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Author: Plummer, J.D.
Results
1994 / IEEE
By: Plummer, J.D.; Kuehne, S.C.; Ver Ploeg, E.P.; Nguyen, C.T.; Renteln, P.; Wong, S.S.;
By: Plummer, J.D.; Kuehne, S.C.; Ver Ploeg, E.P.; Nguyen, C.T.; Renteln, P.; Wong, S.S.;
1992 / IEEE / 0-7803-0817-4
By: Ver Ploeg, E.P.; Watanabe, T.; Kistler, N.A.; Woos, J.C.S.; Plummer, J.D.;
By: Ver Ploeg, E.P.; Watanabe, T.; Kistler, N.A.; Woos, J.C.S.; Plummer, J.D.;
1992 / IEEE / 0-7803-0817-4
By: Plummer, J.D.; Carey, P.G.; Griffin, P.B.; Rousseau, P.M.; Luning, S.;
By: Plummer, J.D.; Carey, P.G.; Griffin, P.B.; Rousseau, P.M.; Luning, S.;
1992 / IEEE / 0-7803-0817-4
By: Iyer, S.S.; Croke, E.T.; Plummer, J.D.; Mierzwinski, M.E.; Harrell, M.J.;
By: Iyer, S.S.; Croke, E.T.; Plummer, J.D.; Mierzwinski, M.E.; Harrell, M.J.;
1993 / IEEE / 0-7803-1450-6
By: Huang, R.Y.S.; Lever, R.F.; Griffin, P.B.; Plummer, J.D.; Packan, P.A.; Kennel, H.W.;
By: Huang, R.Y.S.; Lever, R.F.; Griffin, P.B.; Plummer, J.D.; Packan, P.A.; Kennel, H.W.;
1995 / IEEE / 0-7803-2700-4
By: Scott, J.A.; Snyder, J.P.; Rousseau, P.M.; Crowder, S.W.; Plummer, J.D.; Griffin, P.B.;
By: Scott, J.A.; Snyder, J.P.; Rousseau, P.M.; Crowder, S.W.; Plummer, J.D.; Griffin, P.B.;
1996 / IEEE / 0-7803-3106-0
By: Paul, K.; Nguyen, C.T.; Huang, V.S.K.; Kuehne, S.C.; Wong, S.S.; Plummer, J.D.; Leung, Y.K.;
By: Paul, K.; Nguyen, C.T.; Huang, V.S.K.; Kuehne, S.C.; Wong, S.S.; Plummer, J.D.; Leung, Y.K.;
1996 / IEEE / 0-7803-3315-2
By: Kuehne, S.C.; Leung, Y.K.; Wong, S.S.; Plummer, J.D.; Paul, A.K.; Nguyen, C.T.; Huang, V.S.K.;
By: Kuehne, S.C.; Leung, Y.K.; Wong, S.S.; Plummer, J.D.; Paul, A.K.; Nguyen, C.T.; Huang, V.S.K.;
1997 / IEEE
By: Plummer, J.D.; Paul, A.K.; Nguyen, C.T.; Huang, V.S.K.; Kuehne, S.C.; Ying-Keung Leung; Wong, S.S.;
By: Plummer, J.D.; Paul, A.K.; Nguyen, C.T.; Huang, V.S.K.; Kuehne, S.C.; Ying-Keung Leung; Wong, S.S.;
1997 / IEEE / 0-7803-3243-1
By: Lukaszek, W.; Plummer, J.D.; Saraswat, K.C.; Subramanian, V.; Kumar, M.V.;
By: Lukaszek, W.; Plummer, J.D.; Saraswat, K.C.; Subramanian, V.; Kumar, M.V.;
1998 / IEEE / 0-7503-0556-8
By: Massengale, A.R.; Harris, J.S., Jr.; Plummer, J.D.; Deal, M.D.; Tai, C.Y.;
By: Massengale, A.R.; Harris, J.S., Jr.; Plummer, J.D.; Deal, M.D.; Tai, C.Y.;
1998 / IEEE / 0-7803-4774-9
By: Pianetta, P.; Kasnavi, R.; Plummer, J.D.; Griffin, P.B.; Renee Mo; Yun Sun;
By: Pianetta, P.; Kasnavi, R.; Plummer, J.D.; Griffin, P.B.; Renee Mo; Yun Sun;
2000 / IEEE / 0-7803-6438-4
By: Sang-Hyun Oh; Hergenrother, J.M.; Plummer, J.D.; Wilk, G.D.; Weber, G.R.; Timko, A.G.; Sorsch, T.W.; Short, K.; Rosamilia, J.M.; Rafferty, C.S.; Morris, M.D.; Miner, J.F.; Lee, J.T.-C.; Kleiman, R.N.; King, C.A.; Keller, R.C.; Johnson, R.W.; Hillenius, S.J.; Green, M.L.; Grazul, J.L.; Gossmann, H.J.; Nigam, T.; Monroe, D.; Klemens, F.P.; Kornblit, A.; Mansfield, W.M.; Baker, M.R.; Barr, D.L.; Baumann, F.H.; Bolan, K.J.; Boone, T.; Ciampa, N.A.; Cirelli, R.A.; Eaglesham, D.J.; Ferry, E.J.; Fiory, A.T.; Frackoviak, J.; Garno, J.P.;
By: Sang-Hyun Oh; Hergenrother, J.M.; Plummer, J.D.; Wilk, G.D.; Weber, G.R.; Timko, A.G.; Sorsch, T.W.; Short, K.; Rosamilia, J.M.; Rafferty, C.S.; Morris, M.D.; Miner, J.F.; Lee, J.T.-C.; Kleiman, R.N.; King, C.A.; Keller, R.C.; Johnson, R.W.; Hillenius, S.J.; Green, M.L.; Grazul, J.L.; Gossmann, H.J.; Nigam, T.; Monroe, D.; Klemens, F.P.; Kornblit, A.; Mansfield, W.M.; Baker, M.R.; Barr, D.L.; Baumann, F.H.; Bolan, K.J.; Boone, T.; Ciampa, N.A.; Cirelli, R.A.; Eaglesham, D.J.; Ferry, E.J.; Fiory, A.T.; Frackoviak, J.; Garno, J.P.;
2002 / IEEE / 0-7803-7462-2
By: Gelpey, J.; Elliott, K.; Ross, J.; McCoy, S.; Paton, E.; Barbolla, J.; Griffin, P.B.; Aboy, M.; Pelaz, L.; Mokhberi, A.; Marques, L.; Plummer, J.D.;
By: Gelpey, J.; Elliott, K.; Ross, J.; McCoy, S.; Paton, E.; Barbolla, J.; Griffin, P.B.; Aboy, M.; Pelaz, L.; Mokhberi, A.; Marques, L.; Plummer, J.D.;
2003 / IEEE / 0-7803-7826-1
By: Barbolla, J.; Aboy, M.; Marques, L.A.; Pelaz, L.; Mokhberi, A.; Plummer, J.D.; Griffin, P.B.; Takamura, Y.;
By: Barbolla, J.; Aboy, M.; Marques, L.A.; Pelaz, L.; Mokhberi, A.; Plummer, J.D.; Griffin, P.B.; Takamura, Y.;