Wang; Kumbhat, N.; Choudhury, A.; Raj, P.M.; Mishra, D.; Tummala, R.; Sundaram, V.;
2011 / IEEE / 978-1-61284-498-5
By: Tummala, R.; Williams, B.; Sharma, H.; Raj, P.M.; Shu Xiang; Yushu Wang;
By: Tummala, R.; Williams, B.; Sharma, H.; Raj, P.M.; Shu Xiang; Yushu Wang;