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Author: Freudenberg, K.
Results
2012 / IEEE
By: Lyraud, C.; Rodriguez-Mateos, F.; Jong, C.; Jewell, M.; Bessette, D.; Libeyre, P.; Sgobba, S.; Reed, R.; Dalder, E.; Myatt, L.; Freudenberg, K.; Litherland, S.; Hussung, R.; Rey, C.; Martovetsky, N.; Reiersen, W.; Hamada, K.;
By: Lyraud, C.; Rodriguez-Mateos, F.; Jong, C.; Jewell, M.; Bessette, D.; Libeyre, P.; Sgobba, S.; Reed, R.; Dalder, E.; Myatt, L.; Freudenberg, K.; Litherland, S.; Hussung, R.; Rey, C.; Martovetsky, N.; Reiersen, W.; Hamada, K.;
2003 / IEEE / 0-7803-7908-X
By: Nelson, B.; Benson, R.; Williamson, D.; Ware, A.; Strickler, D.; Spong, D.; Parang, M.; Neilson, G.; Monticello, D.; Mioduszewski, P.; Madhukar, M.; Lyon, J.; Lovett, G.; Jones, G.; Hirshman, S.; Heitzenroeder, P.; Hargrove, T.; Goranson, P.; Freudenberg, K.; Fortier, G.; Fogarty, P.; Cole, M.; Berry, L.; Brooks, A.;
By: Nelson, B.; Benson, R.; Williamson, D.; Ware, A.; Strickler, D.; Spong, D.; Parang, M.; Neilson, G.; Monticello, D.; Mioduszewski, P.; Madhukar, M.; Lyon, J.; Lovett, G.; Jones, G.; Hirshman, S.; Heitzenroeder, P.; Hargrove, T.; Goranson, P.; Freudenberg, K.; Fortier, G.; Fogarty, P.; Cole, M.; Berry, L.; Brooks, A.;
2005 / IEEE / 0-4244-0159-6
By: Strickler, D.; Spong, D.; Shannon, T.; Parang, M.; Neilson, G.; Madhukar, M.; Lyon, J.; Lumsdaine, A.; Lovett, G.; Jones, G.; Hirshman, S.; Heitzenroeder, P.; Hargrove, T.; Goranson, P.; Freudenberg, K.; Fogarty, P.; Cole, M.; Brooks, A.; Berry, L.; Benson, R.; Nelson, B.; Williamson, D.;
By: Strickler, D.; Spong, D.; Shannon, T.; Parang, M.; Neilson, G.; Madhukar, M.; Lyon, J.; Lumsdaine, A.; Lovett, G.; Jones, G.; Hirshman, S.; Heitzenroeder, P.; Hargrove, T.; Goranson, P.; Freudenberg, K.; Fogarty, P.; Cole, M.; Brooks, A.; Berry, L.; Benson, R.; Nelson, B.; Williamson, D.;
2005 / IEEE / 0-4244-0159-6
By: Nelson, B.; Raftopolous, S.; Heitzenroeder, P.; Hargrove, T.; Fogarty, P.; Freudenberg, K.; Fan, H.-M.; Cole, M.; Chrzanowski, J.; Brown T; Brooks, A.; Williamson, D.; Strickler, D.; Lovett, G.; Stratton, B.; Reiersen, W.;
By: Nelson, B.; Raftopolous, S.; Heitzenroeder, P.; Hargrove, T.; Fogarty, P.; Freudenberg, K.; Fan, H.-M.; Cole, M.; Chrzanowski, J.; Brown T; Brooks, A.; Williamson, D.; Strickler, D.; Lovett, G.; Stratton, B.; Reiersen, W.;
2005 / IEEE / 0-4244-0159-6
By: Chrzanowski, J.; Dahlgren, F.; Myatt, L.; Brooks, A.; Reiersen, W.; Rushinski, J.; Kalish, M.; Freudenberg, K.;
By: Chrzanowski, J.; Dahlgren, F.; Myatt, L.; Brooks, A.; Reiersen, W.; Rushinski, J.; Kalish, M.; Freudenberg, K.;
2009 / IEEE / 978-1-4244-2635-5
By: Heitzenroeder, P.; Gettelfinger, G.; Chrzanowski, J.H.; Dudek, L.E.; Freudenberg, K.; Viola, M.; Jurczynski, S.;
By: Heitzenroeder, P.; Gettelfinger, G.; Chrzanowski, J.H.; Dudek, L.E.; Freudenberg, K.; Viola, M.; Jurczynski, S.;
2009 / IEEE / 978-1-4244-2635-5
By: Zarnstorff, M.; Dudek, L.; McGinnis, G.; Freudenberg, K.; Goranson, P.;
By: Zarnstorff, M.; Dudek, L.; McGinnis, G.; Freudenberg, K.; Goranson, P.;
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