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Author: Krishnasamy, R.
Results
2004 / IEEE / 0-7803-8333-8
By: Schonenberg, K.T.; Stricker, A.; Khater, M.; Greenberg, D.; Rieh, J.-S.; Freeman, G.; Stein, K.; Ahlgren, D.; Yanagisawa, T.; Vaed, K.; Sweeney, S.; Jeng, S.-J.; Smith, P.; Schnabel, C.; Sanderson, D.; Krishnasamy, R.; Johnson, J.; Jagannathan, B.; Florkey, J.; Chinthakindi, A.; Adam, T.; Pagette, F.;
By: Schonenberg, K.T.; Stricker, A.; Khater, M.; Greenberg, D.; Rieh, J.-S.; Freeman, G.; Stein, K.; Ahlgren, D.; Yanagisawa, T.; Vaed, K.; Sweeney, S.; Jeng, S.-J.; Smith, P.; Schnabel, C.; Sanderson, D.; Krishnasamy, R.; Johnson, J.; Jagannathan, B.; Florkey, J.; Chinthakindi, A.; Adam, T.; Pagette, F.;
2004 / IEEE / 0-7803-8253-6
By: Thomas, P.J.; Hornsey, R.; Pepic, S.; Shen, E.; Wong, W.; Krishnasamy, R.;
By: Thomas, P.J.; Hornsey, R.; Pepic, S.; Shen, E.; Wong, W.; Krishnasamy, R.;
2004 / IEEE / 0-7803-8495-4
By: Jones, J.R.; Singh, R.; Groves, R.; Jagannathan, B.; Greenberg, D.; Pekarik, J.; Krishnasamy, R.; Freeman, G.; Florkey, J.; Cottrell, P.; Coolbaugh, D.; Breitwisch, M.; Wang, X.; Chinthakindi, A.;
By: Jones, J.R.; Singh, R.; Groves, R.; Jagannathan, B.; Greenberg, D.; Pekarik, J.; Krishnasamy, R.; Freeman, G.; Florkey, J.; Cottrell, P.; Coolbaugh, D.; Breitwisch, M.; Wang, X.; Chinthakindi, A.;
2004 / IEEE / 0-7803-8684-1
By: Meghelli, M.; Pagette, F.; Johnson, J.; Krishnasamy, R.; Chinthakindi, A.; Adam, T.; Rieh, J.-S.; Khater, M.; Freeman, G.; Ahlgren, D.; Jeng, S.-J.; Strieker, A.; Stein, K.; Smith, P.; Schonenberg, K.T.; Schnabel, C.; Sanderson, D.;
By: Meghelli, M.; Pagette, F.; Johnson, J.; Krishnasamy, R.; Chinthakindi, A.; Adam, T.; Rieh, J.-S.; Khater, M.; Freeman, G.; Ahlgren, D.; Jeng, S.-J.; Strieker, A.; Stein, K.; Smith, P.; Schonenberg, K.T.; Schnabel, C.; Sanderson, D.;
2006 / IEEE / 1-4244-0438-X
By: Han, J.P.; Utomo, H.; Ieong, M.; Sudijono, J.; Ku, J.H.; Shum, D.; Hierlemann, M.; Amos, R.; Chiulli, G.; Lindsay, R.; Kim, S.D.; Loesing, R.; Burns, L.; Turansky, A.; Madan, A.; St Lawrence, B.; Davis, R.; Murphy, R.; Li, J.; Li, J.; Kim, J.J.; Zhuang, H.; Mishra, S.; Schepis, D.; Gutmann, A.; Teo, L.W.; Rovedo, N.; Luo, Z.; Krishnasamy, R.; Stierstorfer, R.; Chong, Y.F.; Fang, S.; Ng, H.; Holt, J.; Adam, T.N.; Kempisty, J.;
By: Han, J.P.; Utomo, H.; Ieong, M.; Sudijono, J.; Ku, J.H.; Shum, D.; Hierlemann, M.; Amos, R.; Chiulli, G.; Lindsay, R.; Kim, S.D.; Loesing, R.; Burns, L.; Turansky, A.; Madan, A.; St Lawrence, B.; Davis, R.; Murphy, R.; Li, J.; Li, J.; Kim, J.J.; Zhuang, H.; Mishra, S.; Schepis, D.; Gutmann, A.; Teo, L.W.; Rovedo, N.; Luo, Z.; Krishnasamy, R.; Stierstorfer, R.; Chong, Y.F.; Fang, S.; Ng, H.; Holt, J.; Adam, T.N.; Kempisty, J.;
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