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Author: Kawashima, Y.

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Conductive filament scaling of TaOx bipolar ReRAM for long retention with low current operation
2012 / IEEE / 978-1-4673-0847-2
By: Ninomiya, T.; Takagi, T.; Aono, K.; Shimakawa, K.; Mikawa, T.; Ito, S.; Kawashima, Y.; Kato, Y.; Kawai, K.; Ikeda, Y.; Katayama, K.; Yasuhara, R.; Muraoka, S.; Wei, Z.;
A practical method for extracting impurity profiles and effective mobilities of MOSFET's with nonuniform channel doping
1990 / IEEE
By: Nagao, M.; Ohkura, Y.; Kawashima, Y.; Kubota, K.;
Measurement of lateral diffusion profiles for submicrometer MOSFETs
1990 / IEEE / 0-87942-588-1
By: Kawashima, Y.; Kubota, K.; Ishida, M.; Yoshida, S.;
A novel manufacturing technology of buried RuO/sub 2/-based thick film resistors in copper-polyimide substrate
1991 / IEEE / 0-7803-0012-2
By: Kohara, M.; Takada, M.; Kawashima, Y.; Gofuku, E.; Nunoshita, M.;
Current status of RF system for the SPring-8
1991 / IEEE / 0-7803-0135-8
By: Kawashima, Y.; Nakamura, T.; Inoue, K.; Hara, M.;
Controls and drives of coil feeder for hot formers
1991 / IEEE / 0-7803-0453-5
By: Tomiku, M.; Yokoyama, M.; Hirano, M.; Kawashima, Y.; Ogata, S.; Kuno, T.;
A 1.6 Gbyte/s data transfer rate 8 Mb embedded DRAM
1995 / IEEE
By: Yabe, T.; Shinya, H.; Sato, K.; Numata, K.; Miyano, S.; Rungsea, M.; Nagarajan, A.; Nagy, M.; Hannah, M.; Hansen, P.; Furuyama, T.; Wada, M.; Yanagiya, N.; Kaki, S.; Sakurai, M.; Yoshida, T.; Kumagai, J.; Ohgata, M.; Iwase, M.; Kawashima, Y.; Shiochi, M.; Enkaku, M.; Haga, R.;
Effects of process-induced mechanical stress on ESD performance
1995 / IEEE / 0-7803-2602-4
By: Hashimoto, C.; Ishizuka, H.; Kawashima, Y.; Miura, H.; Okuyama, K.; Kubota, K.;
A 1.6 GB/s data-transfer-rate 8 Mb embedded DRAM
1995 / IEEE / 0-7803-2495-1
By: Anan Nagarajan; Nagy, M.; Hannah, M.; Hansen, P.; Furuyama, T.; Shinya, H.; Yanagiya, N.; Kaki, S.; Sakurai, M.; Yoshida, T.; Kumagai, J.; Ohgata, M.; Iwase, M.; Kawashima, Y.; Shiochi, M.; Enkaku, M.; Haga, R.; Wada, M.; Yabe, T.; Sato, K.; Numata, K.; Miyano, S.; Rungsea, M.;
RF stations of the SPring-8 storage ring
1997 / IEEE / 0-7803-4376-X
By: Ohashi, Y.; Kawashima, Y.; Ego, H.; Hara, M.; Takashima, T.; Ohshima, T.;
Phase-sensitive shaping of femtosecond optical pulses using a liquid crystal panel
1999 / IEEE / 0-7803-5661-6
By: Kawashima, Y.; Kabuki, K.; Hattori, T.; Nakatsuka, H.;
On the study about opening and closing of an eyelid-application to the support system of medical care
2000 / IEEE / 0-7803-6273-X
By: Satoh, T.; Izaki, D.; Saitou, N.; Kawashima, Y.; Igarashi, M.; Uchikado, S.; Tanaka, K.;
A new extraction method of device parameters for mass production E-T data analysis
2001 / IEEE / 0-7803-6688-3
By: Ohji, Y.; Suzuki, C.; Nishida, A.; Kawashima, Y.; Kubota, K.; Okuyama, K.; Ohuchi, T.; Kamohara, S.; Murakami, E.;
Control of FSG/SiO/sub 2/ interlayer conditions to prevent Al-wiring delamination caused by F accumulation at Ti/SiO/sub 2/
2001 / IEEE / 0-7803-6731-6
By: Den, Y.; Obata, S.; Kawano, B.; Ide, T.; Kudo, M.; Nakamura, N.; Ichikawa, T.; Kawashima, Y.;
Operation of crowbarless power supply for klystron at NewSUBARU
2001 / IEEE / 0-7803-7191-7
By: Ando, A.; Shoji, Y.; Ohnishi, Y.; Yamazaki, C.; Hashimoto, S.; Jumonji, Y.; Kozu, H.; Kawashima, Y.; Ohshima, T.;
Single pass beam position monitor of NewSUBARU
2001 / IEEE / 0-7803-7191-7
By: Ando, A.; Shoji, Y.; Kawashima, Y.; Ohshima, T.; Hashimoto, S.;
Study of FSG/SiO/sub 2/ double interlayer conditions to prevent Al wiring delamination for sub-0.18-/spl mu/m device integration
2002 / IEEE
By: Ichikawa, T.; Kawashima, Y.; Kudo, M.; Ide, T.; Nakamura, N.; Kawano, H.; Den, Y.; Obata, S.;
Low frequency noise (LFN) characteristics of SiGe channel SOI dynamic threshold MOSFETs (SiGe-SOI-DTMOS) for low-power applications
2003 / IEEE / 0-7803-7815-6
By: Inoue, A.; Takagi, T.; Hara, H.; Kawashima, T.; Kanzawa, Y.; Sorada, H.; Kawashima, Y.; Asai, A.;
Generation of high-energy synchrotron radiation with a 10-T superconducting wiggler installed in the SPring-8 storage ring
2003 / IEEE / 0-7803-7738-9
By: Soutome, K.; Date, S.; Ego, H.; Fukui, T.; Hara, M.; Hosoda, N.; Kawashima, Y.; Kodera, M.; Kumagai, N.; Magome, T.; Masaki, M.; Masuda, T.; Matsui, S.; Nakamura, T.; Noda, T.; Ohashi, Y.; Ohshima, T.; Oishi, M.; Saeki, H.; Sasaki, S.; Shoji, M.; Takano, S.; Takao, M.; Takashima, T.; Takebe, H.; Tamura, K.; Tanaka, H.; Taniuchi, Y.; Tsumaki, K.; Yorita, T.; Zhang, C.; Yonehara, H.; Schimizu, J.; Batrakov, A.; Karpov, G.; Kulipanov, G.; Kuzin, M.; Shkaruba, V.; Skrinsky, A.; Mezentsev, N.;
Progress on the C-band accelerator for the SPring-8 compact SASE source
2003 / IEEE / 0-7803-7738-9
By: Shintake, T.; Takasu, Y.; Yoshida, M.; Takeda, S.; Matsumoto, H.; Kitamura, H.; Ishikawa, T.; Takeshita, K.; Takahashi, S.; Saino, K.; Sezaki, K.; Tamasaku, K.; Ego, H.; Chao, Z.; Matsui, S.; Kudo, T.; Takashima, T.; Kawashima, Y.; Marechal, X.; Seike, T.; Bizen, T.; Hara, T.; Tanaka, T.; Onoe, K.; Baba, Y.H.; Togawa, K.; Inagaki, T.;
A novel MNOS technology using gate hole injection in erase operation for embedded nonvolatile memory applications
2004 / IEEE / 0-7803-8289-7
By: Mizuno, M.; Hashimoto, T.; Ishii, Y.; Kanamaru, Y.; Sakai, T.; Kawashima, Y.; Ito, F.; Kubota, K.; Kuroda, K.; Okuyama, K.; Toya, T.; Shinagawa, Y.; Tanaka, T.; Kume, H.; Matsuzaki, N.; Mine, T.; Ishimaru, T.;
A study on solar hydrogen generation with PEM
2002 / IEEE / 0-7803-7296-4
By: Kawashima, Y.; Hosokawa, T.; Honda, I.;
Impact of SiON on embedded nonvolatile MNOS memory
2004 / IEEE / 0-7803-8684-1
By: Kawashima, Y.; Sakai, T.; Kume, H.; Yugami, J.; Ito, F.; Watanabe, K.; Mine, T.; Okuyama, Y.; Matsuzaki, N.; Ishimaru, T.; Kubota, K.; Kuroda, K.; Okuyama, K.; Hashimoto, T.; Kamohara, S.; Mizuno, M.; Ishii, Y.; Kanamaru, Y.;
Neck Injury Analyzer Tool Based on Mechanical Impedance Characteristics for the Design of Human-seat Systems
2004 / IEEE / 0-7803-8614-8
By: Kusuhara, T.; Takeshima, T.; Tsuji, T.; Tanaka, Y.; Takeda, Y.; Kawashima, Y.;
High frequency ESR measurements of thiospinel CuCrZrS/sub 4/
2005 / IEEE / 0-7803-9348-1
By: Idehara, T.; Toda, M.; Fujita, T.; Fujimoto, Y.; Mitsudo, S.; Nagata, S.; Kawashima, Y.;
Evaluation of method for multiple path distribution based on delay-jitter
2006 / IEEE / 0-7695-2510-5
By: Mineno, H.; Kawashima, Y.; Mizuno, T.; Ishihara, S.;
Rapid Screening Method for Brominated Flame Retardants and Hexavalent Chromium by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
2005 / IEEE / 1-4244-0081-3
By: Hirano, N.; Naka, J.; Kawashima, Y.; Kobayashi, J.; Kurokawa, H.;
Newly Found Anomalous Gate Leakage Current (AGLC) for 65 nm Node and Beyond, and Its Countermeasure Using Nitrogen Implanted Poly-Si
2006 / IEEE / 1-4244-0005-8
By: Tanaka, M.; Kawashima, Y.; Watanabe, T.; Miyake, S.; Yamamoto, I.; Sakakidani, A.; Fukai, T.; Koyama, S.; Hasegawa, E.; Suzuki, T.; Togo, M.; Imai, K.; Ikeda, M.; Kunimune, Y.;
Fractionally Spaced Selective Rake Reception for MBOK DS-UWB Systems
2006 / IEEE / 0-7803-9732-0
By: Sasaki, S.; Kawashima, Y.; Kikuchi, H.;
Development of diver detection and sensor integration for wharf surveillance software
2007 / IEEE / 1-4244-1207-2
By: Asada, A.; Maeda, F.; Hantani, K.; Imai, R.; Kuramoto, K.; Kawashima, Y.; Nanri, M.; Kurashige, Y.;
Advanced Surveillance Technology for Underwater Security Sonar Systems
2007 / IEEE / 978-1-4244-0634-0
By: Nanri, M.; Kawashima, Y.; Kuramoto, K.; Maeda, F.; Asada, A.; Hantani, K.;
Development of Underwater Security Sonar System
2006 / IEEE / 978-1-4244-0137-6
By: Kawashima, Y.; Oimatsu, K.; Tanaka, T.; Kuramoto, K.; Nanri, M.; Asada, A.; Hantani, K.; Oyagi, T.;
Fast switching and long retention Fe-O ReRAM and its switching mechanism
2007 / IEEE / 978-1-4244-1507-6
By: Wei, Z.; Mikawa, T.; Katayama, K.; Katoh, Y.; Fujii, S.; Mitani, S.; Kanzawa, Y.; Osano, K.; Muraoka, S.; Takagi, T.; Odagawa, A.; Shimakawa, K.; Kawai, K.; Azuma, R.; Kawashima, Y.; Arita, K.;
Highly reliable TaOx ReRAM and direct evidence of redox reaction mechanism
2008 / IEEE / 978-1-4244-2377-4
By: Fujii, S.; Katayama, K.; Muraoka, S.; Mitani, S.; Kawai, K.; Katoh, Y.; Arita, K.; Kanzawa, Y.; Wei, Z.; Oshima, M.; Kumigashira, H.; Horiba, K.; Yasuhara, R.; Takagi, T.; Sugaya, H.; Shimakawa, K.; Azuma, R.; Okada, T.; Himeno, A.; Tsuji, K.; Kawashima, Y.; Miyanaga, R.; Ninomiya, T.; Mikawa, T.; Iijima, M.;
Comprehensive study of 32 nm node ultralow-k/Cu (keff=2.6) dual damascene integration featuring short TAT silylated porous silica (k=2.1)
2008 / IEEE / 978-1-4244-2377-4
By: Nakao, S.; Kubota, T.; Chikaki, S.; Oda, N.; Saito, S.; Tomioka, K.; Kawashima, Y.; Hayashi, R.; Nogawa, J.; Nakamura, N.; Soda, E.;
Packaging characteristics of 6-layer ultra low-k/Cu dual damascene interconnect featuring advanced scalable porous silica (k=2.1)
2009 / IEEE / 978-1-4244-4492-2
By: Saito, S.; Oda, N.; Kawashima, Y.; Suzuki, T.; Gawase, A.; Soda, E.; Chikaki, S.;
Adaptive incremental principal component analysis in nonstationary online learning environments
2009 / IEEE / 978-1-4244-3548-7
By: Kawashima, Y.; Ozawa, S.; Kasabov, N.; Shaoning Pang;
Coarse image region segmentation using region-and boundary-based coupled MRF models and their PWM VLSI implementation
2009 / IEEE / 978-1-4244-3548-7
By: Morie, T.; Okada, M.; Nakada, K.; Atuti, D.; Kawashima, Y.;
A simple noncoherent Rake Reception in DS-UWB wireless communications
2009 / IEEE / 978-1-4244-5015-2
By: Kawashima, Y.; Sasaki, S.;
Total Performance of 32-nm-Node Ultralow-$k$ /Cu Dual-Damascene Interconnects Featuring Short-TAT Silylated Porous Silica $(k = \hbox{2.1})$
2010 / IEEE
By: Soda, E.; Tomioka, K.; Oda, N.; Nakao, S.; Kubota, T.; Chikaki, S.; Nakamura, N.; Saito, S.; Suzuki, T.; Hayashi, R.; Kawashima, Y.; Nogawa, J.; Gawase, A.;
High-speed-computational image sensor for detection of 2D motion vector by using single pixel matching
2010 / IEEE / 978-1-4244-7493-6
By: Kawashima, Y.; Kodama, K.; Hamamoto, T.; Nakayama, K.;
Effects of hydrogen dilution on electron density in multi-hollow discharges with magnetic field for A-Si:H film deposition
2010 / IEEE / 978-1-4244-5892-9
By: Shiratani, M.; Nakamura, W.M.; Matsunaga, T.; Nakahara, K.; Kawashima, Y.; Koga, K.;
Si quantum dot-sensitized solar cells using Si nanoparticles produced by plasma CVD
2010 / IEEE / 978-1-4244-5892-9
By: Yamashita, D.; Matsuzaki, H.; Matsunaga, T.; Nakamura, W.M.; Nakahara, K.; Sato, M.; Yamamoto, K.; Kawashima, Y.; Kondo, M.; Shiratani, M.; Koga, K.; Itagaki, N.; Kamataki, K.; Uchida, G.;
Fabrication of long tip AFM probes for highly coarse samples
2010 / IEEE / 978-1-4244-7032-7
By: Kawashima, Y.; Hyen-Wook Kang; Muramatsu, H.;

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