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Author: Kirsch, R.P.
Reliability Assessment on Highly Manufacturable MOSFETs with Metal Gate and Hf based Gate Dielectrics2007 / IEEE / 978-1-4244-1014-9
By: Kirsch, R.P.; Siddarth Krishnan; Bersuker, G.; Chang Yong Kang; Heh, D.; Neugroschel, A.; Young, C.; Rino Choi; Jammy, R.; Lee, B.H.; Song, S.C.;