Your Search Results
Use materials by this author in your textbook!
AcademicPub holds over eight million pieces of educational content such as case studies and journal articles for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Author: Ozcan, A.
Results
2011 / IEEE / 978-1-4577-1589-1
By: Spees, W.M.; Peng Sun; Qing Wang; Yong Wang; Quirk, J.D.; Ozcan, A.; Sheng-Kwei Song;
By: Spees, W.M.; Peng Sun; Qing Wang; Yong Wang; Quirk, J.D.; Ozcan, A.; Sheng-Kwei Song;
2011 / IEEE / 978-1-4577-1589-1
By: Yaglidere, O.; Ting-Wei Su; Mudanyali, O.; Sikora, U.; Bishara, W.; Ozcan, A.; Luckhart, S.;
By: Yaglidere, O.; Ting-Wei Su; Mudanyali, O.; Sikora, U.; Bishara, W.; Ozcan, A.; Luckhart, S.;
2011 / IEEE / 978-1-4577-1589-1
By: Ozcan, A.; Hedayati, Y.; Sonmez, A.E.; Tsekos, N.V.; Spees, W.M.;
By: Ozcan, A.; Hedayati, Y.; Sonmez, A.E.; Tsekos, N.V.; Spees, W.M.;
2011 / IEEE / 978-1-61284-634-7
By: Tseng, D.; Mudanyali, O.; Ozcan, A.; Yaglidere, O.; Bishara, W.; Sencan, I.; Oztoprak, C.; Isikman, S.O.;
By: Tseng, D.; Mudanyali, O.; Ozcan, A.; Yaglidere, O.; Bishara, W.; Sencan, I.; Oztoprak, C.; Isikman, S.O.;
2007 / IEEE / 978-4-900784-03-1
By: Chan, K.; Lavoie, C.; Dyer, T.; Byeong Kim; Chakravarti, A.; Ozcan, A.; Madan, A.; Jinghong Li; Gluschenkov, O.; Yaocheng Liu; Ken Rim; Henson, W.; Loesing, R.; Zhijiong Luo; Rovedo, N.; Pinto, T.; Popova, I.;
By: Chan, K.; Lavoie, C.; Dyer, T.; Byeong Kim; Chakravarti, A.; Ozcan, A.; Madan, A.; Jinghong Li; Gluschenkov, O.; Yaocheng Liu; Ken Rim; Henson, W.; Loesing, R.; Zhijiong Luo; Rovedo, N.; Pinto, T.; Popova, I.;
2007 / IEEE / 978-1-55752-834-6
By: Cubukcu, E.; Ozcan, A.; Tearney, G.J.; Capasso, F.; Bouma, B.E.; Crozier, K.; Bilenca, A.;
By: Cubukcu, E.; Ozcan, A.; Tearney, G.J.; Capasso, F.; Bouma, B.E.; Crozier, K.; Bilenca, A.;
2007 / IEEE / 978-1-55752-834-6
By: Joo, C.; Bilenca, A.; Tearney, G.; Bouma, B.; de Boer, J.F.; Ozcan, A.;
By: Joo, C.; Bilenca, A.; Tearney, G.; Bouma, B.; de Boer, J.F.; Ozcan, A.;
2006 / IEEE / 978-1-55752-813-1
By: Maluf, N.I.; Inan, O.T.; Ozcan, A.; Kino, G.S.; Digonnet, M.; Kovacs, G.;
By: Maluf, N.I.; Inan, O.T.; Ozcan, A.; Kino, G.S.; Digonnet, M.; Kovacs, G.;
2010 / IEEE / 978-1-4244-5240-8
By: Bishara, W.; Isikman, S.O.; Ting-Wei Su; Ozcan, A.; Erlinger, A.; Tseng, D.;
By: Bishara, W.; Isikman, S.O.; Ting-Wei Su; Ozcan, A.; Erlinger, A.; Tseng, D.;
2010 / IEEE
By: Solomon, P.M.; Haensch, W.; Park, D.-G.; Ouyang, Q.; Silverman, J.; Ozcan, A.; Lee, K.-L.; Zuo, G.; Chhabra, V.; Song, W.; Newbury, J.; Pyzyna, A.; Ott, J.; Bruley, J.; Bucchignano, J.; Klaus, D.; Guillorn, M.; Murray, C.; Maurer, S.; Hopstaken, M.; Zhu, Y.; Lavoie, C.; Yang, B.; D'Emic, C.; Pagette, F.; Zhen Zhang;
By: Solomon, P.M.; Haensch, W.; Park, D.-G.; Ouyang, Q.; Silverman, J.; Ozcan, A.; Lee, K.-L.; Zuo, G.; Chhabra, V.; Song, W.; Newbury, J.; Pyzyna, A.; Ott, J.; Bruley, J.; Bucchignano, J.; Klaus, D.; Guillorn, M.; Murray, C.; Maurer, S.; Hopstaken, M.; Zhu, Y.; Lavoie, C.; Yang, B.; D'Emic, C.; Pagette, F.; Zhen Zhang;
2010 / IEEE / 978-1-4244-5869-1
By: Gluschenkov, O.; Eunha Kim; Wall, D.; Ozcan, A.; Deshpande, S.V.;
By: Gluschenkov, O.; Eunha Kim; Wall, D.; Ozcan, A.; Deshpande, S.V.;
2010 / IEEE / 978-1-55752-890-2
By: Isikman, S.O.; Ozcan, A.; Oztoprak, C.; Bishara, W.; Mudanyali, O.; Sencan, I.;
By: Isikman, S.O.; Ozcan, A.; Oztoprak, C.; Bishara, W.; Mudanyali, O.; Sencan, I.;
2012 / IEEE
By: Sencan, I.; Mudanyali, O.; Bishara, W.; Isikman, S.O.; Ting-Wei Su; Ozcan, A.; Sikora, U.; Yaglidere, O.; Tseng, D.K.;
By: Sencan, I.; Mudanyali, O.; Bishara, W.; Isikman, S.O.; Ting-Wei Su; Ozcan, A.; Sikora, U.; Yaglidere, O.; Tseng, D.K.;