Your Search Results
Use materials by this author in your textbook!
AcademicPub holds over eight million pieces of educational content such as case studies and journal articles for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Author: Linholm, L.W.
Results
1990 / IEEE
By: Buzzeo, J.; Ramanathan, G.; Linholm, L.W.; Cresswell, M.W.; Khera, D.; Nagarajan, A.;
By: Buzzeo, J.; Ramanathan, G.; Linholm, L.W.; Cresswell, M.W.; Khera, D.; Nagarajan, A.;
1990 / IEEE / 0-87942-588-1
By: Allen, R.A.; Linholm, L.W.; Khera, D.; Pina, C.; Hansford, W.; Tyree, V.C.; Cresswell, M.W.;
By: Allen, R.A.; Linholm, L.W.; Khera, D.; Pina, C.; Hansford, W.; Tyree, V.C.; Cresswell, M.W.;
1993 / IEEE / 0-7803-0857-3
By: Teague, E.C.; Penzes, W.B.; Ellenwood, C.H.; Linholm, L.W.; Allen, R.A.; Cresswell, M.W.;
By: Teague, E.C.; Penzes, W.B.; Ellenwood, C.H.; Linholm, L.W.; Allen, R.A.; Cresswell, M.W.;
1993 / IEEE / 0-7803-0857-3
By: Jun, J.S.; Cresswell, M.W.; Linholm, L.W.; Teague, E.C.; Penzes, W.B.; Villarrubia, J.S.; Scire, F.E.; Kramar, J.A.;
By: Jun, J.S.; Cresswell, M.W.; Linholm, L.W.; Teague, E.C.; Penzes, W.B.; Villarrubia, J.S.; Scire, F.E.; Kramar, J.A.;
1994 / IEEE
By: Buzzeo, J.; Ramanathan, G.; Linholm, L.W.; Cresswell, M.W.; Khera, D.; Nagarajan, A.;
By: Buzzeo, J.; Ramanathan, G.; Linholm, L.W.; Cresswell, M.W.; Khera, D.; Nagarajan, A.;
1994 / IEEE / 0-7803-1757-2
By: Benecke, J.D.; Hill, T.A.; Ellenwood, C.H.; Owen, J.C., III; Volk, S.R.; Cresswell, M.W.; Allen, R.A.; Linholm, L.W.; Stewart, H.D.;
By: Benecke, J.D.; Hill, T.A.; Ellenwood, C.H.; Owen, J.C., III; Volk, S.R.; Cresswell, M.W.; Allen, R.A.; Linholm, L.W.; Stewart, H.D.;
1994 / IEEE
By: Cresswell, M.W.; Teague, E.C.; Penzes, W.B.; Ellenwood, C.H.; Linholm, L.W.; Allen, R.A.;
By: Cresswell, M.W.; Teague, E.C.; Penzes, W.B.; Ellenwood, C.H.; Linholm, L.W.; Allen, R.A.;
1994 / IEEE / 0-7803-1880-3
By: Teague, E.C.; Linholm, L.W.; Cresswell, M.W.; Allen, R.A.; Penzes, W.B.;
By: Teague, E.C.; Linholm, L.W.; Cresswell, M.W.; Allen, R.A.; Penzes, W.B.;
1995 / IEEE / 0-7803-2065-4
By: Mayo, S.; Ghoshtagore, R.N.; Cresswell, M.W.; Allen, R.A.; Schafft, H.A.; Teague, E.C.; Linholm, L.W.; Kramar, J.A.;
By: Mayo, S.; Ghoshtagore, R.N.; Cresswell, M.W.; Allen, R.A.; Schafft, H.A.; Teague, E.C.; Linholm, L.W.; Kramar, J.A.;
1996 / IEEE / 0-7803-2783-7
By: Allen, R.A.; Cresswell, M.W.; Gurnell, A.W.; Guthrie, W.F.; Linholm, L.W.;
By: Allen, R.A.; Cresswell, M.W.; Gurnell, A.W.; Guthrie, W.F.; Linholm, L.W.;
1997 / IEEE
By: Allen, R.A.; Cresswell, M.W.; Gurnell, A.W.; Penzes, W.B.; Guthrie, W.F.; Linholm, L.W.;
By: Allen, R.A.; Cresswell, M.W.; Gurnell, A.W.; Penzes, W.B.; Guthrie, W.F.; Linholm, L.W.;
1997 / IEEE / 0-7803-3243-1
By: Cresswell, M.W.; Linholm, L.W.; Guthrie, W.F.; Allen, R.A.; Ghoshtagore, R.N.; Sniegowski, J.J.;
By: Cresswell, M.W.; Linholm, L.W.; Guthrie, W.F.; Allen, R.A.; Ghoshtagore, R.N.; Sniegowski, J.J.;
1997 / IEEE / 0-7803-3243-1
By: Lee, W.E.; Linholm, L.W.; Sniegowski, J.J.; Allen, R.A.; Cresswell, M.W.; Guthrie, W.F.;
By: Lee, W.E.; Linholm, L.W.; Sniegowski, J.J.; Allen, R.A.; Cresswell, M.W.; Guthrie, W.F.;
1998 / IEEE
By: Allen, R.A.; Cresswell, M.W.; Linholm, L.W.; Ghoshtagore, R.N.; Sniegowski, J.J.; Guthrie, W.F.;
By: Allen, R.A.; Cresswell, M.W.; Linholm, L.W.; Ghoshtagore, R.N.; Sniegowski, J.J.; Guthrie, W.F.;
1988 / IEEE
By: Linholm, L.W.; Buehler, M.G.; Hicks, K.A.; Jennings, G.A.; Blaes, B.R.; Men, R.A.; Tyree, V.C.;
By: Linholm, L.W.; Buehler, M.G.; Hicks, K.A.; Jennings, G.A.; Blaes, B.R.; Men, R.A.; Tyree, V.C.;
1998 / IEEE / 0-7803-4348-4
By: Linholm, L.W.; Allen, R.A.; Guillaume, N.M.P.; Cresswell, M.W.; Guthrie, W.F.; Sullivan, N.; Osborne, Z.; Owen, J.C. III.; Ghoshtagore, R.N.;
By: Linholm, L.W.; Allen, R.A.; Guillaume, N.M.P.; Cresswell, M.W.; Guthrie, W.F.; Sullivan, N.; Osborne, Z.; Owen, J.C. III.; Ghoshtagore, R.N.;
1999 / IEEE
By: Linholm, L.W.; Sullivan, N.; Osborne, Z.E.; Ghoshtagore, R.N.; Cresswell, M.W.; Allen, R.A.; Lee, W.E.; Guillaume, N.M.P.; Guthrie, W.F.;
By: Linholm, L.W.; Sullivan, N.; Osborne, Z.E.; Ghoshtagore, R.N.; Cresswell, M.W.; Allen, R.A.; Lee, W.E.; Guillaume, N.M.P.; Guthrie, W.F.;
1999 / IEEE / 0-7803-5270-X
By: Smith, S.; Gundlach, A.M.; Fallon, M.; Allen, R.A.; Lindsay, I.A.B.; Linholm, L.W.; Cresswell, M.W.; Walton, A.J.;
By: Smith, S.; Gundlach, A.M.; Fallon, M.; Allen, R.A.; Lindsay, I.A.B.; Linholm, L.W.; Cresswell, M.W.; Walton, A.J.;
1999 / IEEE / 0-7803-5270-X
By: Cresswell, M.W.; Guillaume, N.M.P.; Linholm, L.W.; Everist, S.; Allen, R.A.;
By: Cresswell, M.W.; Guillaume, N.M.P.; Linholm, L.W.; Everist, S.; Allen, R.A.;
2000 / IEEE / 0-7803-6275-7
By: Cresswell, M.W.; Linholm, L.W.; Everist, S.C.; Shea, P.J.; Guillaume, N.M.P.; Ghoshtagore, R.N.; Allen, R.A.;
By: Cresswell, M.W.; Linholm, L.W.; Everist, S.C.; Shea, P.J.; Guillaume, N.M.P.; Ghoshtagore, R.N.; Allen, R.A.;
2001 / IEEE
By: Cresswell, M.W.; Ghoshtagore, R.N.; Linholm, L.W.; Everist, S.C.; Headley, T.J.; Allen, R.A.;
By: Cresswell, M.W.; Ghoshtagore, R.N.; Linholm, L.W.; Everist, S.C.; Headley, T.J.; Allen, R.A.;
2001 / IEEE / 0-7803-6511-9
By: Linholm, L.W.; Gupta, A.; Richter, C.A.; Murabito, C.E.; Pachura, D.; Arora, N.; Cresswell, M.W.; Allen, R.A.; Bendix, P.;
By: Linholm, L.W.; Gupta, A.; Richter, C.A.; Murabito, C.E.; Pachura, D.; Arora, N.; Cresswell, M.W.; Allen, R.A.; Bendix, P.;
Electrical linewidth test structures patterned in [100] silicon-on-insulator for use as CD standards
2001 / IEEEBy: Guillaume, N.M.P.; Allen, R.A.; Bonevich, J.E.; Cresswell, M.W.; Giannuzzi, L.A.; Linholm, L.W.; Shea, P.J.; Murabito, C.E.; Everist, S.C.;
2002 / IEEE / 0-7803-7464-9
By: Bogardus, E.H.; Cresswell, M.W.; am Ende, B.A.; Murabito, C.E.; Allen, R.A.; Linholm, L.W.; Guthrie, W.F.; Headley, T.J.;
By: Bogardus, E.H.; Cresswell, M.W.; am Ende, B.A.; Murabito, C.E.; Allen, R.A.; Linholm, L.W.; Guthrie, W.F.; Headley, T.J.;
2002 / IEEE / 0-7803-7464-9
By: Ellenwood, C.H.; Linholm, L.W.; Guthrie, W.F.; Murabito, C.E.; Cresswell, M.W.; Allen, R.A.; Hal Bogardus, E.;
By: Ellenwood, C.H.; Linholm, L.W.; Guthrie, W.F.; Murabito, C.E.; Cresswell, M.W.; Allen, R.A.; Hal Bogardus, E.;
2003 / IEEE
By: Guthrie, W.F.; Headley, T.J.; Cresswell, M.W.; Murabito, C.E.; Linholm, L.W.; am Ende, B.A.; Allen, R.A.; Bogardus, E.H.; Ellenwood, C.H.;
By: Guthrie, W.F.; Headley, T.J.; Cresswell, M.W.; Murabito, C.E.; Linholm, L.W.; am Ende, B.A.; Allen, R.A.; Bogardus, E.H.; Ellenwood, C.H.;
2004 / IEEE
By: Allen, R.A.; Guillaume, N.M.P.; Zaghloul, M.E.; Linholm, L.W.; Lahti, M.; Cresswell, M.W.;
By: Allen, R.A.; Guillaume, N.M.P.; Zaghloul, M.E.; Linholm, L.W.; Lahti, M.; Cresswell, M.W.;
2004 / IEEE / 0-7803-8262-5
By: Park, B.; Murabito, C.E.; Cresswell, M.W.; Patel, R.; Allen, R.A.; Linholm, L.W.; Edelstein, M.D.;
By: Park, B.; Murabito, C.E.; Cresswell, M.W.; Patel, R.; Allen, R.A.; Linholm, L.W.; Edelstein, M.D.;