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Author: Ku, J.

Results

Adaptive Compressed Sensing for the Fast Terahertz Reflection Tomography
2013 / IEEE
By: Kim, K.; Lee, D.-G.; Ham, W.-G.; Ku, J.; Lee, S.-H.; Ahn, C.-B.; Son, J.-H.; Park, H.;
Adaptive Compressed Sensing for the Fast Terahertz Reflection Tomography
2013 / IEEE
By: Ahn, C.-B.; Lee, S.-H.; Ku, J.; Ham, W.-G.; Lee, D.-G.; Kim, K.; Park, H.; Son, J.-H.;
Unidirectional Lasing From a Spiral-Shaped Microcavity of Dye-Doped Polymers
2015 / IEEE
By: Sun, H.; Xu, H.; Fang, W.; Zhao, J.; Zhang, X.; Xu, Y.; Ku, J.; Zhan, X.;
Photonic-Molecule Single-Mode Laser
2015 / IEEE
By: Huang, Y.; Yang, Y.; Ma, X.; Chen, Q.; Ku, J.; Sun, H.; Xu, H.;
A 2.25 gbytes/s 1 Mbit smart cache SRAM
1995 / IEEE / 0-7800-2599-0
By: Desroches, A.; Wei-Ping Lu; Yolin Lih; Yazdani, M.; Siu, S.; Ku, J.;
Identifying the capability of overlapping computation with communication
1996 / IEEE / 0-8186-7633-7
By: Sakane, H.; Sato, M.; Kodama, Y.; Ku, J.; Yamana, H.; Yamaguchi, Y.; Sohn, A.; Sakai, S.;
Yield risk cards at D2
1996 / IEEE / 0-7803-3371-3
By: Dudonis, R.; Dhar, V.; Agostino, T.; Ku, J.;
Microwave Characterization of Liquid Films
1985 / IEEE
By: Roy, K.P.; Kalra, S.P.; Kaufman, I.; Ku, J.;
A novel simple CBCM method free from charge injection-induced errors
2004 / IEEE
By: Tao-Cheng Lu; Han-Chao Lai; Chung-Hsuan Hsieh; Hsing-Wen Chang; Wenchi Ting; Chih-Yuan Lu; Yao-Wen Chang; Ku, J.;
Temperature effect on read current in a two-bit nitride-based trapping Storage Flash EEPROM cell
2004 / IEEE
By: Mu-Yi Liu; Chih-Yuan Lu; Ku, J.; Wenchi Ting; Tahui Wang; Tao-Cheng Lu; Ichen Yang; Zous, N.-K.; Yao-Wen Chang;
Cause of erase speed degradation during two-bit per cell operation of a trapping nitride storage flash memory cell
2004 / IEEE / 0-7803-8315-X
By: Wang, T.; Yeh, C.C.; Liu, M.Y.; Yeh, Y.H.; Chen, H.Y.; Ku, J.; Huang, S.; Chou, M.H.; Zous, N.K.; Tsai, W.J.; Chih-Yuan Lu;
Investigation of programmed charge lateral spread in a two-bit storage nitride flash memory cell by using a charge pumping technique
2004 / IEEE / 0-7803-8315-X
By: Ku, J.; Tahui Wang; Lu, T.C.; Tsai, W.J.; Yeh, C.C.; Chih-Yuan Lu; Zous, N.K.; Chan, C.T.; Wang, M.T.; Gu, S.H.;
A novel erase scheme to suppress overerasure in a scaled 2-bit nitride storage flash memory cell
2004 / IEEE
By: Hung-Yueh Chen; Yi-Ying Liao; Tao-Cheng Lu; Wen-Jer Tsai; Tahui Wang; Nian-Kai Zous; Chih-Yuan Lu; Chih-Chieh Yeh; Ku, J.; Wenchi Ting;
Lateral migration of trapped holes in a nitride storage flash memory cell and its qualification methodology
2004 / IEEE
By: Kuo, A.; Tsai, W.J.; Lee, M.Y.; Zous, N.K.; Chih-Yuan Lu; Ku, J.; Huang, L.T.; Wenchi Ting; Lu, W.P.; Tahui Wang; Liu, C.J.; Lu, T.C.;
Relationship between AC stress and DC stress on tunnel oxides
2004 / IEEE / 0-7803-8454-7
By: Zous, N.K.; Chih-Yuan Lu; Ku, J.; Pan, S.C.; Tahui Wang; Lu, W.P.; Chen, M.S.; Lu, T.C.; Tsai, W.J.; Chin, C.Y.; Chen, Y.J.;
Reliability and device scaling challenges of trapping charge flash memories
2004 / IEEE / 0-7803-8454-7
By: Tsai, W.J.; Yeh, C.C.; Chih-Yuan Lu; Ku, J.; Wenchi Ting; Tahui Wang; Chen, H.Y.; Zous, N.K.; Liao, Y.Y.; Lu, T.C.;
Process optimization by advanced process control with fault detection system for flash memory
2004 / IEEE / 0-7803-8469-5
By: Chi-Tung Huang; Ling-Wuu Yang; Li-Chung Yang; Chang-Wei Liao; Tuung Luoh; Hsueh-Hao Shih; Ku, J.; Chih-Yuan Lu; Chung, H.; Kuang-Chao Chen;
High performance and low power transistors integrated in 65nm bulk CMOS technology
2004 / IEEE / 0-7803-8684-1
By: Luo, Z.; Steegen, A.; Wann, C.; Yang, I.; Sudijono, J.; Schiml, T.; Ku, J.; Rengarajan, R.; Weybright, M.; Zhu, H.; Lee, K.; Lin, Y.; Marokkey, S.; Zhang, B.; Kaltalioglu, E.; Kim, S.; Cowley, A.; Kim, K.; Chan, V.; Hook, T.; Vayshenker, A.; Coppock, C.; Vietzke, D.; Lian, J.; Eller, M.; Mann, R.; Baiocco, C.; Nguyen, P.; Kim, L.; Hoinkis, M.; Ku, V.; Klee, V.; Jamin, F.; Wrschka, P.; Shafer, P.; Lin, W.; Fang, S.; Ajmera, A.; Tan, W.; Park, D.; Mo, R.;
Mechanisms and solutions to gate oxide degradation in flash memory by tunnel-oxide nitridation engineering
2005 / IEEE
By: Kuang-Chao Chen; Jeng Gong; Chi-Tung Huang; Ming-Shiang Chen; Ling-Wu Yang; Ku, J.; Chih-Yuan Chin; Szu-Yu Wang; Pei-Ren Jeng; Chih-Yuan Lu;
A novel CBCM method free from charge injection induced errors: investigation into the impact of floating dummy-fills on interconnect capacitance
2005 / IEEE / 0-7803-8855-0
By: King, Y.; Lu, T.C.; Chang, H.W.; Chang, Y.W.; Lu, C.Y.; Ku, J.; Ting, W.;
Engineering multi-signal systems for complex pattern formation
2005 / IEEE / 0-7695-2442-7
By: Weiss, R.; Ku, J.; Karig, D.;
Interconnect capacitance characterization using charge-injection-induced error-free (CIEF) charge-based capacitance measurement (CBCM)
2006 / IEEE
By: Ya-Chin King; Tao-Cheng Lu; Hsin-Wen Chang; Yao-Wen Chang; Chih-Yuan Lu; Ku, J.; Wenchi Ting;
10Gbps uncooled DFB LD module by the optimal EOTM design
2002 / IEEE / 87-90974-63-8
By: Bang, D.; Chang, D.; Song, I.; Ku, J.; Yoon, E.; Won, J.; Kang, J.; Hwang, S.; Park, M.; Jang, D.; Lee, S.; Park, S.; Um, M.;
A novel p-channel NAND-type flash memory with 2-bit/cell operation and high programming throughput (> 20 MB/sec)
2005 / IEEE / 0-7803-9268-X
By: Min-Ta Wu; Erh-Kun Lai; Szu-Yu Wang; Hang-Ting Lue; Chih-Yuan Lu; Ling-Wu Yang; Liu, R.; Kuang-Yeu Hsieh; Ku, J.; Kuang-Chao Chen;
BE-SONOS: A bandgap engineered SONOS with excellent performance and reliability
2005 / IEEE / 0-7803-9268-X
By: Kuang-Chao Chen; Ling-Wu Yang; Sheng-Chih Lai; Yen-Hao Shih; Erh-Kun Lai; Ku, J.; Hang-Ting Lue; Chih-Yuan Lu; Szu-Yu Wang; Rich Liu; Kuang-Yeu Hsieh;
A novel silicon-nitride based light-emitting transistor (SiNLET): optical/electrical properties of a SONOS-type three-terminal electroluminescence device for optical communication in ULSI
2005 / IEEE / 0-7803-9268-X
By: Tahui Wang; Ku, J.; Zous, N.K.; Ou, T.F.; Kao, H.L.; Liao, Y.Y.; Gu, S.H.; Pan, K.M.; Chen, Y.R.; Lu, T.C.; Tsai, W.J.; Yeh, C.C.; WenChi Ting; Chih-Yuan Lu;
Highly scalable NAND-type PHINES flash memory for data flash applications
2006 / IEEE / 1-4244-0027-9
By: Yeh, C.C.; Liao, Y.Y.; Tsai, W.J.; Lu, T.C.; Chih-Yuan Lu; Kao, I.L.L.; Wang, T.; Wen Chi Ting; Ku, J.; Ou, T.F.;
A Novel Non-Volatile Memory Cell Using a Gated-Diode Structure with a Trapping-Nitride Storage Layer
2006 / IEEE / 1-4244-0005-8
By: Ou, T.E.; Tsai, W.J.; Chih-Yuan Lu; Ku, J.; Kao, H.L.; Tahui Wang; Yeh, C.C.; Liao, Y.Y.; Lai, E.K.;
A Highly Stackable Thin-Film Transistor (TFT) NAND-Type Flash Memory
2006 / IEEE / 1-4244-0005-8
By: Jung-Yu Hsieh; Ku, J.; Yi-Hsuan Hsiao; Hang-Ting Lue; Erh-Kun Lai; Chih-Yuan Lu; Liu, R.; Shih-Chin Lee; Kuang-Yeu Hsieh; Jeng Gong; Kuang-Chao Chen; Ling-Wu Yang; Szu-Yu Wang; Chi-Pin Lu;
A 45nm Low Cost Low Power Platform by Using Integrated Dual-Stress-Liner Technology
2006 / IEEE / 1-4244-0005-8
By: Yuan, J.; Schiml, T.; Hierlemann, M.; Ku, J.; Sudijono, J.; Ng, K.; Barton, K.; Li, J.; Yang, Z.; Stierstorfer, R.; Rovedo, N.; Dyer, T.; Fang, S.; Lee, W.; Luo, Z.; Amos, R.; Hook, T.; Sardesai, V.; Lindsay, R.; Kim, J.; Lee, Y.M.; Tan, S.S.;
Investigation of Charge Loss in Cycled NBit Cells via Field and Temperature Accelerations
2006 / IEEE / 0-7803-9498-4
By: Lu, W.P.; Chen, S.; Yeh, C.C.; Lenvis Liu; Chen, H.Y.; Tahui Wang; Tsai, W.J.; Chih-Yuan Lu; Zous, N.K.; Ku, J.;
Read Current Instability Arising from Random Telegraph Noise in Localized Storage, Multi-Level SONOS Flash Memory
2006 / IEEE / 1-4244-0438-X
By: Li, C.W.; Gu, S.H.; Chih-Yuan Lu; Ku, J.; Chen, K.C.; Lu, W.P.; Tahui Wang;
Highly Scalable and Reliable Multi-bit/cell Nitride Trapping Nonvolatile Memory Using Enhanced ANS-ONO Process with A Nitridized Interface
2006 / IEEE / 1-4244-0438-X
By: Lu, C.P.; Ni, K.P.; Wu, M.D.; Hsu, T.H.; Hsieh, J.Y.; Lai, E.K.; Shih, Y.H.; Chih-Yuan Lu; Liu, R.; Ni, F.L.; Ku, J.; Chen, K.C.; Lu, W.P.; Liaw, M.H.; Hsieh, K.Y.; Yang, L.W.; Chou, T.Y.;
Inhomogeneous spin injection and detection in the lateral FM/Au/FM spin valve device
2006 / IEEE / 1-4244-1479-2
By: Ku, J.; Eom, J.; Han, S.; Chang, J.;
High Performance Transistors Featured in an Aggressively Scaled 45nm Bulk CMOS Technology
2007 / IEEE / 978-4-900784-03-1
By: Luo, Z.; Rovedo, N.; Ieong, M.; Sudijono, J.; Ku, J.; Hierlemann, M.; Shang, H.; Ng, H.; Tian, C.; Yang, Z.; Vayshenker, A.; Lee, S.; Kim, S.; Lee, H.; Yuan, T.K.J.; Chan, V.; Han, J.; Holt, J.; Park, D.; Kwon, O.; Yan, J.; Fang, S.; Dyer, T.; Teo, L.; Ong, S.; Phoong, B.; Eller, M.; Utomo, H.; Ryou, C.; Wang, H.; Stierstorfer, R.; Clevenger, L.; Kim, S.; Toomey, J.; Sciacca, D.; Li, J.; Wille, W.; Zhao, L.;
A Broadband Chip-Level Power-Bus Model Feasible for Power Integrity Chip-Package Codesign in High-Speed Memory Circuits
2010 / IEEE
By: Tzong-Lin Wu; Ku, J.; Cheng, A.; Chun-Huang Yu; Hong, J.; Chih-Jung Hsu; Hao-Hsiang Chuang;
Signal/Power Integrity Modeling of High-Speed Memory Modules Using Chip-Package-Board Coanalysis
2010 / IEEE
By: Ruey-Beei Wu; Hao-Hsiang Chuang; Ku, J.; Chuan-Jen Chang; Yen-Ping Chou; Wen-Chang Cheng; Tzong-Lin Wu; Chun-Huang Yu; Ming-Zhang Hong; Yung-Shou Cheng; Yi-Chang Lu; Hsin-Shu Chen; Yu-Hsiang Lin; Wei-Da Guo;
A Cooperative Intrusion Detection System Framework for Cloud Computing Networks
2010 / IEEE / 978-1-4244-7918-4
By: Ku, J.; Chun-Chieh Huang; Chi-Chun Lo;

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