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Author: Ishikawa, O.
Results
1992 / IEEE / 0-7803-0611-2
By: Ishikawa, O.; Maeda, M.; Azuma, C.; Yokoyama, T.; Yanagihara, M.; Ota, Y.;
By: Ishikawa, O.; Maeda, M.; Azuma, C.; Yokoyama, T.; Yanagihara, M.; Ota, Y.;
1992 / IEEE / 0-7803-0773-9
By: Sakai, H.; Ishikawa, O.; Tezuka, A.; Maeda, M.; Ota, Y.; Katoh, T.; Inada, M.; Sagawa, M.; Mori, Y.; Itoh, J.;
By: Sakai, H.; Ishikawa, O.; Tezuka, A.; Maeda, M.; Ota, Y.; Katoh, T.; Inada, M.; Sagawa, M.; Mori, Y.; Itoh, J.;
1994 / IEEE / 0-7803-1418-2
By: Ishida, K.; Fujimoto, H.; Yokoyama, T.; Kunihisa, T.; Ishikawa, O.; Takehara, H.;
By: Ishida, K.; Fujimoto, H.; Yokoyama, T.; Kunihisa, T.; Ishikawa, O.; Takehara, H.;
1994 / IEEE
By: Fujimoto, H.; Kunihisa, T.; Yokoyama, T.; Ishikawa, O.; Ikeda, H.; Ishida, K.; Takehara, H.;
By: Fujimoto, H.; Kunihisa, T.; Yokoyama, T.; Ishikawa, O.; Ikeda, H.; Ishida, K.; Takehara, H.;
1993 / IEEE / 0-7803-1393-3
By: Ota, Y.; Fujimoto, H.; Adachi, C.; Takehara, H.; Nishijima, M.; Maeda, M.; Ishikawa, O.;
By: Ota, Y.; Fujimoto, H.; Adachi, C.; Takehara, H.; Nishijima, M.; Maeda, M.; Ishikawa, O.;
1995 / IEEE / 0-7803-2590-7
By: Yoshida, T.; Nakatsuka, T.; Yamamoto, S.; Itoh, J.; Nishitsuji, M.; Ishikawa, O.; Nishii, K.; Uda, T.;
By: Yoshida, T.; Nakatsuka, T.; Yamamoto, S.; Itoh, J.; Nishitsuji, M.; Ishikawa, O.; Nishii, K.; Uda, T.;
1995 / IEEE
By: Ota, Y.; Fujimoto, H.; Nakamura, M.; Morimoto, S.; Ishikawa, O.; Takehara, H.; Masato, H.; Maeda, M.;
By: Ota, Y.; Fujimoto, H.; Nakamura, M.; Morimoto, S.; Ishikawa, O.; Takehara, H.; Masato, H.; Maeda, M.;
1994 / IEEE / 0-7803-1460-3
By: Sakai, N.; Sakai, H.; Ota, H.; Kato, S.; Watanuki, Y.; Kurihara, J.; Ihara, T.; Ichikawa, Y.; Hama, T.; Ishikawa, O.;
By: Sakai, N.; Sakai, H.; Ota, H.; Kato, S.; Watanuki, Y.; Kurihara, J.; Ihara, T.; Ichikawa, Y.; Hama, T.; Ishikawa, O.;
1996 / IEEE / 0-7803-3166-4
By: Yoshida, T.; Ishikawa, O.; Kurihara, J.; Sakai, N.; Sakai, H.; Ichikawa, Y.; Hama, T.; Watanuki, Y.; Horiguchi, M.; Kato, S.; Tanda, M.;
By: Yoshida, T.; Ishikawa, O.; Kurihara, J.; Sakai, N.; Sakai, H.; Ichikawa, Y.; Hama, T.; Watanuki, Y.; Horiguchi, M.; Kato, S.; Tanda, M.;
1996 / IEEE / 0-7803-3504-X
By: Nishii, K.; Nishitsuji, M.; Nishijima, M.; Yamamoto, S.; Nakayama, M.; Kunihisa, T.; Yokoyama, T.; Ishikawa, O.;
By: Nishii, K.; Nishitsuji, M.; Nishijima, M.; Yamamoto, S.; Nakayama, M.; Kunihisa, T.; Yokoyama, T.; Ishikawa, O.;
1997 / IEEE / 0-7803-3318-7
By: Nishii, K.; Nishitsuji, M.; Nishijima, M.; Kunihisa, T.; Yokoyama, T.; Yamamoto, S.; Ishikawa, O.;
By: Nishii, K.; Nishitsuji, M.; Nishijima, M.; Kunihisa, T.; Yokoyama, T.; Yamamoto, S.; Ishikawa, O.;
1997 / IEEE / 0-7803-3814-6
By: Nishitsuji, M.; Miyatsuji, K.; Yokoyama, T.; Yamamoto, S.; Ishikawa, O.; Kunihisa, T.; Itoh, J.; Nishijima, M.;
By: Nishitsuji, M.; Miyatsuji, K.; Yokoyama, T.; Yamamoto, S.; Ishikawa, O.; Kunihisa, T.; Itoh, J.; Nishijima, M.;
1997 / IEEE / 0-7803-4083-3
By: Yokoyama, T.; Kunihisha, T.; Ishikawa, O.; Nakayama, M.; Nishii, K.; Nishitsuji, M.; Yamamoto, S.; Nishijima, M.;
By: Yokoyama, T.; Kunihisha, T.; Ishikawa, O.; Nakayama, M.; Nishii, K.; Nishitsuji, M.; Yamamoto, S.; Nishijima, M.;
1997 / IEEE / 0-7803-4083-3
By: Ishikawa, O.; Uda, T.; Nishitsuji, M.; Yoshida, T.; Itoh, J.; Nakatsuka, T.;
By: Ishikawa, O.; Uda, T.; Nishitsuji, M.; Yoshida, T.; Itoh, J.; Nakatsuka, T.;
1998 / IEEE / 0-7803-4439-1
By: Nakatsuka, T.; Itoh, J.; Ishikawa, O.; Maeda, M.; Yokoyama, T.; Uda, T.; Imagawa, Y.; Sato, K.;
By: Nakatsuka, T.; Itoh, J.; Ishikawa, O.; Maeda, M.; Yokoyama, T.; Uda, T.; Imagawa, Y.; Sato, K.;
1998 / IEEE / 0-7803-4471-5
By: Yamamoto, S.; Kunihisa, T.; Nishijima, M.; Yokoyama, T.; Ishikawa, O.;
By: Yamamoto, S.; Kunihisa, T.; Nishijima, M.; Yokoyama, T.; Ishikawa, O.;
1998 / IEEE / 0-7803-5049-9
By: Nishii, K.; Nishitsuji, M.; Yokoyama, T.; Nishijima, M.; Yamamoto, S.; Kunihisa, T.; Ishikawa, O.;
By: Nishii, K.; Nishitsuji, M.; Yokoyama, T.; Nishijima, M.; Yamamoto, S.; Kunihisa, T.; Ishikawa, O.;
2000 / IEEE / 0-7803-6280-2
By: Ishikawa, O.; Nagata, H.; Nobori, K.; Nishitsuji, M.; Kawashima, K.; Fujimoto, K.;
By: Ishikawa, O.; Nagata, H.; Nobori, K.; Nishitsuji, M.; Kawashima, K.; Fujimoto, K.;
2001 / IEEE / 0-7803-7078-3
By: Terao, M.; Kobashi, S.; Hata, Y.; Tanaka, M.; Tokimoto, Y.; Ishikawa, O.; Ishikawa, M.;
By: Terao, M.; Kobashi, S.; Hata, Y.; Tanaka, M.; Tokimoto, Y.; Ishikawa, O.; Ishikawa, M.;
2001 / IEEE / 0-7803-7078-3
By: Yanagida, T.; Kitamura, Y.T.; Hata, Y.; Takae, T.; Kobashi, S.; Ishikawa, M.; Ishikawa, O.;
By: Yanagida, T.; Kitamura, Y.T.; Hata, Y.; Takae, T.; Kobashi, S.; Ishikawa, M.; Ishikawa, O.;
Degree of normality based on fuzzy logic for a diagnostic analysis of signs observed in a human body
2003 / IEEE / 0-7803-7918-7By: Ishikawa, O.; Hata, Y.; Kondo, K.; Kobashi, S.;
2004 / IEEE / 1-889335-21-5
By: Kondo, K.; Kobashi, S.; Hata, Y.; Yanagida, T.; Kitamura, Y.; Ishikawa, O.;
By: Kondo, K.; Kobashi, S.; Hata, Y.; Yanagida, T.; Kitamura, Y.; Ishikawa, O.;
2009 / IEEE / 978-1-4244-4766-4
By: Nakajima, H.; Tsuchiya, N.; Ishikawa, O.; Yamaguchi, H.; Kobashi, S.; Hata, Y.;
By: Nakajima, H.; Tsuchiya, N.; Ishikawa, O.; Yamaguchi, H.; Kobashi, S.; Hata, Y.;
2010 / IEEE / 978-1-4244-6588-0
By: Hata, Y.; Hiramatsu, G.; Ishikawa, O.; Oshiro, Y.; Yagi, N.; Yanagida, T.; Kitamura, Y.;
By: Hata, Y.; Hiramatsu, G.; Ishikawa, O.; Oshiro, Y.; Yagi, N.; Yanagida, T.; Kitamura, Y.;
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