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Author: Hajnal, J.V.
Results
2012 / IEEE / 978-1-4577-1858-8
By: Counsell, S.; Aljabar, P.; Serag, A.; Rueckert, D.; Hajnal, J.V.; Boardman, J.;
By: Counsell, S.; Aljabar, P.; Serag, A.; Rueckert, D.; Hajnal, J.V.; Boardman, J.;
2012 / IEEE / 978-1-4577-1858-8
By: Hajnal, J.V.; Quaghebeur, G.; Kuklisova-Murgasova, M.; Schnabel, J.A.; Noble, J.A.;
By: Hajnal, J.V.; Quaghebeur, G.; Kuklisova-Murgasova, M.; Schnabel, J.A.; Noble, J.A.;
2004 / IEEE
By: Rueckert, D.; Sanchez-Ortiz, G.I.; Chandrashekara, R.; Rao, A.; Mohiaddin, R.; Puri, B.K.; Hajnal, J.V.; Aljabar, P.;
By: Rueckert, D.; Sanchez-Ortiz, G.I.; Chandrashekara, R.; Rao, A.; Mohiaddin, R.; Puri, B.K.; Hajnal, J.V.; Aljabar, P.;
2004 / IEEE / 0-7803-8388-5
By: Heckemann, R.A.; Leung, K.K.; Hill, D.L.G.; Holden, M.; Hajnal, J.V.; Rueckert, D.; Reid, D.G.; Changani, K.; Buckton, J.B.; Brooks, K.J.; Saeed, N.;
By: Heckemann, R.A.; Leung, K.K.; Hill, D.L.G.; Holden, M.; Hajnal, J.V.; Rueckert, D.; Reid, D.G.; Changani, K.; Buckton, J.B.; Brooks, K.J.; Saeed, N.;
2004 / IEEE / 0-7803-8388-5
By: Bhatia, K.K.; Rueckert, D.; Edwards, A.D.; Puri, B.K.; Hajnal, J.V.;
By: Bhatia, K.K.; Rueckert, D.; Edwards, A.D.; Puri, B.K.; Hajnal, J.V.;
2005 / IEEE / 0-7695-2355-2
By: Hajnal, J.V.; Lawrie, S.; Fox, N.; Hill, D.; Rossor, M.; Simpson, A.; Lloyd, S.; Geddes, J.; Bullmore, E.; Bath, P.; Procter, R.; Perry, D.; Wardlaw, J.; Johnstone, E.; Mclntosh, A.;
By: Hajnal, J.V.; Lawrie, S.; Fox, N.; Hill, D.; Rossor, M.; Simpson, A.; Lloyd, S.; Geddes, J.; Bullmore, E.; Bath, P.; Procter, R.; Perry, D.; Wardlaw, J.; Johnstone, E.; Mclntosh, A.;
2006 / IEEE / 0-7803-9576-X
By: Malamateniou, C.; Hui Xue; Rueckert, D.; Hajnal, J.V.; Srinivasan, L.; Allsop, J.;
By: Malamateniou, C.; Hui Xue; Rueckert, D.; Hajnal, J.V.; Srinivasan, L.; Allsop, J.;
2006 / IEEE / 0-7803-9576-X
By: Bhatia, K.K.; Aljabar, P.; Rueckert, D.; Edwards, A.D.; Hajnal, J.V.; Dyet, L.E.; Rutherford, M.A.; Srinivasan, L.; Boardman, J.R.;
By: Bhatia, K.K.; Aljabar, P.; Rueckert, D.; Edwards, A.D.; Hajnal, J.V.; Dyet, L.E.; Rutherford, M.A.; Srinivasan, L.; Boardman, J.R.;
2006 / IEEE / 0-7695-2517-1
By: Geddes, J.; Mackay, C.; Watson, G.; Bath, P.; Ure, J.; Procter, R.; Perry, D.; Palmer, J.; Sandercock, P.; Wardlaw, J.; McIntosh, A.; Job, D.; Lawrie, S.; Hajnal, J.V.; McLeish, K.; Hill, D.; Fletcher, J.; Fox, N.; Rossor, M.; Katzarova, M.; Russell, D.; Power, D.; Simpson, A.; Lloyd, S.;
By: Geddes, J.; Mackay, C.; Watson, G.; Bath, P.; Ure, J.; Procter, R.; Perry, D.; Palmer, J.; Sandercock, P.; Wardlaw, J.; McIntosh, A.; Job, D.; Lawrie, S.; Hajnal, J.V.; McLeish, K.; Hill, D.; Fletcher, J.; Fox, N.; Rossor, M.; Katzarova, M.; Russell, D.; Power, D.; Simpson, A.; Lloyd, S.;
2006 / IEEE
By: Campbell, S.P.; Changani, K.; Buckton, J.B.; Brooks, K.J.; Saeed, N.; Holden, M.; Leung, K.K.; Hill, D.L.G.; Hajnal, J.V.; Rueckert, D.; Williams, A.A.; Wilde, M.; Yong Zhao; Reid, D.G.;
By: Campbell, S.P.; Changani, K.; Buckton, J.B.; Brooks, K.J.; Saeed, N.; Holden, M.; Leung, K.K.; Hill, D.L.G.; Hajnal, J.V.; Rueckert, D.; Williams, A.A.; Wilde, M.; Yong Zhao; Reid, D.G.;
2010 / IEEE / 978-1-4244-4125-9
By: Edwards, A.D.; Hajnal, J.V.; Aljabar, P.; Gousias, I.S.; Srinivasan, L.; Murgasova, M.; Rueckert, D.;
By: Edwards, A.D.; Hajnal, J.V.; Aljabar, P.; Gousias, I.S.; Srinivasan, L.; Murgasova, M.; Rueckert, D.;
2010 / IEEE / 978-1-4244-4125-9
By: Heckemann, R.A.; Keihaninejad, S.; Hammers, A.; Rueckert, D.; Hajnal, J.V.; Aljabar, P.; Gousias, I.S.;
By: Heckemann, R.A.; Keihaninejad, S.; Hammers, A.; Rueckert, D.; Hajnal, J.V.; Aljabar, P.; Gousias, I.S.;
2011 / IEEE / 978-1-4244-4127-3
By: Hajnal, J.V.; Boardman, J.; Counsell, S.; Aljabar, P.; Serag, A.; Rueckert, D.;
By: Hajnal, J.V.; Boardman, J.; Counsell, S.; Aljabar, P.; Serag, A.; Rueckert, D.;
2011 / IEEE / 978-1-4244-4127-3
By: Nielsen, C.; Keihaninejad, S.; Gray, K.R.; Aljabar, P.; Rueckert, D.; Heckemann, R.A.; Hammers, A.; Hajnal, J.V.;
By: Nielsen, C.; Keihaninejad, S.; Gray, K.R.; Aljabar, P.; Rueckert, D.; Heckemann, R.A.; Hammers, A.; Hajnal, J.V.;
2011 / IEEE / 978-1-4244-4127-3
By: Lotjonen, J.; Hajnal, J.V.; Aljabar, P.; Wolz, R.; Rueckert, D.;
By: Lotjonen, J.; Hajnal, J.V.; Aljabar, P.; Wolz, R.; Rueckert, D.;
2011 / IEEE
By: Srinivasan, L.; Wolz, R.; Aljabar, P.; Rueckert, D.; Counsell, S.J.; Hajnal, J.V.; Edwards, A.D.; Rutherford, M.A.;
By: Srinivasan, L.; Wolz, R.; Aljabar, P.; Rueckert, D.; Counsell, S.J.; Hajnal, J.V.; Edwards, A.D.; Rutherford, M.A.;
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