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Author: Marshall, C.

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Multi-symbol detection of M-DPSK
1989 / IEEE
By: Marshall, C.; Freebersyser, J.; Wilson, S.G.;
Preparation and properties of high deposition rate a-Si:H films and solar cells using disilane
1988 / IEEE
By: Marshall, C.; Bhat, P.K.; Madan, A.; Schropp, R.E.I.; Chatham, H.; Sandwisch, J.;
Mixing optical beams for solar simulation-a new approach (to solar cell testing)
1990 / IEEE
By: Emery, K.; Marshall, C.; Sopori, B.L.;
Design of a fiber optic based solar simulator (for solar cell testing)
1991 / IEEE / 0-87942-636-5
By: Sopori, B.L.; Marshall, C.;
A scanning defect-mapping system for large-area silicon substrates
1993 / IEEE / 0-7803-1220-1
By: Murphy, R.; Sopori, B.L.; Marshall, C.;
Optical processing: a novel technology for fabricating solar cell contacts
1993 / IEEE / 0-7803-1220-1
By: Asher, S.; Reedy, R.; Jones, R.M.; Rose, D.; Marshall, C.; Sopori, B.L.;
A workflow analysis and design environment (WADE)
1995 / IEEE / 0-78033018-8
By: Mayer, R.J.; Marshall, C.; Benjamin, P.C.;
A 2.7 V GSM transceiver ICs with on-chip filtering
1995 / IEEE / 0-7803-2495-1
By: Heimeri, E.; Gaethke, R.; Fuchs, T.; Fotowai, A.; Birth, W.; Sheng Lee; Marshall, C.; Saur, E.; Behbahani, F.; Navid, S.; Moore, P.;
In-flight analysis of enabling technology
1997 / IEEE / 0-7803-3741-7
By: Seidleck, C.M.; LaBel, K.A.; Moran, A.K.; Marshall, C.; Marshall, P.; Barth, J.M.;
Infrared sensor technology
1995 / IEEE / 0-7803-2475-7
By: White, T.; Parker, T.; Marshall, C.;
Single event effect test results for candidate spacecraft electronics
1997 / IEEE / 0-7803-4061-2
By: Carts, M.; Marshall, P.; Barth, J.M.; Stassinopoulos, E.G.; Seidleck, C.M.; Marshall, C.; LaBel, K.A.; Carkhuff, B.; Moran, A.K.; Kinnison, J.;
Uncooled infrared sensor with digital focal plane array for medical applications
1996 / IEEE / 0-7803-3811-1
By: White, T.; Butler, N.; Marshall, C.;
A framework for adaptive process modeling and execution (FAME)
1998 / IEEE / 0-8186-8751-7
By: Mayer, R.; Erraguntla, M.; Benjamin, P.; Marshall, C.; Painter, M.;
Single event effect and radiation damage results for candidate spacecraft electronics
1998 / IEEE / 0-7803-5109-6
By: O'Bryan, M.V.; Carts, M.; Marshall, C.; Marshall, P.; LaBel, K.A.; Seidleck, C.M.; Barth, J.L.; Reed, R.A.;
The role of In/sub 2/Se/sub 3/ precursor properties in multi-stage Cu(In,Ga)Se/sub 2/ fabrication [solar cells]
2000 / IEEE / 0-7803-5772-8
By: Eisgruber, I.L.; Engel, J.R.; Marshall, C.; Treece, R.E.;
Supply Chain Process Design Toolkit (SCPDT)
2001 / IEEE / 0-7803-7307-3
By: Mayer, R.; Graul, M.; Benjamin, P.; Marshall, C.; Painter, M.;
Modeling of single-event effects in circuit-hardened high-speed SiGe HBT logic
2001 / IEEE
By: Cressler, J.D.; Krithivasan, R.; Niu, G.; Harame, D.L.; Reed, R.; Marshall, C.; Marshall, P.;
Design and development of a user interface to remotely control a radio telescope using virtual instruments
2002 / IEEE / 0-7803-7252-2
By: Robinson, S.; Marshall, C.; Hinkson, D.;
Temperature Coefficients of Resistance: A New Approach
1979 / IEEE
By: Marshall, C.;
A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS
2004 / IEEE
By: Riggs, P.; Fritz, K.; Buchner, S.; McMorrow, D.; Currie, S.; Marshall, C.; Reed, R.; Ladbury, R.; Campbell, A.; Carts, M.; Marshall, P.; Gilbert, B.; Seidleck, C.; Randall, B.;
Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)
2005 / IEEE
By: Ladbury, R.; Marshall, C.; Krithivasan, R.; Berg, M.; Kennedy, K.; Siedleck, C.; Fritz, K.; Randall, B.; Reed, R.; Currie, S.; Carts, M.; Marshall, P.; Gilbert, B.; LaBel, K.; Guofu Niu; Cressler, J.;
Large format HgCdTe arrays for the James Webb Space Telescope
2006 / IEEE / 1-4244-0090-2
By: Mott, B.; Boker, T.; Cabelli, C.; De Marchi, G.; Ferruit, P.; Garnett, J.; Hill, R.J.; Loose, M.; Rauscher, B.J.; Regan, M.W.; Waczynski, A.; Yiting Wen; Wong, S.; Zandian, M.; Alexander, D.; Brambora, C.K.; Derro, R.; Dunn, C.; Ellis, T.; Garrison, M.B.; Howe, B.; Jakobsen, P.; Johnson, T.E.; Jurado, M.; Lee, G.; Manthripragada, S.S.; Marsh, J.M.; Marshall, C.; Martineau, R.J.; Nieznanski, J.; Roher, W.D.; Shakoorzadeh, K.B.; Smith, M.T.; Strada, P.; Wallis, P.; Wei Xia-Serafino; York, J.R.;
Coupling of High Power Lasers to Small, Hot Targets at the National Ignition Facility
2005 / IEEE / 0-7803-9300-7
By: Schneider, M.B.; Hinkel, D.E.; Bower, D.E.; Bruns, H.C.; Campbell, K.M.; Celeste, J.R.; Compton, S.; Costa, R.L.; Dewald, E.L.; Dixit, S.N.; Eckart, M.J.; Eder, D.C.; Edwards, M.J.; Ellis, A.D.; Emig, J.A.; Froula, D.H.; Glenzer, S.H.; Hargrove, D.; Haynam, C.A.; Heeter, R.F.; Henesian, M.A.; Holder, J.P.; Holtmeier, G.; James, D.L.; Jancaitis, K.S.; Kalantar, D.H.; Kamperschroer, J.H.; Kauffman, R.L.; Kimbrough, J.; Kirkwood, R.; Koniges, A.E.; Landen, O.L.; Landon, M.; Langdon, A.B.; Lee, F.D.; MacGowan, B.J.; Mackinnon, A.J.; Manes, K.R.; Marshall, C.; May, M.J.; McDonald, J.W.; Menapace, J.; Moses, E.I.; Munro, D.H.; Murray, J.R.; Niemann, C.; Pellinen, D.; Power, G.D.; Rekow, V.; Ruppe, J.A.; Schein, J.; Shepherd, R.; Singh, M.S.; Springer, P.T.; Still, C.H.; Suter, L.J.; Tietbohl, G.L.; Turner, R.E.; Van Wonterghem, B.M.; Wallace, R.J.; Warrick, A.; Weber, F.; Wegner, P.J.; Williams, E.A.; Young, B.K.; Young, P.E.; Baldis, H.A.;
Investigation of liquid xenon detectors for PET: Simultaneous reconstruction of light and charge signals from 511 keV photons
2007 / IEEE / 978-1-4244-0922-8
By: Retiere, F.; Muennich, A.; Martin, J.P.; Marshall, C.; Sher, A.; Kurchaninov, L.; Bryman, D.; Amaudruz, P.; Lu, P.;
Design and performance of Liquid Xenon detectors for PET
2008 / IEEE / 978-1-4244-2714-7
By: Sossi, V.; Sher, A.; Retiere, F.; Muennich, A.; Martin, J. P.; Marshall, C.; Lu, P.; Kurchaninov, L.; Bryman, D.; Amaudruz, P.;
Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
2009 / IEEE / 978-1-4244-5092-3
By: Xapsos, M.A.; Sanders, A.B.; Marshall, C.; Ladbury, R.L.; O'Bryan, M.V.; Campola, M.J.; Cochran, D.J.; Oldham, T.R.; LaBel, K.A.; Kim, H.S.; Dakai Chen; Buchner, S.P.;
Single Event Transient Hardness of a New Complementary (npn $+$ pnp) SiGe HBT Technology on Thick-Film SOI
2010 / IEEE
By: Peng Cheng; Thrivikraman, T.; Wilcox, E.P.; Benyong Zhang; Cestra, G.; Eddy, R.; Kruckmeyer, K.; Babcock, J.A.; Phillips, S.D.; Marshall, C.; Marshall, P.W.; Vizkelethy, G.; Cressler, J.D.; Madan, A.;

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