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Author: Husam Alshareef
Realiability Characteristics of Metal/High-K Pmos with Top Interface Engineered Band Offset Dielectric (BOD)2006 / IEEE / 0-7803-9498-4
By: Majhi, P.; Solis, L.; Rao, A.; Husam Alshareef; Huang-Chun Wen; Choi, R.; Harris, H.R.; Brown, G.A.; Krishnan, S.; Bersuker, G.; Byoung Hun Lee;