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Author: Franca, D.L.
Advanced contact and junction technologies for improved parasitic resistance and short channel immunity in FinFETs beyond 22nm node2011 / IEEE / 978-1-4577-1756-7
By: Ang, K.-W.; Jammy, R.; Kirsch, P.D.; Hobbs, C.; Gausepohl, S.; Gunji, M.; Franca, D.L.; Rodgers, M.; Ok, I.; Hung, P.Y.; Min, B.-G.;
Enhanced performance in SOI FinFETs with low series resistance by aluminum implant as a solution beyond 22nm node2010 / IEEE / 978-1-4244-5450-1
By: Jammy, R.; Kirsch, P.; Hobbs, C.; Smith, C.; Akarvardar, K.; Lin, S.; Franca, D.L.; Stamper, H.O.; Bennett, S.; Rodgers, M.P.; Oh, J.; Lian, S.; Ngai, T.; Loh, W.Y.; Young, C.D.; Ok, I.;