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Author: Matthies, L.
Results
2011 / IEEE / 978-1-61284-385-8
By: Matthies, L.; Brockers, R.; Tweddle, B.; Hudson, N.; Williams, B.;
By: Matthies, L.; Brockers, R.; Tweddle, B.; Hudson, N.; Williams, B.;
2012 / IEEE / 978-1-4673-1405-3
By: Hebert, P.; Backes, P.; Matthies, L.; Kuo, C.; Bajracharya, M.; Myint, S.; Fuchs, T.; Jain, A.; Ma, J.; Howard, T.; Hudson, N.; Burdick, J.;
By: Hebert, P.; Backes, P.; Matthies, L.; Kuo, C.; Bajracharya, M.; Myint, S.; Fuchs, T.; Jain, A.; Ma, J.; Howard, T.; Hudson, N.; Burdick, J.;
2012 / IEEE / 978-1-4673-1405-3
By: Ma, J.; Wooden, D.; Malchano, M.; Matthies, L.; Bajracharya, M.; Susca, S.;
By: Ma, J.; Wooden, D.; Malchano, M.; Matthies, L.; Bajracharya, M.; Susca, S.;
1992 / IEEE / 0-8186-2720-4
By: Stone, H.; Mishkin, A.; Litwin, T.; Nguyen, T.; Wilcox, B.; Gennery, D.; Matthies, L.; Cooper, B.;
By: Stone, H.; Mishkin, A.; Litwin, T.; Nguyen, T.; Wilcox, B.; Gennery, D.; Matthies, L.; Cooper, B.;
Stochastic performance, modeling and evaluation of obstacle detectability with imaging range sensors
1994 / IEEEBy: Grandjean, P.; Matthies, L.;
1995 / IEEE / 0-8186-7108-4
By: Harrison, R.; Gat, E.; Matthies, L.; Litwin, T.; Volpe, R.; Wilcox, B.;
By: Harrison, R.; Gat, E.; Matthies, L.; Litwin, T.; Volpe, R.; Wilcox, B.;
1998 / IEEE / 0-7803-4423-5
By: Legowik, S.; Tsai hong; Gilsinn, J.; Coombs, D.; Murphy, K.; Nashman, M.; Owens, K.; Litwin, T.; Matthies, L.; Rankin, A.; Yoshimi, B.;
By: Legowik, S.; Tsai hong; Gilsinn, J.; Coombs, D.; Murphy, K.; Nashman, M.; Owens, K.; Litwin, T.; Matthies, L.; Rankin, A.; Yoshimi, B.;
1998 / IEEE / 0-7803-4465-0
By: Thayer, S.; Teza, J.; Rollins, E.; Osborn, J.; Matthies, L.; Maimone, M.;
By: Thayer, S.; Teza, J.; Rollins, E.; Osborn, J.; Matthies, L.; Maimone, M.;
1999 / IEEE
By: Weisbin, C.R.; Rodriguez, G.; Matthies, L.; Shoemaker, C.; Krotkov, E.; Lavery, D.; Blitch, J.;
By: Weisbin, C.R.; Rodriguez, G.; Matthies, L.; Shoemaker, C.; Krotkov, E.; Lavery, D.; Blitch, J.;
2002 / IEEE / 0-7803-7272-7
By: Rankin, A.L.; Hogg, R.W.; Matthies, L.; Bergh, C.F.; Helmick, D.M.; McHenry, M.C.; Roumeliotis, S.I.;
By: Rankin, A.L.; Hogg, R.W.; Matthies, L.; Bergh, C.F.; Helmick, D.M.; McHenry, M.C.; Roumeliotis, S.I.;
2002 / IEEE / 0-7803-7398-7
By: Hogg, R.; Castano, A.; Matthies, L.; Owens, K.; Castano, R.; Manduchi, R.; Talukder, A.;
By: Hogg, R.; Castano, A.; Matthies, L.; Owens, K.; Castano, R.; Manduchi, R.; Talukder, A.;
2004 / IEEE
By: Martin, M.S.; Matthies, L.; Leger, C.; Johnson, A.; Goguen, J.; Cheng, Y.; Willson, R.;
By: Martin, M.S.; Matthies, L.; Leger, C.; Johnson, A.; Goguen, J.; Cheng, Y.; Willson, R.;
2008 / IEEE / 978-1-4244-1646-2
By: Matthies, L.; Turmon, M.; Howard, A.; Benyang Tang; Bajracharya, M.;
By: Matthies, L.; Turmon, M.; Howard, A.; Benyang Tang; Bajracharya, M.;
2009 / IEEE
By: Trawny, N.; Mourikis, A.I.; Matthies, L.; Ansar, A.; Johnson, A.E.; Roumeliotis, S.I.;
By: Trawny, N.; Mourikis, A.I.; Matthies, L.; Ansar, A.; Johnson, A.E.; Roumeliotis, S.I.;
2011 / IEEE / 978-1-4244-7351-9
By: Matthies, L.; Villalpando, C.; Metz, B.; Morfopolous, A.; Serrano, N.;
By: Matthies, L.; Villalpando, C.; Metz, B.; Morfopolous, A.; Serrano, N.;