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Author: Moghaddam, M.
Results
Vector Green'S function for S-parameter measurements of the electromagnetic volume integral equation
2011 / IEEE / 978-1-4244-9563-4By: Haynes, M.; Moghaddam, M.;
2011 / IEEE / 978-1-4244-6051-9
By: Stang, J.; Clarkson, S.; van Nieuwstadt, L.; Haynes, M.; Moghaddam, M.; Ward, C.;
By: Stang, J.; Clarkson, S.; van Nieuwstadt, L.; Haynes, M.; Moghaddam, M.; Ward, C.;
2014 / IEEE
By: Spencer, M.W.; Moghaddam, M.; van Zyl, J.J.; Kim, S.; Johnson, J.T.; Ouellette, J.D.; Entekhabi, D.; Tsang, L.;
By: Spencer, M.W.; Moghaddam, M.; van Zyl, J.J.; Kim, S.; Johnson, J.T.; Ouellette, J.D.; Entekhabi, D.; Tsang, L.;
1991 / IEEE
By: Chuang, S.-L.; Nasir, M.A.; Moghaddam, M.; Chew, W.C.; Lee, S.M.; Balestra, C.L.; Herrick, R.W.;
By: Chuang, S.-L.; Nasir, M.A.; Moghaddam, M.; Chew, W.C.; Lee, S.M.; Balestra, C.L.; Herrick, R.W.;
1993 / IEEE / 0-8186-4120-7
By: Otto, G.P.; Chew, W.C.; Moghaddam, M.; Wang, Y.M.; Lu, C.C.; Lin, J.H.; Weedon, W.H.;
By: Otto, G.P.; Chew, W.C.; Moghaddam, M.; Wang, Y.M.; Lu, C.C.; Lin, J.H.; Weedon, W.H.;
2002 / IEEE / 0-7803-7536-X
By: Wang, S.; Fernandes, R.; Zhang, Q.; Pavlic, G.; Cihlar, J.; Kerr, J.; McDonald, K.; Moghaddam, M.; Chen, W.; Price, D.T.; Ung, C.H.;
By: Wang, S.; Fernandes, R.; Zhang, Q.; Pavlic, G.; Cihlar, J.; Kerr, J.; McDonald, K.; Moghaddam, M.; Chen, W.; Price, D.T.; Ung, C.H.;
2003 / IEEE / 0-7803-7929-2
By: Moller, D.; Rahmat-Samii, Y.; Rodriguez, E.; Moghaddam, M.; Saatchi, S.; Huang, J.; Hoffman, J.;
By: Moller, D.; Rahmat-Samii, Y.; Rodriguez, E.; Moghaddam, M.; Saatchi, S.; Huang, J.; Hoffman, J.;
2005 / IEEE / 0-7803-9050-4
By: Lucas, R.M.; Williams, M.; Tickle, P.; Witte, C.; Cronin, N.; Moghaddam, M.; Lee, A.C.; Milne, K.; Antony;
By: Lucas, R.M.; Williams, M.; Tickle, P.; Witte, C.; Cronin, N.; Moghaddam, M.; Lee, A.C.; Milne, K.; Antony;
2007 / IEEE / 1-4244-0524-6
By: Cable, V.; Huang, J.; Haynes, M.; Vitaz, J.; Van Nieuwstadt, L.; Partridge, P.; Rahmat-Samii, Y.; Moghaddam, M.;
By: Cable, V.; Huang, J.; Haynes, M.; Vitaz, J.; Van Nieuwstadt, L.; Partridge, P.; Rahmat-Samii, Y.; Moghaddam, M.;
Electromagnetic Scattering from Multilayer Rough Surfaces Separated by Arbitrary Dielectric Profiles
2006 / IEEE / 0-7803-9510-7By: Chih-hao Kuo; Moghaddam, M.;
2007 / IEEE / 978-1-4244-1211-2
By: Whitcomb, J.; Kellndorfer, J.; Podest, E.; McDonald, K.; Moghaddam, M.;
By: Whitcomb, J.; Kellndorfer, J.; Podest, E.; McDonald, K.; Moghaddam, M.;
2008 / IEEE / 978-1-4244-2041-4
By: Haynes, M.; Rahmat-Samii, Y.; Moghaddam, M.; Partridge, P.; van Nieuwstadt, L.; Cable, V.; Huang, J.; Vitaz, J.;
By: Haynes, M.; Rahmat-Samii, Y.; Moghaddam, M.; Partridge, P.; van Nieuwstadt, L.; Cable, V.; Huang, J.; Vitaz, J.;
2008 / IEEE / 978-1-4244-2668-3
By: Arbabtafti, M.; Rahimi, A.; Mahvash, M.; Nahvi, A.; Moghaddam, M.;
By: Arbabtafti, M.; Rahimi, A.; Mahvash, M.; Nahvi, A.; Moghaddam, M.;
2011 / IEEE
By: Nahvi, A.; Moghaddam, M.; Arbabtafti, M.; Shirinzadeh, B.; Richardson, B.; Mahvash, M.;
By: Nahvi, A.; Moghaddam, M.; Arbabtafti, M.; Shirinzadeh, B.; Richardson, B.; Mahvash, M.;
2010 / IEEE
By: Entekhabi, D.; Van Zyl, J.; O'Neill, P.E.; Kellogg, K.H.; Crow, W.T.; Edelstein, W.N.; Entin, J.K.; Goodman, S.D.; Jackson, T.J.; Johnson, J.; Kimball, J.; Piepmeier, J.R.; Koster, R.D.; Martin, N.; McDonald, K.C.; Moghaddam, M.; Moran, S.; Reichle, R.; Shi, J.C.; Spencer, M.W.; Thurman, S.W.; Leung Tsang; Njoku, E.G.;
By: Entekhabi, D.; Van Zyl, J.; O'Neill, P.E.; Kellogg, K.H.; Crow, W.T.; Edelstein, W.N.; Entin, J.K.; Goodman, S.D.; Jackson, T.J.; Johnson, J.; Kimball, J.; Piepmeier, J.R.; Koster, R.D.; Martin, N.; McDonald, K.C.; Moghaddam, M.; Moran, S.; Reichle, R.; Shi, J.C.; Spencer, M.W.; Thurman, S.W.; Leung Tsang; Njoku, E.G.;
2010 / IEEE
By: Shuman, D.I.; Entekhabi, D.; Moghaddam, M.; Teneketzis, D.; Mingyan Liu; Ke Li; Goykhman, Y.; Mahajan, A.; Nayyar, A.;
By: Shuman, D.I.; Entekhabi, D.; Moghaddam, M.; Teneketzis, D.; Mingyan Liu; Ke Li; Goykhman, Y.; Mahajan, A.; Nayyar, A.;
2010 / IEEE / 978-1-4244-5155-5
By: Goykhman, Y.; Xueyang Duan; Albahkali, M.; Moghaddam, M.; Tabatabaeenejad, A.;
By: Goykhman, Y.; Xueyang Duan; Albahkali, M.; Moghaddam, M.; Tabatabaeenejad, A.;
2010 / IEEE
By: Entekhabi, D.; Moghaddam, M.; Teneketzis, D.; Shuman, D.; Nayyar, A.; Mahajan, A.; Mingyan Liu; Ke Li; Goykhman, Y.;
By: Entekhabi, D.; Moghaddam, M.; Teneketzis, D.; Shuman, D.; Nayyar, A.; Mahajan, A.; Mingyan Liu; Ke Li; Goykhman, Y.;