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Author: Park, D.

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Full metal gate with borderless contact for 14 nm and beyond

2011 / IEEE / 978-1-4244-9949-6
By: Seo, S.; Edge, L.F.; Paruchuri, V.K.; Narayanan, V.; Khare, M.; Divakaruni, R.; Doris, B.; Stathis, J.H.; Park, D.; Cartier, E.A.; Chang, J.; Brown, S.L.; Hopstaken, M.; Bruley, J.; Haran, B.; Vo, T.; Li, J.T.; Horak, D.; Fan, S.; Sankarapandian, M.; Ariyoshi, K.; Jamison, P.; Watanabe, K.; Wang, M.M.; Adam, L.; Inada, A.; Frank, M.; Kanakasabapathy, S.;

Understanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-� / metal-gate pFETs

2011 / IEEE / 978-1-4244-9949-6
By: Ren, Z.; Haensch, W.; Tega, N.; Yamaoka, M.; Miki, H.; Torii, K.; Kobayashi, M.; Park, D.; Guillorn, M.A.; Frank, D.J.; Zhu, Y.; D'Emic, C.P.;

N-best maximal decoders for part models

2011 / IEEE / 978-1-4577-1102-2
By: Ramanan, D.; Park, D.;

Voltage and temperature dependence of random telegraph noise in highly scaled HKMG ETSOI nFETs and its impact on logic delay uncertainty

2012 / IEEE / 978-1-4673-0847-2
By: Leobandung, E.; Park, D.; Cheng, K.; Frank, D.J.; Yamaoka, M.; Miki, H.; Torii, K.;

Plasma Bullets Propagation Inside of Agarose Tissue Model

2013 / IEEE
By: Fridman, A.; Fridman, G.; Park, D.; Dobrynin, D.;

Automatic resonant frequency matching of power amplifier by transformer loop sampling

2015 / IEEE
By: Jang, H.; Lee, H.L.; Yu, J.W.; Lee, M.; Park, D.;

Analysis of Pattern Gain of Compact Directional 16-port Antenna

2015 / IEEE
By: Cho, D.-H.; Park, D.;

Sum Rate Maximization of an MIMO Two-Way Relay System Using MSE Duality

2015 / IEEE
By: Park, J.; Choi, W.; Heo, A.; Park, D.;

Pixel Design Optimization of Fringe-Field Switching Mode for Applying Negative Liquid Crystals in High-Resolution Mobile Displays

2015 / IEEE
By: Kim, B. K.; Kim, S.; Lee, J.-H.; Park, J.-S.; Park, D.; Jung, T.; Kim, H.-R.;

A novel approach for denoising and enhancement of extremely low-light video

2015 / IEEE
By: Park, D.; Kim, M.; Ko, H.; Han, D.K.;

Flexible Dielectric Barrier Discharge Reactor With Water and Teflon Dielectric Layers

2014 / IEEE
By: Park, H.; Park, D.; Choi, S.; Cho, I.J.;

An Optomechanical Transducer Platform for Evanescent Field Displacement Sensing

2014 / IEEE
By: Pruessner, M.W.; Rabinovich, W.S.; Kozak, D.A.; Stievater, T.H.; Park, D.;

On the Device Design and Drive-Current Capability of SOI Lateral Bipolar Transistors

2014 / IEEE
By: Cai, J.; Park, D.; Muralidhar, R.; Yoon, J.; Chan, K.K.; Yau, J.; D'Emic, C.P.; Ning, T.H.;

Improvements in Light-Load Efficiency and Operation Frequency for Low-Voltage Current-Mode Integrated Boost Converters

2014 / IEEE
By: Park, D.; Lee, H.;

CMOS-Compatible Self-Aligned In0.53Ga0.47As MOSFETs With Gate Lengths Down to 30 nm

2014 / IEEE
By: Majumdar, A.; Sun, Y.; Leobandung, E.; Park, D.; Sadana, D.K.; Duch, E.A.; Kobayashi, M.; Cheng, S.; Frank, M.M.; de Souza, J.P.; Cheng, C.; Kim, Y.; Rana, U.; Martin, R.M.; Bruce, R.L.; Shiu, K.; Zhu, Y.; Farmer, D.B.; Hopstaken, M.; Joseph, E.A.;

Joint Optimization of Source and Relay for MIMO Two-Way Relay Networks Using MSE Duality

2014 / IEEE
By: Choi, S.; Choi, W.; Park, D.; Heo, A.;

Built-In Binary Code Inversion Technique for On-Chip Flash Memory Sense Amplifier With Reduced Read Current Consumption

2014 / IEEE
By: Park, D.; Kim, T.G.;

Evanescent field absorption spectroscopy of trace gases using functionalized microring Resonators

2013 / IEEE
By: Stievater, T. H.; Khurgin, J. B.; Holmstrom, S. A.; McGill, R. A.; Rabinovich, W. S.; Park, D.; Pruessner, M. W.;

Authentication scheme using Walsh encoding of random patterns

1988 / IEEE
By: Ahmed, N.; Krukar, R.; Park, D.;

A performance comparison of trained multilayer perceptrons and trained classification trees

1990 / IEEE
By: El-Sharkawai, M.; Park, D.; Connor, J.; Lippman, A.; Marks, R.J., II; Cole, R.; Atlas, L.; Muthusamy, Y.;

A performance comparison of trained multilayer perceptrons and trained classification trees

1989 / IEEE
By: Marks, R., II; El-Sharkawi, M.; Park, D.; Connor, J.; Lippman, A.; Muthusamy, Y.; Atlas, L.; Cole, R.;

Statistical analysis of a change detector based on image modeling of difference picture

1990 / IEEE
By: Park, D.; Hush, D.R.;

Genetic-based new fuzzy reasoning models with application to fuzzy control

1994 / IEEE
By: Langholz, G.; Kandel, A.; Park, D.;

Load curve shaping using neural networks

1993 / IEEE / 0-7803-1217-1
By: Merchant, R.; Azeem, A.; Mohammed, O.; Park, D.; Dinh, T.; Drake, C.; Farah, J.; Tong, C.;

Forecasting abnormal load conditions with neural networks

1993 / IEEE / 0-7803-1217-1
By: Tong, C.; Dinh, T.; Merchant, R.; Mohammed, O.; Azeem, A.; Drake, C.; Park, D.; Farah, J.;

Approximate analysis of discrete-time tandem queueing networks with customer loss

1992 / IEEE / 0-7803-0608-2
By: Perros, H.G.; Park, D.;

Practical experiences with an adaptive neural network short-term load forecasting system

1995 / IEEE
By: Mohammed, O.; Drake, C.; Farah, J.; Azeem, A.; Tong, C.; Dinh, T.; Merchant, R.; Park, D.;

Field emission from GaAs pyramids fabricated using selected area vapor phase epitaxy

1995 / IEEE / 0-7803-2143-X
By: Shaw, J.L.; Park, D.; Gray, H.F.; Sillmon, R.S.;

Trojan: a high-performance simulator for shared memory architectures

1996 / IEEE / 0-8186-7432-6
By: Saavedra, R.H.; Park, D.;

Pd/Pt/Au and AuGe/Ni/Pt/Au ohmic contacts for AlSb/InAs HEMTs

1996 / IEEE / 0-7803-3283-0
By: Park, D.; Kruppa, W.; Boos, J.B.; Mittereder, J.; Molnar, B.; Bennett, B.R.; Goldenberg, M.; Bass, R.;

Single quantum dot spectroscopy

1996 / IEEE / 0-7803-3160-5
By: Kennedy, T.A.; Brown, S.W.; Shanabrook, B.V.; Snow, E.S.; Gammon, D.; Park, D.; Katzer, D.S.;

DC, small-signal, and noise characteristics of 0.1 /spl mu/m AlSb/InAs HEMTs

1997 / IEEE / 0-7803-3898-7
By: Kruppa, W.; Boos, J.B.; Bass, R.; Bennett, B.R.; Park, D.;

Atomically sharp features grown by silicon molecular beam epitaxy

1996 / IEEE / 0-7803-3594-5
By: Thompson, P.E.; Shaw, J.L.; Gray, H.F.; Twigg, M.E.; Hobart, K.D.; Park, D.; Kub, F.J.;

Impact of time dependent dielectric breakdown and stress induced leakage current on the reliability of (Ba,Sr)TiO/sub 3/ thin film capacitors for Gbit-scale DRAMs

1997 / IEEE / 0-7803-4100-7
By: Park, D.; Yamaichi, A.; Yamamichi, S.; Hu, C.;

Deep-trap SILC (stress induced leakage current) model for nominal and weak oxides

1998 / IEEE / 0-7803-4400-6
By: Hu, C.; Park, D.; Kamohara, S.;

AlSb/InAs HEMT's for low-voltage, high-speed applications

1998 / IEEE
By: Bass, R.; Kirchoefer, S.W.; Park, D.; Bennett, B.R.; Kruppa, W.; Boos, J.B.; Dietrich, H.B.;

Low-voltage, high-speed AlSb/InAs HEMTs

1998 / IEEE / 0-7803-4220-8
By: Boos, J.B.; Shanabrook, B.V.; Yang, M.J.; Bass, R.; Bennett, B.R.; Park, D.; Kruppa, W.;

Transport measurements on AlSb/InAs nanostructures

1998 / IEEE / 0-7803-4220-8
By: Magno, R.; Boos, J.B.; Kruppa, W.; Keye, D.; Bass, R.; Bennett, B.R.; Park, D.;

Stress-induced leakage current due to charging damage: gate oxide thickness and gate poly-Si etching condition dependence

1998 / IEEE / 0-9651577-2-5
By: Melaku, Y.; Kennard, M.; Park, D.; Hu, C.; King, T.-J.; Benjamin, N.;

Fundamental operation and design considerations for metal-oxide tunnel transistors

1998 / IEEE / 0-7803-4369-7
By: Campbell, P.M.; Snow, E.S.; Rendell, R.W.; Buot, F.A.; Magno, R.; Marrian, C.R.K.; Park, D.;

Operation experiences for PLS vacuum system

1997 / IEEE / 0-7803-4376-X
By: Park, D.; Ko, L.S.; Chung, S.M.; Kim, C.K.; Han, Y.J.;

Low-voltage, high-speed AlSb-InAsSb HEMTs

1999 / IEEE / 0-7803-5562-8
By: Yang, M.J.; Boos, J.B.; Bass, R.; Kruppa, W.; Park, D.; Bennett, B.R.;

Magneto-optical studies of excitons in single GaAs quantum dots

1999 / IEEE / 1-55752-576-X
By: Tabak, E.A.; Bonadeo, N.H.; Chen, G.; Steel, D.G.; Park, D.; Katzer, D.S.; Gammon, D.;

Single quantum dot states: Energy relaxation and coupling

1999 / IEEE / 1-55752-576-X
By: Gammon, D.; Chen, G.; Bonadeo, N.H.; Steel, D.G.; Katzer, D.S.; Park, D.;

Nano-optics: imaging the resonant nonlinear response of individual localized excitons

1999 / IEEE / 1-55752-576-X
By: Gammon, D.; Stievater, T.H.; Chen, G.; Lenihan, A.S.; Katzer, D.S.; Guest, J.R.; Steel, D.G.; Park, D.;

An optimization-based design procedure for asymmetric bidirectional associative memories

2001 / IEEE
By: Jooyoung Park; Park, D.; Cheol-Hee Kwon;

Nonlinear near-field spectroscopy and microscopy of single excitons in a disordered quantum well

2000 / IEEE / 1-55752-608-7
By: Gammon, D.; Steel, D.G.; Stievater, T.H.; Guest, J.R.; Park, D.; Katzer, D.S.;

Optically induced Zeeman coherence in a single quantum dot: entanglement of two electrons

2000 / IEEE / 1-55752-608-7
By: Gang Chen; Katzer, D.S.; Sham, L.J.; Park, D.; Bonadeo, N.H.; Gammon, D.; Steel, D.G.; Tabak, E.A.;

Strong-field nonlinear response of quantum dots

2000 / IEEE / 1-55752-608-7
By: Lenihan, A.S.; Stievater, T.H.; Park, D.; Katzer, D.S.; Gammon, D.; Steel, D.G.;

AlSb/InAs HEMTs with a TiW/Au gate metalization

2001 / IEEE / 0-7803-6700-6
By: Kruppa, W.; Bennett, B.R.; Boos, J.B.; Turner, N.H.; Mittereder, J.; Park, D.;

A novel shallow trench isolation technology using LPCVD MTO/SiN liner in SOI wafer

2001 / IEEE / 0-7803-6739-1
By: Park, D.; Lee, T.J.; Suh, K.P.; Choi, C.S.; Lee, S.C.; Kim, Y.W.; Jeon, C.H.; Kim, E.H.; Ahn, D.H.; Kim, B.S.; Roh, Y.H.;

Nondegenerate two-photon absorption from single quantum dot biexcitons

2001 / IEEE / 1-55752-663-X
By: Katzer, D.S.; Stievater, T.H.; Chen, G.; Park, D.; Tabak, E.A.; Gammon, D.; Steel, D.G.; Li, X.;

Optical absorption measurements from single semiconductor quantum dots

2001 / IEEE / 1-55752-663-X
By: Guest, J.R.; Stievater, T.H.; Xiaoqin Li; Park, D.; Katzer, D.S.; Gammon, D.; Steel, D.G.;

Coherent optical control and manipulation of semiconductor quantum dots

2001 / IEEE / 1-55752-663-X
By: Sham, L.J.; Park, D.; Katzer, D.S.; Gammon, D.; Bonadeo, N.; Dutt, G.; Steel, D.G.; Lenihan, A.; Stievater, T.; Tabak, E.; Gang Chen; Xiaoqin Li;

Recent advances in AlSb/InAs HEMTs for high-speed electronics

2001 / IEEE / 0-7803-7432-0
By: Mittereder, J.; Justh, E.; Bracker, A.S.; Hobart, K.D.; Yang, M.J.; Park, D.; Chang, W.; Ancona, M.G.; Bennett, B.R.; Boos, J.B.; Bass, R.; Kruppa, W.; Turner, N.H.;

Quantum coherence in a coupled exciton-quantum-dot system

2002 / IEEE / 1-55752-708-3
By: Steel, D.G.; Jun Cheng; Gang Chen; Batteh, E.T.; Sham, L.J.; Gammon, D.; Piermarocchi, C.; Pochung Chen; Park, D.; Katzer, D.S.;

Transient nonlinear spectroscopy of biexcitons in single quantum dots

2002 / IEEE / 1-55752-708-3
By: Steel, D.G.; Xiaoqin Li; Stievater, T.H.; Park, D.; Katzer, D.S.; Gammon, D.;

Effect of network topology on nanocluster film transport

2002 / IEEE / 0-7803-7538-6
By: Rendell, R.W.; Boos, J.B.; Park, D.; Snow, A.W.; Foos, E.E.; Kruppa, W.; Ancona, M.G.;

Charge-collection dynamics of InP-based high electron mobility transistors (HEMTs)

2002 / IEEE
By: Buchner, S.; Park, D.; Boos, J.B.; McMorrow, D.; Melinger, J.S.; Knudson, A.R.;

Planar Transmission Lines

1955 / IEEE
By: Park, D.;

Contributors (Apr. 1955 [T-MTT])

1955 / IEEE
By: King, D.D., Jr.; Matthews, E.W.; Cohn, S.B.; Richmond, J.H.; Beck, A.C.; Tice, T.E.; Stewart, C.; Park, D.;

Planar Transmission Lines--II

1955 / IEEE
By: Park, D.;

Contributors (Oct. 1955 [T-MTT])

1955 / IEEE
By: Hopfer, S.; Wheeler, H.A.; Teeter, W.L.; Dahlman, B.A.; Schwiebert, H.; Sandsmark, P.I.; Nalos, E.J.; Clavin, A.; Ginzton, E.L.; Park, D.; Cohn, S.B.;

Planar Transmission Lines--II (Correspondence and Rebuttal)

1956 / IEEE
By: Park, D.; Giger, A.J.;

Planar Transmission Lines--I (Addendum)

1957 / IEEE
By: Park, D.;

Reversal of a Loaded Ferromagnetic Core

1960 / IEEE
By: Cushman, N.; Park, D.;

Electron transport in nanocluster films with random voids

2003 / IEEE
By: Snow, A.W.; Foos, E.E.; Kruppa, W.; Ancona, M.G.; Rendell, R.W.; Boos, J.B.; Park, D.;

A miniaturized low-power wireless remote environmental monitoring system using microfabricated electrochemical sensing electrodes

2003 / IEEE / 0-7803-7731-1
By: Hong-Jeong Kim; Euisik Yoon; Jinbong Kim; Joonho Gil; Kwang-Seok Yun; Kyung-Hyun Kim; Juhyoun Kwak; Kwyro Lee; Hyungcheol Shin; Joon Young Kwak; Park, D.;

Ultra-low power and high speed SRAM for mobile applications using single Poly-Si gate 90 nm CMOS technology

2003 / IEEE / 4-89114-033-X
By: Park, D.; Hwang, B.J.; Koh, K.; Kinam Kim; Han, G.H.; Kim, H.S.; Jang, J.H.; Son, Y.S.; Kwak, K.H.;

PMOS body-tied FinFET (Omega MOSFET) characteristics

2003 / IEEE / 0-7803-7727-3
By: Lee, J.H.; Park, T.; Yoon, E.; Kim, K.; Choi, S.; Kim, B.H.; Han, J.J.; Yoon, B.M.; Choi, J.H.; Choe, J.D.; Cho, H.J.; Kim, S.M.; Yoon, E.J.; Chung, J.H.; Park, D.;

Random networks of single-wall carbon nanotubes: electronic and sensor applications

2003 / IEEE / 0-7803-7727-3
By: Park, D.; Novak, J.P.; Snow, E.S.;

Characteristics of Cu thin film on PET by ECR-PECVD

2003 / IEEE / 0-7803-7911-X
By: Koh, H.; Jhin, J.; Byun, D.; Park, D.; Lee, J.;

Modeling gate leakage in InAs/AlSb HEMTs

2003 / IEEE / 0-7803-7826-1
By: Papanicolaou, N.; Boos, J.B.; Ancona, M.G.; Park, D.; Bennett, B.R.; Chang, W.;

High speed, low power electronics using Sb-based semiconductors

2003 / IEEE / 0-7803-7820-2
By: Gutierrez, A.; Barsky, M.; Tsai, R.; Robinson, J.; Wang, S.; Mohney, S.E.; Dietrich, H.B.; Bass, R.; Hobart, K.D.; Chang, W.; Mittereder, J.; Shanabrook, B.V.; Park, D.; Kruppa, W.; Tinkham, B.P.; Anconca, M.G.; Papanicolaou, N.A.; Glaser, E.R.; Ikossi, K.; Bennett, B.R.; Boos, J.B.; Magno, R.;

Metamorphic AlSb/InAs HEMT for low-power, high-speed electronics

2003 / IEEE / 0-7803-7833-4
By: Lee, J.; Bennett, B.R.; Boos, J.B.; Barsky, M.; Tsai, R.; Gutierrez, A.; Papanicolaou, N.A.; Park, D.; Grundbacher, R.; Liu, P.H.; Namba, C.; Magno, R.;

Highly manufacturable 100 nm 6T low power SRAM with single poly-Si gate technology

2003 / IEEE / 0-7803-7765-6
By: Son, Y.S.; Kim, K.N.; Kwak, K.H.; Hwang, B.J.; Koh, K.; Lee, J.Y.; Park, D.; Kim, H.S.; Seo, S.H.; Jang, J.H.;

Thread-aware garbage collection for server applications

2004 / IEEE / 0-7695-2068-5
By: Park, D.; Park, K.; Han, J.; Kyungbaek Kim; Woo Jin Kim;

InAlAsSb/InGaSb double heterojunction bipolar transistor

2003 / IEEE / 0-7803-8139-4
By: Shanabrook, B.V.; Ikossi, K.; Papanicolaou, N.A.; Park, D.; Tinkham, B.P.; Ancona, M.G.; Mohney, S.E.; Glaser, E.R.; Bennett, B.R.; Campbell, P.M.; Boos, J.B.; Magno, R.;

6.2 /spl Aring/ In/sub 0.2/Al/sub 0.8/Sb/InAs/sub 0.7/Sb/sub 0.3/ HEMTs for low voltage high-frequency applications

2003 / IEEE / 0-7803-8139-4
By: Tinkham, B.P.; Papanicolaou, N.A.; Park, D.; Bass, R.; Bennett, B.R.; Boos, J.B.;

Raman coherence beats from the entangled exciton Zeeman doublet in a single quantum dot

2003 / IEEE / 1-55752-749-0
By: Yanwen Wu; Xiaoqin Li; Sham, L.J.; Park, D.; Katzer, D.S.; Gammon, D.; Steel, D.G.;

Qubit rotation with multiple phase-locked pulses in single quantum dots

2003 / IEEE / 1-55752-749-0
By: Sham, L.J.; Park, D.; Katzer, D.S.; Gammon, D.; Steel, D.G.; Xiaoqin Li; Yanwen Wu;

Lateral band-structure engineering in micromachined semiconductors

2004 / IEEE / 1-55752-777-6
By: Rabinovich, W.S.; Stievater, T.H.; Biermann, M.L.; Katzer, D.S.; Boos, J.B.; Goetz, P.G.; Park, D.;

High performance and low power transistors integrated in 65nm bulk CMOS technology

2004 / IEEE / 0-7803-8684-1
By: Luo, Z.; Steegen, A.; Wann, C.; Yang, I.; Sudijono, J.; Schiml, T.; Ku, J.; Rengarajan, R.; Weybright, M.; Zhu, H.; Lee, K.; Lin, Y.; Marokkey, S.; Zhang, B.; Kaltalioglu, E.; Kim, S.; Cowley, A.; Kim, K.; Chan, V.; Hook, T.; Vayshenker, A.; Coppock, C.; Vietzke, D.; Lian, J.; Eller, M.; Mann, R.; Baiocco, C.; Nguyen, P.; Kim, L.; Hoinkis, M.; Ku, V.; Klee, V.; Jamin, F.; Wrschka, P.; Shafer, P.; Lin, W.; Fang, S.; Ajmera, A.; Tan, W.; Park, D.; Mo, R.;

Microfluidic MEMS-based light modulator using magnetic fluid suitable for flat panel display applications

2005 / IEEE
By: Hyosook Lee; Park, D.; Hoyeon Kim; Jong-Wook Seo;

Differentiate and deliver: leveraging your partners (CEO panel)

2005 / IEEE / 1-59593-058-2
By: Vleeschhouwer, J.; Cassidy, R.; Rhines, W.C.; Fister, M.J.; Hu, J.; De Geus, A.; East, W.; Park, D.; Goldman, R.;

Copper thin films on PET prepared at ambient temperature by ECR-CVD

2005 / IEEE
By: Jhin, J.; Hyungduk Ko; Park, D.; Joongkee Lee; Dongjin Byun;

Piezoelectricity in (100) III-V semiconductors

2005 / IEEE / 1-55752-795-4
By: Stievater, T.H.; Calhoun, L.C.; Kanakaraju, S.; Biermann, M.L.; Boos, J.B.; Park, D.; Rabinovich, W.S.;

A simulation model for facilitators of Tony Rizzo's bead game

2005 / IEEE / 0-7803-9519-0
By: Tsimhoni, O.; Park, D.; Roggenkamp, D.B.;

A hybrid SoC interconnect with dynamic TDMA-based transaction-less buses and on-chip networks

2006 / IEEE / 0-7695-2502-4
By: Park, D.; Nicopoulos, C.; Richardson, T.D.; Degalahal, V.; Das, C.; Yuan Xie; Narayanan, V.;

Improved Electrical Characteristics and Retention Time of DRAMs Using HSG-merged-AHO Cylinder Capacitor

2005 / IEEE / 1-4244-0083-X
By: Kim, S.J.; Jeon, S.G.; Park, D.; Hyun, C.S.; Kim, S.G.; Park, D.G.; Oh, K.S.; Lee, K.Y.; Cho, T.H.; Hong, H.S.; Hwang, K.H.; Jeon, Y.S.; Lim, B.K.; Suk, J.G.; Lee, S.H.; Kang, H.J.;

MEMS Based Integrated Particle Detection Chip for Real Time Environmental Monitoring

2006 / IEEE / 0-7803-9475-5
By: Hwang, J.; Maeng, J.Y.; Park, D.; Lim, H.H.; Kim, Y.J.;

QoS Support by Using CDF-Based Wireless Packet Scheduling in Fading Channels

2006 / IEEE
By: Lee, B.G.; Park, D.;

Exploring Fault-Tolerant Network-on-Chip Architectures

2006 / IEEE / 0-7695-2607-1
By: Kim, J.; Nicopoulos, C.; Park, D.; Das, C.R.; Vijaykrishnan, N.;

Locators of mobile sinks for wireless sensor networks

2006 / IEEE / 0-7695-2637-3
By: Park, D.; Shim, G.;

ViChaR: A Dynamic Virtual Channel Regulator for Network-on-Chip Routers

2006 / IEEE / 0-7695-2732-9
By: Kim, J.; Park, D.; Nicopoulos, C.A.; Das, C.R.; Yousif, M.S.; Vijaykrishnan, N.;

High-Current Photodetectors as Efficient and High-Power RF Output Stages

2006 / IEEE / 1-4244-0203-4
By: Williams, K.J.; Rabinovich, W.S.; Goetz, P.G.; Park, D.; Boos, J.B.; Tulchinsky, D.A.;

Low-Frequency Noise in AlSb/InAs and Related HEMTs

2007 / IEEE
By: Bennett, B.R.; Boos, J.B.; Kruppa, W.; Bass, R.; Park, D.; Papanicolaou, N.A.;

Sea-trial and Experimental Results of the Deep-sea Unmanned Underwater Vehicles, HEMIRE and HENUVY

2007 / IEEE / 1-4244-1207-2
By: Lim, Y.; Kim, D.; Baek, H.; Ryu, S.; Hong, S.; Lee, C.; Li, J.; Choi, H.; Kim, K.; Jun, B.; Lee, P.; Seo, Y.; Choi, M.; Park, C.; Yoon, S.; Jung, H.; Lee, J.; Gu, B.; Park, D.; Cho, S.;

A Wide Dynamic-Range CMOS Image Sensor Using Self-Reset Technique

2007 / IEEE
By: Joo Youngjoong; Rhee, J.; Park, D.;

Measurement of Ionization Loss in the Relativistic Rise Region with the Time Projection Chamber

1983 / IEEE
By: Gabioud, Bernard; Aihara, H.; Alston-Garnjost, M.; Badtke, D. H.; Bakken, J. A.; Barbaro-Galtieri, A.; Barnes, A. V.; Barnett, B. A.; Blumenfeld, B.; Bross, A.; Buchanan, C. D.; Carithers, W. C.; Chamberlain, O.; Chiba, J.; Chien, C-Y.; Clark, A. R.; Dahl, O. I.; Day, C. T.; Delpierre, P.; Derby, K. A.; Eberhard, P. H.; Fancher, D. L.; Fujii, H.; Fujii, T.; Gabioud, B.; Gary, J. W.; Gorn, W.; Hadley, N. J.; Hauptman, J. M.; Heck, B.; Hilke, H.; Huth, J. E.; Hylen, J.; Iwasaki, H.; Kamae, T.; Kenney, R. W.; Kerth, L. T.; Koda, R.; Kofler, R. R.; Kwong, K. K.; Layter, J. G.; Lindsey, C. S.; Loken, S. C.; Lu, X-Q.; Lynch, G. R.; Madansky, L.; Madaras, R. J.; Majka, R.; Mallet, J.; Martin, P. S.; Maruyama, K.; Marx, J. N.; Matthews, J. A. J.; Melnikoff, S. O.; Moses, W.; Nemethy, P.; Nygren, D. R.; Oddone, P. J.; Park, D.; Pevsner, A.; Pripstein, M.; Robrish, P. R.; Ronan, M. T.; Ross, R. R.; Rouse, F. R.; Shapiro, G.; Shapiro, M. D.; Shen, B. C.; Slater, W. E.; Stevenson, M. L.; Stork, D. H.; Ticho, H. K.; Toge, N.; Urban, M.; Van Dalen, G. J.; van Tyen, R.; Videau, H.; Wayne, M.; Wenzel, W. A.; vanDaalen Wetters, R. F.; Yamauchi, M.; Zeller, M. E.; Zhang, W-M.;

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